[x86] Rip out some broken test cases for avx512 i1 store support.

It isn't reasonable to test storing things using undef pointers --
storing through those is at best "good luck" and really should be
transformed to "unreachable". Random changes in the combiner can
randomly break these tests for no good reason. I'm following up on the
original commit regarding the right long-term strategy here.

llvm-svn: 213810
This commit is contained in:
Chandler Carruth 2014-07-23 22:29:19 +00:00
parent 6d0e40bfbf
commit 9f2a54c579
1 changed files with 0 additions and 29 deletions

View File

@ -152,32 +152,3 @@ define void @test18(i8 * %addr, <8 x i64> %data) {
store <8 x i64>%data, <8 x i64>* %vaddr, align 64
ret void
}
; CHECK-LABEL: store_i1_1
; CHECK: movb
; CHECK: movb
; CHECK: ret
define void @store_i1_1() {
store i1 true, i1 addrspace(3)* undef, align 128
store i1 false, i1 addrspace(2)* undef, align 128
ret void
}
; CHECK-LABEL: store_i1_2
; CHECK: movb
; CHECK: ret
define void @store_i1_2(i64 %a, i64 %b) {
%res = icmp eq i64 %a, %b
store i1 %res, i1 addrspace(3)* undef, align 128
ret void
}
; CHECK-LABEL: store_i1_3
; CHECK: kmovw
; CHECK: ret
define void @store_i1_3(i16 %a) {
%a_vec = bitcast i16 %a to <16 x i1>
%res = extractelement <16 x i1> %a_vec, i32 4
store i1 %res, i1 addrspace(3)* undef, align 128
ret void
}