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llvm-project/llvm/test/CodeGen/Mips/msa/bmzi_bmnzi.ll

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[mips][msa] Fix generation of bm(n)zi and bins[lr]i instructions We have two cases here, the first one being the following instruction selection from the builtin function: bm(n)zi builtin -> vselect node -> bins[lr]i machine instruction In case of bm(n)zi having an immediate which has either its high or low bits set, a bins[lr] instruction can be selected through the selectVSplatMask[LR] function. The function counts the number of bits set, and that value is being passed to the bins[lr]i instruction as its immediate, which in turn copies immediate modulo the size of the element in bits plus 1 as per specs, where we get the off-by-one-error. The other case is: bins[lr]i -> vselect node -> bsel.v In this case, a bsel.v instruction gets selected with a mask having one bit less set than required. Patch by Stefan Maksimovic. Differential Revision: https://reviews.llvm.org/D30579 llvm-svn: 299768
2017-04-07 21:31:36 +08:00
; RUN: llc -march=mipsel -mattr=+msa,+fp64 -relocation-model=pic < %s | FileCheck %s
@llvm_mips_bmnzi_b_ARG1 = global <16 x i8> <i8 15, i8 15, i8 15, i8 15, i8 15, i8 15, i8 15, i8 15, i8 15, i8 15, i8 15, i8 15, i8 15, i8 15, i8 15, i8 15>, align 16
@llvm_mips_bmnzi_b_ARG2 = global <16 x i8> zeroinitializer, align 16
@llvm_mips_bmnzi_b_RES = global <16 x i8> zeroinitializer, align 16
define void @llvm_mips_bmnzi_b_test() nounwind {
entry:
%0 = load <16 x i8>, <16 x i8>* @llvm_mips_bmnzi_b_ARG1
%1 = load <16 x i8>, <16 x i8>* @llvm_mips_bmnzi_b_ARG2
%2 = tail call <16 x i8> @llvm.mips.bmnzi.b(<16 x i8> %0, <16 x i8> %1, i32 240)
Elide stores which are overwritten without being observed. Summary: In SelectionDAG, when a store is immediately chained to another store to the same address, elide the first store as it has no observable effects. This is causes small improvements dealing with intrinsics lowered to stores. Test notes: * Many testcases overwrite store addresses multiple times and needed minor changes, mainly making stores volatile to prevent the optimization from optimizing the test away. * Many X86 test cases optimized out instructions associated with associated with va_start. * Note that test_splat in CodeGen/AArch64/misched-stp.ll no longer has dependencies to check and can probably be removed and potentially replaced with another test. Reviewers: rnk, john.brawn Subscribers: aemerson, rengolin, qcolombet, jyknight, nemanjai, nhaehnle, javed.absar, llvm-commits Differential Revision: https://reviews.llvm.org/D33206 llvm-svn: 303198
2017-05-17 03:43:56 +08:00
store volatile <16 x i8> %2, <16 x i8>* @llvm_mips_bmnzi_b_RES
[mips][msa] Fix generation of bm(n)zi and bins[lr]i instructions We have two cases here, the first one being the following instruction selection from the builtin function: bm(n)zi builtin -> vselect node -> bins[lr]i machine instruction In case of bm(n)zi having an immediate which has either its high or low bits set, a bins[lr] instruction can be selected through the selectVSplatMask[LR] function. The function counts the number of bits set, and that value is being passed to the bins[lr]i instruction as its immediate, which in turn copies immediate modulo the size of the element in bits plus 1 as per specs, where we get the off-by-one-error. The other case is: bins[lr]i -> vselect node -> bsel.v In this case, a bsel.v instruction gets selected with a mask having one bit less set than required. Patch by Stefan Maksimovic. Differential Revision: https://reviews.llvm.org/D30579 llvm-svn: 299768
2017-04-07 21:31:36 +08:00
%3 = tail call <16 x i8> @llvm.mips.bmnzi.b(<16 x i8> %0, <16 x i8> %1, i32 15)
