forked from OSchip/llvm-project
CodeGen: BlockPlacement: Adjust test case so it covers rL297925. NFC
I had ajusted the test case before when testing a chain of length 2, and then reverted it with rL296845 when I switched to 3 triangles. After running benchmarks and examining generated code at length 2 I forgot to put the test back. llvm-svn: 298000
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@ -123,9 +123,6 @@ exit:
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;CHECK-NEXT: .[[TEST3LABEL:[_0-9A-Za-z]+]]: # %test3
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;CHECK-NEXT: rlwinm. {{[0-9]+}}, [[TAGREG]], 0, 29, 29
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;CHECK-NEXT: bne 0, .[[OPT3LABEL:[_0-9A-Za-z]+]]
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;CHECK-NEXT: .[[TEST4LABEL:[_0-9A-Za-z]+]]: # %test4
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;CHECK-NEXT: rlwinm. {{[0-9]+}}, [[TAGREG]], 0, 28, 28
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;CHECK-NEXT: bne 0, .[[OPT4LABEL:[_0-9A-Za-z]+]]
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;CHECK-NEXT: .[[EXITLABEL:[_0-9A-Za-z]+]]: # %exit
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;CHECK: blr
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;CHECK-NEXT: .[[OPT1LABEL]]:
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@ -133,11 +130,8 @@ exit:
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;CHECK-NEXT: beq 0, .[[TEST3LABEL]]
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;CHECK-NEXT: .[[OPT2LABEL]]:
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;CHECK: rlwinm. {{[0-9]+}}, [[TAGREG]], 0, 29, 29
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;CHECK-NEXT: beq 0, .[[TEST4LABEL]]
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;CHECK-NEXT: .[[OPT3LABEL]]:
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;CHECK: rlwinm. {{[0-9]+}}, [[TAGREG]], 0, 28, 28
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;CHECK-NEXT: beq 0, .[[EXITLABEL]]
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;CHECK-NEXT: .[[OPT4LABEL]]:
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;CHECK-NEXT: .[[OPT3LABEL]]:
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;CHECK: b .[[EXITLABEL]]
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define void @straight_test_50(i32 %tag) {
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@ -160,16 +154,9 @@ optional2:
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test3:
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%tagbit3 = and i32 %tag, 4
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%tagbit3eq0 = icmp eq i32 %tagbit3, 0
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br i1 %tagbit3eq0, label %test4, label %optional3, !prof !2
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br i1 %tagbit3eq0, label %exit, label %optional3, !prof !1
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optional3:
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call void @c()
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br label %test4
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test4:
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%tagbit4 = and i32 %tag, 8
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%tagbit4eq0 = icmp eq i32 %tagbit4, 0
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br i1 %tagbit4eq0, label %exit, label %optional4, !prof !1
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optional4:
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call void @d()
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br label %exit
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exit:
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ret void
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