forked from OSchip/llvm-project
ac3951a735
This is a follow-up to D45986. As suggested there, we should match the "all-bits-set" pattern in addition to "any-bits-set". This was a little more complicated than I thought it would be initially because the "and 1" instruction can be anywhere in the chain. Hopefully, the code comments make that logic understandable, but if you see a way to simplify or improve that, it's most appreciated. This transforms patterns that emerge from bitfield tests as seen in PR37098: https://bugs.llvm.org/show_bug.cgi?id=37098 I think it would also help reduce the large test from: D46336 D46595 but we need something to reassociate that case to the forms we're expecting here first. Differential Revision: https://reviews.llvm.org/D46649 llvm-svn: 331937 |
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| masked-cmp.ll | ||
| trunc_const_expr.ll | ||
| trunc_multi_uses.ll | ||
| trunc_unreachable_bb.ll | ||