forked from OSchip/llvm-project
Removing some unused parameters from this test; NFC
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@ -191,8 +191,7 @@ void test_builtin_elementwise_min(float f1, float f2, double d1, double d2,
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}
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void test_builtin_elementwise_ceil(float f1, float f2, double d1, double d2,
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float4 vf1, float4 vf2, si8 vi1, si8 vi2,
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long long int i1, long long int i2, short si) {
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float4 vf1, float4 vf2) {
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// CHECK-LABEL: define void @test_builtin_elementwise_ceil(
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// CHECK: [[F1:%.+]] = load float, float* %f1.addr, align 4
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// CHECK-NEXT: call float @llvm.ceil.f32(float [[F1]])
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