forked from OSchip/llvm-project
[DSE] Remove some dead code from DSE tests.
Some tests depend on DSE removing dead instructions unrelated to any memory optimization. That's not really DSE's job, remove it.
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@ -38,7 +38,6 @@ define void @test3() {
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; CHECK-NEXT: ret void
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;
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%A = alloca i8
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%B = alloca i8
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store i8 0, i8* %A ;; Written to by memset
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@ -87,7 +86,6 @@ define void @test6() {
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; CHECK-NEXT: ret void
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;
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%A = alloca i16, i16 1024, align 2
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%B = alloca i16, i16 1024, align 2
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store atomic i16 0, i16* %A unordered, align 2 ;; Written to by memset
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@ -40,7 +40,6 @@ entry:
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%wptr = bitcast i64* %ptr to i16*
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%wptr1 = getelementptr inbounds i16, i16* %wptr, i64 1
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%wptr2 = getelementptr inbounds i16, i16* %wptr, i64 2
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%wptr3 = getelementptr inbounds i16, i16* %wptr, i64 3
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;; We should be able to merge these two stores with the i64 one above
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@ -39,7 +39,6 @@ entry:
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%wptr = bitcast i64* %ptr to i16*
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%wptr1 = getelementptr inbounds i16, i16* %wptr, i64 1
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%wptr2 = getelementptr inbounds i16, i16* %wptr, i64 2
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%wptr3 = getelementptr inbounds i16, i16* %wptr, i64 3
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;; We should be able to merge these two stores with the i64 one above
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