Elide stores which are overwritten without being observed. Summary: In SelectionDAG, when a store is immediately chained to another store to the same address, elide the first store as it has no observable effects. This is causes small improvements dealing with intrinsics lowered to stores. Test notes: * Many testcases overwrite store addresses multiple times and needed minor changes, mainly making stores volatile to prevent the optimization from optimizing the test away. * Many X86 test cases optimized out instructions associated with associated with va_start. * Note that test_splat in CodeGen/AArch64/misched-stp.ll no longer has dependencies to check and can probably be removed and potentially replaced with another test. Reviewers: rnk, john.brawn Subscribers: aemerson, rengolin, qcolombet, jyknight, nemanjai, nhaehnle, javed.absar, llvm-commits Differential Revision: https://reviews.llvm.org/D33206 llvm-svn: 303198
2017-05-17 03:43:56 +08:00
store volatile <16 x i8> %3, <16 x i8>* @llvm_mips_bmnzi_b_RES
[mips][msa] Fix generation of bm(n)zi and bins[lr]i instructions We have two cases here, the first one being the following instruction selection from the builtin function: bm(n)zi builtin -> vselect node -> bins[lr]i machine instruction In case of bm(n)zi having an immediate which has either its high or low bits set, a bins[lr] instruction can be selected through the selectVSplatMask[LR] function. The function counts the number of bits set, and that value is being passed to the bins[lr]i instruction as its immediate, which in turn copies immediate modulo the size of the element in bits plus 1 as per specs, where we get the off-by-one-error. The other case is: bins[lr]i -> vselect node -> bsel.v In this case, a bsel.v instruction gets selected with a mask having one bit less set than required. Patch by Stefan Maksimovic. Differential Revision: https://reviews.llvm.org/D30579 llvm-svn: 299768
2017-04-07 21:31:36 +08:00
%4 = tail call <16 x i8> @llvm.mips.bmnzi.b(<16 x i8> %0, <16 x i8> %1, i32 170)
store <16 x i8> %4, <16 x i8>* @llvm_mips_bmnzi_b_RES
ret void
}
; CHECK-LABEL: llvm_mips_bmnzi_b_test:
; CHECK: lw [[R0:\$[0-9]+]], %got(llvm_mips_bmnzi_b_RES)(
; CHECK: lw [[R1:\$[0-9]+]], %got(llvm_mips_bmnzi_b_ARG1)(
; CHECK: lw [[R2:\$[0-9]+]], %got(llvm_mips_bmnzi_b_ARG2)(
; CHECK: ld.b [[R3:\$w[0-9]+]], 0([[R2]])
; CHECK: ld.b [[R4:\$w[0-9]+]], 0([[R1]])
; CHECK: move.v [[R5:\$w[0-9]+]], [[R4]]
; CHECK: binsli.b [[R5]], [[R3]], 3
; CHECK: binsri.b [[R5]], [[R3]], 3
; CHECK: bmnzi.b [[R4]], [[R3]], 170
define void @llvm_mips_bmzi_b_test() nounwind {
entry:
%0 = load <16 x i8>, <16 x i8>* @llvm_mips_bmnzi_b_ARG1
%1 = load <16 x i8>, <16 x i8>* @llvm_mips_bmnzi_b_ARG2
%2 = tail call <16 x i8> @llvm.mips.bmzi.b(<16 x i8> %0, <16 x i8> %1, i32 240)
Elide stores which are overwritten without being observed. Summary: In SelectionDAG, when a store is immediately chained to another store to the same address, elide the first store as it has no observable effects. This is causes small improvements dealing with intrinsics lowered to stores. Test notes: * Many testcases overwrite store addresses multiple times and needed minor changes, mainly making stores volatile to prevent the optimization from optimizing the test away. * Many X86 test cases optimized out instructions associated with associated with va_start. * Note that test_splat in CodeGen/AArch64/misched-stp.ll no longer has dependencies to check and can probably be removed and potentially replaced with another test. Reviewers: rnk, john.brawn Subscribers: aemerson, rengolin, qcolombet, jyknight, nemanjai, nhaehnle, javed.absar, llvm-commits Differential Revision: https://reviews.llvm.org/D33206 llvm-svn: 303198
2017-05-17 03:43:56 +08:00
store volatile <16 x i8> %2, <16 x i8>* @llvm_mips_bmnzi_b_RES
