forked from OSchip/llvm-project
[NFC][X86] Autogenerate negative-offset.ll test
Being affected by upcoming patch llvm-svn: 361396
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@ -1,4 +1,5 @@
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; RUN: llc < %s -asm-verbose=false | FileCheck %s
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; NOTE: Assertions have been autogenerated by utils/update_llc_test_checks.py
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; RUN: llc < %s | FileCheck %s
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target datalayout = "e-m:e-i64:64-f80:128-n8:16:32:64-S128"
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target triple = "x86_64-unknown-linux-gnu"
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@ -6,13 +7,14 @@ target triple = "x86_64-unknown-linux-gnu"
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; Test that a constant consisting of a global symbol with a negative offset
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; is properly folded and isel'd.
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; CHECK-LABEL: negative_offset:
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; CHECK: movl $G, %eax
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; CHECK: notq %rax
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; CHECK: addq %rdi, %rax
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; CHECK: retq
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@G = external global [8 x i32]
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define i8* @negative_offset(i8* %a) {
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; CHECK-LABEL: negative_offset:
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; CHECK: # %bb.0:
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; CHECK-NEXT: movl $G, %eax
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; CHECK-NEXT: notq %rax
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; CHECK-NEXT: addq %rdi, %rax
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; CHECK-NEXT: retq
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%t = getelementptr i8, i8* %a, i64 sub (i64 -1, i64 ptrtoint ([8 x i32]* @G to i64))
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ret i8* %t
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}
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