forked from OSchip/llvm-project
[x86] Rip out some broken test cases for avx512 i1 store support.
It isn't reasonable to test storing things using undef pointers -- storing through those is at best "good luck" and really should be transformed to "unreachable". Random changes in the combiner can randomly break these tests for no good reason. I'm following up on the original commit regarding the right long-term strategy here. llvm-svn: 213810
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@ -152,32 +152,3 @@ define void @test18(i8 * %addr, <8 x i64> %data) {
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store <8 x i64>%data, <8 x i64>* %vaddr, align 64
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ret void
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}
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; CHECK-LABEL: store_i1_1
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; CHECK: movb
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; CHECK: movb
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; CHECK: ret
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define void @store_i1_1() {
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store i1 true, i1 addrspace(3)* undef, align 128
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store i1 false, i1 addrspace(2)* undef, align 128
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ret void
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}
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; CHECK-LABEL: store_i1_2
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; CHECK: movb
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; CHECK: ret
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define void @store_i1_2(i64 %a, i64 %b) {
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%res = icmp eq i64 %a, %b
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store i1 %res, i1 addrspace(3)* undef, align 128
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ret void
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}
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; CHECK-LABEL: store_i1_3
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; CHECK: kmovw
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; CHECK: ret
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define void @store_i1_3(i16 %a) {
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%a_vec = bitcast i16 %a to <16 x i1>
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%res = extractelement <16 x i1> %a_vec, i32 4
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store i1 %res, i1 addrspace(3)* undef, align 128
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ret void
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}
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