USB: keyspan_pda: remove bogus disconnect test in close

Remove bogus (and unnecessary) test for serial->dev being NULL in close.

The device is never cleared, and close is never called after a completed
disconnect anyway.

Signed-off-by: Johan Hovold <jhovold@gmail.com>
Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
This commit is contained in:
Johan Hovold 2013-03-21 12:36:34 +01:00 committed by Greg Kroah-Hartman
parent d7f08452ff
commit 75d22b323f
1 changed files with 2 additions and 7 deletions

View File

@ -649,13 +649,8 @@ error:
}
static void keyspan_pda_close(struct usb_serial_port *port)
{
struct usb_serial *serial = port->serial;
if (serial->dev) {
/* shutdown our bulk reads and writes */
usb_kill_urb(port->write_urb);
usb_kill_urb(port->interrupt_in_urb);
}
usb_kill_urb(port->write_urb);
usb_kill_urb(port->interrupt_in_urb);
}