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llvm-project/llvm/test/CodeGen/Mips/sint-fp-store_pattern.ll

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[mips] Improve instruction selection for pattern (store (fp_to_sint $src), $ptr). Previously, three instructions were needed: trunc.w.s $f0, $f2 mfc1 $4, $f0 sw $4, 0($2) Now we need only two: trunc.w.s $f0, $f2 swc1 $f0, 0($2) llvm-svn: 182053
2013-05-17 05:17:15 +08:00
; RUN: llc -march=mipsel < %s | FileCheck %s -check-prefix=32
[mips] MIPS-IV is broadly the same as MIPS64 so duplicate all -mcpu=mips64 tests with -mcpu=mips4 as a starting point Summary: Two exceptions to this: test/CodeGen/Mips/octeon.ll test/CodeGen/Mips/octeon_popcnt.ll these test extensions to MIPS64 One test is altered for MIPS-IV: test/CodeGen/Mips/mips64countleading.ll Tests dclo/dclz which were added in MIPS64. The MIPS-IV version tests that dclo/dclz are not emitted. Four tests fail and are not in this patch: test/CodeGen/Mips/abicalls.ll test/CodeGen/Mips/fcopysign-f32-f64.ll test/CodeGen/Mips/fcopysign.ll test/CodeGen/Mips/stack-alignment.ll Depends on D3343 Reviewers: matheusalmeida, vmedic Reviewed By: vmedic Differential Revision: http://reviews.llvm.org/D3344 llvm-svn: 206185
2014-04-15 00:00:28 +08:00
; RUN: llc -march=mips64el -mcpu=mips4 < %s | FileCheck %s -check-prefix=64
[mips] Improve instruction selection for pattern (store (fp_to_sint $src), $ptr). Previously, three instructions were needed: trunc.w.s $f0, $f2 mfc1 $4, $f0 sw $4, 0($2) Now we need only two: trunc.w.s $f0, $f2 swc1 $f0, 0($2) llvm-svn: 182053
2013-05-17 05:17:15 +08:00
; RUN: llc -march=mips64el -mcpu=mips64 < %s | FileCheck %s -check-prefix=64
@gint_ = external global i32
@gLL_ = external global i64
Mass update to CodeGen tests to use CHECK-LABEL for labels corresponding to function definitions for more informative error messages. No functionality change and all updated tests passed locally. This update was done with the following bash script: find test/CodeGen -name "*.ll" | \ while read NAME; do echo "$NAME" if ! grep -q "^; *RUN: *llc.*debug" $NAME; then TEMP=`mktemp -t temp` cp $NAME $TEMP sed -n "s/^define [^@]*@\([A-Za-z0-9_]*\)(.*$/\1/p" < $NAME | \ while read FUNC; do sed -i '' "s/;\(.*\)\([A-Za-z0-9_-]*\):\( *\)$FUNC: *\$/;\1\2-LABEL:\3$FUNC:/g" $TEMP done sed -i '' "s/;\(.*\)-LABEL-LABEL:/;\1-LABEL:/" $TEMP sed -i '' "s/;\(.*\)-NEXT-LABEL:/;\1-NEXT:/" $TEMP sed -i '' "s/;\(.*\)-NOT-LABEL:/;\1-NOT:/" $TEMP sed -i '' "s/;\(.*\)-DAG-LABEL:/;\1-DAG:/" $TEMP mv $TEMP $NAME fi done llvm-svn: 186280
2013-07-14 14:24:09 +08:00
; 32-LABEL: store_int_float_:
[mips] Improve instruction selection for pattern (store (fp_to_sint $src), $ptr). Previously, three instructions were needed: trunc.w.s $f0, $f2 mfc1 $4, $f0 sw $4, 0($2) Now we need only two: trunc.w.s $f0, $f2 swc1 $f0, 0($2) llvm-svn: 182053
