forked from OSchip/llvm-project
Make MS i128 suffix test from r211446 more robust
We want to catch both negative and positive failure conditions. llvm-svn: 211449
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// RUN: %clang_cc1 -fsyntax-only -verify -fms-extensions %s
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// RUN: %clang_cc1 -fsyntax-only -verify -fms-extensions %s
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// RUN: %clang_cc1 -fsyntax-only -verify -fms-compatibility %s
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// RUN: %clang_cc1 -fsyntax-only -verify -fms-compatibility %s
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// RUN: %clang_cc1 -fsyntax-only -verify -triple i386-pc-win32 -fms-compatibility %s
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__int8 x1 = 3i8;
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__int8 x1 = 3i8;
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__int16 x2 = 4i16;
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__int16 x2 = 4i16;
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__int32 x3 = 5i32;
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__int32 x3 = 5i32;
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__int64 x5 = 0x42i64;
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__int64 x5 = 0x42i64;
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__int64 x6 = 0x42I64;
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__int64 x6 = 0x42I64;
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#ifdef __SIZEOF_INT128__
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#ifndef __SIZEOF_INT128__
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__int64 x4 = 70000000i128;
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// expected-error@+2 {{__int128 is not supported on this target}}
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#endif
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#endif
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__int64 x4 = 70000000i128;
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__int64 y = 0x42i64u; // expected-error {{invalid suffix}}
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__int64 y = 0x42i64u; // expected-error {{invalid suffix}}
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__int64 w = 0x43ui64;
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__int64 w = 0x43ui64;
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