[mips][msa] Fix generation of bm(n)zi and bins[lr]i instructions We have two cases here, the first one being the following instruction selection from the builtin function: bm(n)zi builtin -> vselect node -> bins[lr]i machine instruction In case of bm(n)zi having an immediate which has either its high or low bits set, a bins[lr] instruction can be selected through the selectVSplatMask[LR] function. The function counts the number of bits set, and that value is being passed to the bins[lr]i instruction as its immediate, which in turn copies immediate modulo the size of the element in bits plus 1 as per specs, where we get the off-by-one-error. The other case is: bins[lr]i -> vselect node -> bsel.v In this case, a bsel.v instruction gets selected with a mask having one bit less set than required. Patch by Stefan Maksimovic. Differential Revision: https://reviews.llvm.org/D30579 llvm-svn: 299768
2017-04-07 21:31:36 +08:00
%3 = tail call <16 x i8> @llvm.mips.bmzi.b(<16 x i8> %0, <16 x i8> %1, i32 15)
Elide stores which are overwritten without being observed. Summary: In SelectionDAG, when a store is immediately chained to another store to the same address, elide the first store as it has no observable effects. This is causes small improvements dealing with intrinsics lowered to stores. Test notes: * Many testcases overwrite store addresses multiple times and needed minor changes, mainly making stores volatile to prevent the optimization from optimizing the test away. * Many X86 test cases optimized out instructions associated with associated with va_start. * Note that test_splat in CodeGen/AArch64/misched-stp.ll no longer has dependencies to check and can probably be removed and potentially replaced with another test. Reviewers: rnk, john.brawn Subscribers: aemerson, rengolin, qcolombet, jyknight, nemanjai, nhaehnle, javed.absar, llvm-commits Differential Revision: https://reviews.llvm.org/D33206 llvm-svn: 303198
2017-05-17 03:43:56 +08:00
store volatile <16 x i8> %3, <16 x i8>* @llvm_mips_bmnzi_b_RES
[mips][msa] Fix generation of bm(n)zi and bins[lr]i instructions We have two cases here, the first one being the following instruction selection from the builtin function: bm(n)zi builtin -> vselect node -> bins[lr]i machine instruction In case of bm(n)zi having an immediate which has either its high or low bits set, a bins[lr] instruction can be selected through the selectVSplatMask[LR] function. The function counts the number of bits set, and that value is being passed to the bins[lr]i instruction as its immediate, which in turn copies immediate modulo the size of the element in bits plus 1 as per specs, where we get the off-by-one-error. The other case is: bins[lr]i -> vselect node -> bsel.v In this case, a bsel.v instruction gets selected with a mask having one bit less set than required. Patch by Stefan Maksimovic. Differential Revision: https://reviews.llvm.org/D30579 llvm-svn: 299768
2017-04-07 21:31:36 +08:00
%4 = tail call <16 x i8> @llvm.mips.bmzi.b(<16 x i8> %0, <16 x i8> %1, i32 170)
store <16 x i8> %4, <16 x i8>* @llvm_mips_bmnzi_b_RES
ret void
}
; CHECK-LABEL: llvm_mips_bmzi_b_test:
; CHECK: lw [[R0:\$[0-9]+]], %got(llvm_mips_bmnzi_b_RES)(
; CHECK: lw [[R1:\$[0-9]+]], %got(llvm_mips_bmnzi_b_ARG2)(
; CHECK: lw [[R2:\$[0-9]+]], %got(llvm_mips_bmnzi_b_ARG1)(
; CHECK: ld.b [[R3:\$w[0-9]+]], 0([[R2]])
; CHECK: ld.b [[R4:\$w[0-9]+]], 0([[R1]])
; CHECK: move.v [[R5:\$w[0-9]+]], [[R4]]
; CHECK: binsli.b [[R5]], [[R3]], 3
; CHECK: binsri.b [[R5]], [[R3]], 3
; bmnzi.b is the same as bmzi.b with ws and wd_in swapped
; CHECK: bmnzi.b [[R4]], [[R3]], 170
declare <16 x i8> @llvm.mips.bmnzi.b(<16 x i8>, <16 x i8>, i32) nounwind
declare <16 x i8> @llvm.mips.bmzi.b(<16 x i8>, <16 x i8>, i32) nounwind