forked from OSchip/llvm-project
Test contents were somehow duplicated, resulting in any testcase that fails automatically failing twice. Removing the duplicates.
llvm-svn: 186590
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@ -15,26 +15,3 @@
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int a;
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int a;
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inline ATTR_DECL(a) void* foo(); // expected-error{{attribute takes no arguments}}
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inline ATTR_DECL(a) void* foo(); // expected-error{{attribute takes no arguments}}
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// RUN: %clang_cc1 -DATTR=noreturn -verify -Wunused -Wused-but-marked-unused -Wunused-parameter -Wunused -fsyntax-only %s
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// RUN: %clang_cc1 -DATTR=always_inline -verify -Wunused -Wused-but-marked-unused -Wunused-parameter -Wunused -fsyntax-only %s
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// RUN: %clang_cc1 -DATTR=cdecl -verify -Wunused -Wused-but-marked-unused -Wunused-parameter -Wunused -fsyntax-only %s
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// RUN: %clang_cc1 -DATTR=const -verify -Wunused -Wused-but-marked-unused -Wunused-parameter -Wunused -fsyntax-only %s
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// RUN: %clang_cc1 -DATTR=fastcall -verify -Wunused -Wused-but-marked-unused -Wunused-parameter -Wunused -fsyntax-only %s
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// RUN: %clang_cc1 -DATTR=malloc -verify -Wunused -Wused-but-marked-unused -Wunused-parameter -Wunused -fsyntax-only %s
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// RUN: %clang_cc1 -DATTR=nothrow -verify -Wunused -Wused-but-marked-unused -Wunused-parameter -Wunused -fsyntax-only %s
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// RUN: %clang_cc1 -DATTR=stdcall -verify -Wunused -Wused-but-marked-unused -Wunused-parameter -Wunused -fsyntax-only %s
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// RUN: %clang_cc1 -DATTR=used -verify -Wunused -Wused-but-marked-unused -Wunused-parameter -Wunused -fsyntax-only %s
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// RUN: %clang_cc1 -DATTR=unused -verify -Wunused -Wused-but-marked-unused -Wunused-parameter -Wunused -fsyntax-only %s
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// RUN: %clang_cc1 -DATTR=weak -verify -Wunused -Wused-but-marked-unused -Wunused-parameter -Wunused -fsyntax-only %s
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#define ATTR_DECL(a) __attribute__((ATTR(a)))
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int a;
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inline ATTR_DECL(a) void* foo(); // expected-error{{attribute takes no arguments}}
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