iio:chemical:atlas-ph-sensor: Fix use of 32 bit int to hold 16 bit big endian value
This will result in a random value being reported on big endian architectures.
(thanks to Lars-Peter Clausen for pointing out the effects of this bug)
Only effects a value printed to the log, but as this reports the settings of
the probe in question it may be of direct interest to users.
Also, fixes the following sparse endianness warnings:
drivers/iio/chemical/atlas-ph-sensor.c:215:9: warning: cast to restricted __be16
drivers/iio/chemical/atlas-ph-sensor.c:215:9: warning: cast to restricted __be16
drivers/iio/chemical/atlas-ph-sensor.c:215:9: warning: cast to restricted __be16
drivers/iio/chemical/atlas-ph-sensor.c:215:9: warning: cast to restricted __be16
drivers/iio/chemical/atlas-ph-sensor.c:215:9: warning: cast to restricted __be16
drivers/iio/chemical/atlas-ph-sensor.c:215:9: warning: cast to restricted __be16
drivers/iio/chemical/atlas-ph-sensor.c:215:9: warning: cast to restricted __be16
drivers/iio/chemical/atlas-ph-sensor.c:215:9: warning: cast to restricted __be16
Signed-off-by: Sandhya Bankar <bankarsandhya512@gmail.com>
Fixes: e8dd92bfbf
("iio: chemical: atlas-ph-sensor: add EC feature")
Cc: <Stable@vger.kernel.org>
Signed-off-by: Jonathan Cameron <jic23@kernel.org>
This commit is contained in:
parent
2967999fbc
commit
d1fe85ec77
|
@ -213,13 +213,14 @@ static int atlas_check_ec_calibration(struct atlas_data *data)
|
|||
struct device *dev = &data->client->dev;
|
||||
int ret;
|
||||
unsigned int val;
|
||||
__be16 rval;
|
||||
|
||||
ret = regmap_bulk_read(data->regmap, ATLAS_REG_EC_PROBE, &val, 2);
|
||||
ret = regmap_bulk_read(data->regmap, ATLAS_REG_EC_PROBE, &rval, 2);
|
||||
if (ret)
|
||||
return ret;
|
||||
|
||||
dev_info(dev, "probe set to K = %d.%.2d", be16_to_cpu(val) / 100,
|
||||
be16_to_cpu(val) % 100);
|
||||
val = be16_to_cpu(rval);
|
||||
dev_info(dev, "probe set to K = %d.%.2d", val / 100, val % 100);
|
||||
|
||||
ret = regmap_read(data->regmap, ATLAS_REG_EC_CALIB_STATUS, &val);
|
||||
if (ret)
|
||||
|
|
Loading…
Reference in New Issue