2013-05-17 05:17:15 +08:00
; 32: trunc.w.s $f[[R0:[0-9]+]], $f{{[0-9]+}}
; 32: swc1 $f[[R0]],
define void @store_int_float_(float %a) {
entry:
%conv = fptosi float %a to i32
store i32 %conv, i32* @gint_, align 4
ret void
}
Mass update to CodeGen tests to use CHECK-LABEL for labels corresponding to function definitions for more informative error messages. No functionality change and all updated tests passed locally. This update was done with the following bash script: find test/CodeGen -name "*.ll" | \ while read NAME; do echo "$NAME" if ! grep -q "^; *RUN: *llc.*debug" $NAME; then TEMP=`mktemp -t temp` cp $NAME $TEMP sed -n "s/^define [^@]*@\([A-Za-z0-9_]*\)(.*$/\1/p" < $NAME | \ while read FUNC; do sed -i '' "s/;\(.*\)\([A-Za-z0-9_-]*\):\( *\)$FUNC: *\$/;\1\2-LABEL:\3$FUNC:/g" $TEMP done sed -i '' "s/;\(.*\)-LABEL-LABEL:/;\1-LABEL:/" $TEMP sed -i '' "s/;\(.*\)-NEXT-LABEL:/;\1-NEXT:/" $TEMP sed -i '' "s/;\(.*\)-NOT-LABEL:/;\1-NOT:/" $TEMP sed -i '' "s/;\(.*\)-DAG-LABEL:/;\1-DAG:/" $TEMP mv $TEMP $NAME fi done llvm-svn: 186280
2013-07-14 14:24:09 +08:00
; 32-LABEL: store_int_double_:
[mips] Improve instruction selection for pattern (store (fp_to_sint $src), $ptr). Previously, three instructions were needed: trunc.w.s $f0, $f2 mfc1 $4, $f0 sw $4, 0($2) Now we need only two: trunc.w.s $f0, $f2 swc1 $f0, 0($2) llvm-svn: 182053
2013-05-17 05:17:15 +08:00
; 32: trunc.w.d $f[[R0:[0-9]+]], $f{{[0-9]+}}
; 32: swc1 $f[[R0]],
Mass update to CodeGen tests to use CHECK-LABEL for labels corresponding to function definitions for more informative error messages. No functionality change and all updated tests passed locally. This update was done with the following bash script: find test/CodeGen -name "*.ll" | \ while read NAME; do echo "$NAME" if ! grep -q "^; *RUN: *llc.*debug" $NAME; then TEMP=`mktemp -t temp` cp $NAME $TEMP sed -n "s/^define [^@]*@\([A-Za-z0-9_]*\)(.*$/\1/p" < $NAME | \ while read FUNC; do sed -i '' "s/;\(.*\)\([A-Za-z0-9_-]*\):\( *\)$FUNC: *\$/;\1\2-LABEL:\3$FUNC:/g" $TEMP done sed -i '' "s/;\(.*\)-LABEL-LABEL:/;\1-LABEL:/" $TEMP sed -i '' "s/;\(.*\)-NEXT-LABEL:/;\1-NEXT:/" $TEMP sed -i '' "s/;\(.*\)-NOT-LABEL:/;\1-NOT:/" $TEMP sed -i '' "s/;\(.*\)-DAG-LABEL:/;\1-DAG:/" $TEMP mv $TEMP $NAME fi done llvm-svn: 186280
2013-07-14 14:24:09 +08:00
; 64-LABEL: store_int_double_:
[mips] Improve instruction selection for pattern (store (fp_to_sint $src), $ptr). Previously, three instructions were needed: trunc.w.s $f0, $f2 mfc1 $4, $f0 sw $4, 0($2) Now we need only two: trunc.w.s $f0, $f2 swc1 $f0, 0($2) llvm-svn: 182053
2013-05-17 05:17:15 +08:00
; 64: trunc.w.d $f[[R0:[0-9]+]], $f{{[0-9]+}}
; 64: swc1 $f[[R0]],
define void @store_int_double_(double %a) {
