tools/testing/nvdimm: unit test clear-error commands
Validate command parsing in acpi_nfit_ctl for the clear error command.
This tests for a crash condition introduced by commit 4b27db7e26
"acpi, nfit: add support for the _LSI, _LSR, and _LSW label methods".
Cc: Vishal Verma <vishal.l.verma@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
This commit is contained in:
parent
0e7f074145
commit
fb2a174835
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@ -1812,6 +1812,7 @@ static int nfit_ctl_test(struct device *dev)
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unsigned long mask, cmd_size, offset;
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union {
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struct nd_cmd_get_config_size cfg_size;
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struct nd_cmd_clear_error clear_err;
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struct nd_cmd_ars_status ars_stat;
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struct nd_cmd_ars_cap ars_cap;
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char buf[sizeof(struct nd_cmd_ars_status)
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@ -1995,6 +1996,23 @@ static int nfit_ctl_test(struct device *dev)
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return -EIO;
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}
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/* test clear error */
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cmd_size = sizeof(cmds.clear_err);
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cmds.clear_err = (struct nd_cmd_clear_error) {
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.length = 512,
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.cleared = 512,
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};
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rc = setup_result(cmds.buf, cmd_size);
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if (rc)
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return rc;
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rc = acpi_nfit_ctl(&acpi_desc->nd_desc, NULL, ND_CMD_CLEAR_ERROR,
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cmds.buf, cmd_size, &cmd_rc);
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if (rc < 0 || cmd_rc) {
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dev_dbg(dev, "%s: failed at: %d rc: %d cmd_rc: %d\n",
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__func__, __LINE__, rc, cmd_rc);
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return -EIO;
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}
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return 0;
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}
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