[X86] Fix a bug in TEST with immediate creation

This code tries to form a TEST from CMP+AND with an optional
truncate in between. If we looked through the truncate, we may
have extra bits in the AND mask that shouldn't participate in
the checks. Normally SimplifyDemendedBits takes care of this, but
the AND may have another user. So manually mask out any extra bits.

Fixes PR51175.

Differential Revision: https://reviews.llvm.org/D106634

llvm/lib/Target/X86/X86ISelDAGToDAG.cpp

@@ -5446,6 +5446,9 @@ void X86DAGToDAGISel::Select(SDNode *Node) {
       ConstantSDNode *C = dyn_cast<ConstantSDNode>(N0.getOperand(1));
       if (!C) break;
       uint64_t Mask = C->getZExtValue();
+      // We may have looked through a truncate so mask off any bits that
+      // shouldn't be part of the compare.
+      Mask &= maskTrailingOnes<uint64_t>(CmpVT.getScalarSizeInBits());
 
       // Check if we can replace AND+IMM64 with a shift. This is possible for
       // masks/ like 0xFF000000 or 0x00FFFFFF and if we care only about the zero

llvm/test/CodeGen/X86/pr51175.ll

@@ -15,7 +15,7 @@ define i32 @foo(i16 signext %0, i32 %1, i32* nocapture %2) {
 ; CHECK-NEXT:    andl $65527, %eax # imm = 0xFFF7
 ; CHECK-NEXT:    movl %eax, (%rdx)
 ; CHECK-NEXT:    xorl %eax, %eax
-; CHECK-NEXT:    testl $-9, %edi
+; CHECK-NEXT:    testb $-9, %dil
 ; CHECK-NEXT:    cmovel %esi, %eax
 ; CHECK-NEXT:    retq
   %4 = add i16 %0, 1