forked from OSchip/llvm-project
[Thumb2] tighten CHECK lines in test; NFC
The sequence between the function call and the asm start may change without affecting what this test is looking for, but we should have a better idea about what that sequence looks like. llvm-svn: 370518
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@ -16,8 +16,10 @@ target datalayout = "e-p:32:32:32-i1:8:32-i8:8:32-i16:16:32-i32:32:32-i64:32:32-
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; Make sure the cmp is not scheduled before the InlineAsm that clobbers cc.
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; CHECK: bl _f2
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; CHECK: cmp {{r[0-9]+}}, #0
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; CHECK-NOT: cmp
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; CHECK: InlineAsm Start
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; CHECK-NEXT: it eq
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; CHECK-NEXT: addeq {{r[0-9]+}}, #1
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; CHECK-NEXT: lsls
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; CHECK-NEXT: InlineAsm Start
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define void @test(%s1* %this, i32 %format, i32 %w, i32 %h, i32 %levels, i32* %s, i8* %data, i32* nocapture %rowbytes, void (i8*, i8*)* %release, i8* %info) nounwind {
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entry:
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%tmp1 = getelementptr inbounds %s1, %s1* %this, i32 0, i32 0, i32 0, i32 1, i32 0, i32 0
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