forked from OSchip/llvm-project
remove two xfailed tests. These aren't doing any good for us until serialization is revisited.
llvm-svn: 67213
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514fc5b143
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@ -1,50 +0,0 @@
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// XFAIL
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// RUN: false
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// clang %s --test-pickling 2>&1 | grep -q 'SUCCESS'
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int main(void)
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{
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double _Complex a = 5;
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double _Complex b = 42;
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return a * b != b * a;
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}
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_Complex double bar(int);
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void test(_Complex double*);
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void takecomplex(_Complex double);
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void test2(int c) {
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_Complex double X;
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X = bar(1);
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test(&X);
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takecomplex(X);
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}
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_Complex double g1, g2;
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_Complex float cf;
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double D;
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void test3() {
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g1 = g1 + g2;
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g1 = g1 - g2;
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g1 = g1 * g2;
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g1 = +-~g1;
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double Gr = __real g1;
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cf += D;
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D += cf;
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cf /= g1;
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g1 = g1 + D;
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g1 = D + g1;
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}
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void t1() {
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(__real__ cf) = 4.0;
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}
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void t2() {
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(__imag__ cf) = 4.0;
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}
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@ -1,13 +0,0 @@
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// XFAIL
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// RUN: false
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// clang %s --test-pickling 2>&1 | grep -q 'SUCCESS'
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typedef unsigned __uint32_t;
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#define __byte_swap_int_var(x) \
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__extension__ ({ register __uint32_t __X = (x); \
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__asm ("bswap %0" : "+r" (__X)); \
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__X; })
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int test(int _x) {
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return (__byte_swap_int_var(_x));
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}
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