entry:
%conv = fptosi double %a to i32
store i32 %conv, i32* @gint_, align 4
ret void
}
Mass update to CodeGen tests to use CHECK-LABEL for labels corresponding to function definitions for more informative error messages. No functionality change and all updated tests passed locally. This update was done with the following bash script: find test/CodeGen -name "*.ll" | \ while read NAME; do echo "$NAME" if ! grep -q "^; *RUN: *llc.*debug" $NAME; then TEMP=`mktemp -t temp` cp $NAME $TEMP sed -n "s/^define [^@]*@\([A-Za-z0-9_]*\)(.*$/\1/p" < $NAME | \ while read FUNC; do sed -i '' "s/;\(.*\)\([A-Za-z0-9_-]*\):\( *\)$FUNC: *\$/;\1\2-LABEL:\3$FUNC:/g" $TEMP done sed -i '' "s/;\(.*\)-LABEL-LABEL:/;\1-LABEL:/" $TEMP sed -i '' "s/;\(.*\)-NEXT-LABEL:/;\1-NEXT:/" $TEMP sed -i '' "s/;\(.*\)-NOT-LABEL:/;\1-NOT:/" $TEMP sed -i '' "s/;\(.*\)-DAG-LABEL:/;\1-DAG:/" $TEMP mv $TEMP $NAME fi done llvm-svn: 186280
2013-07-14 14:24:09 +08:00
; 64-LABEL: store_LL_float_:
[mips] Improve instruction selection for pattern (store (fp_to_sint $src), $ptr). Previously, three instructions were needed: trunc.w.s $f0, $f2 mfc1 $4, $f0 sw $4, 0($2) Now we need only two: trunc.w.s $f0, $f2 swc1 $f0, 0($2) llvm-svn: 182053
2013-05-17 05:17:15 +08:00
; 64: trunc.l.s $f[[R0:[0-9]+]], $f{{[0-9]+}}
; 64: sdc1 $f[[R0]],
define void @store_LL_float_(float %a) {
entry:
%conv = fptosi float %a to i64
store i64 %conv, i64* @gLL_, align 8
ret void
}
Mass update to CodeGen tests to use CHECK-LABEL for labels corresponding to function definitions for more informative error messages. No functionality change and all updated tests passed locally. This update was done with the following bash script: find test/CodeGen -name "*.ll" | \ while read NAME; do echo "$NAME" if ! grep -q "^; *RUN: *llc.*debug" $NAME; then TEMP=`mktemp -t temp` cp $NAME $TEMP sed -n "s/^define [^@]*@\([A-Za-z0-9_]*\)(.*$/\1/p" < $NAME | \ while read FUNC; do sed -i '' "s/;\(.*\)\([A-Za-z0-9_-]*\):\( *\)$FUNC: *\$/;\1\2-LABEL:\3$FUNC:/g" $TEMP done sed -i '' "s/;\(.*\)-LABEL-LABEL:/;\1-LABEL:/" $TEMP sed -i '' "s/;\(.*\)-NEXT-LABEL:/;\1-NEXT:/" $TEMP sed -i '' "s/;\(.*\)-NOT-LABEL:/;\1-NOT:/" $TEMP sed -i '' "s/;\(.*\)-DAG-LABEL:/;\1-DAG:/" $TEMP mv $TEMP $NAME fi done llvm-svn: 186280
2013-07-14 14:24:09 +08:00
; 64-LABEL: store_LL_double_:
[mips] Improve instruction selection for pattern (store (fp_to_sint $src), $ptr). Previously, three instructions were needed: trunc.w.s $f0, $f2 mfc1 $4, $f0 sw $4, 0($2) Now we need only two: trunc.w.s $f0, $f2 swc1 $f0, 0($2) llvm-svn: 182053
2013-05-17 05:17:15 +08:00
; 64: trunc.l.d $f[[R0:[0-9]+]], $f{{[0-9]+}}
; 64: sdc1 $f[[R0]],
define void @store_LL_double_(double %a) {
entry:
%conv = fptosi double %a to i64
store i64 %conv, i64* @gLL_, align 8
ret void
}