selftests/powerpc: Fix L1D flushing tests for Power10
The rfi_flush and entry_flush selftests work by using the PM_LD_MISS_L1 perf event to count L1D misses. The value of this event has changed over time: - Power7 uses 0x400f0 - Power8 and Power9 use both 0x400f0 and 0x3e054 - Power10 uses only 0x3e054 Rather than relying on raw values, configure perf to count L1D read misses in the most explicit way available. This fixes the selftests to work on systems without 0x400f0 as PM_LD_MISS_L1, and should change no behaviour for systems that the tests already worked on. The only potential downside is that referring to a specific perf event requires PMU support implemented in the kernel for that platform. Signed-off-by: Russell Currey <ruscur@russell.cc> Acked-by: Daniel Axtens <dja@axtens.net> Signed-off-by: Michael Ellerman <mpe@ellerman.id.au> Link: https://lore.kernel.org/r/20210223070227.2916871-1-ruscur@russell.cc
This commit is contained in:
parent
5c4a4802b9
commit
3a72c94ebf
|
@ -53,7 +53,7 @@ int entry_flush_test(void)
|
|||
|
||||
entry_flush = entry_flush_orig;
|
||||
|
||||
fd = perf_event_open_counter(PERF_TYPE_RAW, /* L1d miss */ 0x400f0, -1);
|
||||
fd = perf_event_open_counter(PERF_TYPE_HW_CACHE, PERF_L1D_READ_MISS_CONFIG, -1);
|
||||
FAIL_IF(fd < 0);
|
||||
|
||||
p = (char *)memalign(zero_size, CACHELINE_SIZE);
|
||||
|
|
|
@ -9,6 +9,10 @@
|
|||
|
||||
#define CACHELINE_SIZE 128
|
||||
|
||||
#define PERF_L1D_READ_MISS_CONFIG ((PERF_COUNT_HW_CACHE_L1D) | \
|
||||
(PERF_COUNT_HW_CACHE_OP_READ << 8) | \
|
||||
(PERF_COUNT_HW_CACHE_RESULT_MISS << 16))
|
||||
|
||||
void syscall_loop(char *p, unsigned long iterations,
|
||||
unsigned long zero_size);
|
||||
|
||||
|
|
|
@ -54,7 +54,7 @@ int rfi_flush_test(void)
|
|||
|
||||
rfi_flush = rfi_flush_orig;
|
||||
|
||||
fd = perf_event_open_counter(PERF_TYPE_RAW, /* L1d miss */ 0x400f0, -1);
|
||||
fd = perf_event_open_counter(PERF_TYPE_HW_CACHE, PERF_L1D_READ_MISS_CONFIG, -1);
|
||||
FAIL_IF(fd < 0);
|
||||
|
||||
p = (char *)memalign(zero_size, CACHELINE_SIZE);
|
||||
|
|
Loading…
Reference in New Issue