eeprom: make older eeprom drivers select NVMEM_SYSFS
misc/eeprom/{at24,at25,eeprom_93xx46} drivers all register their
corresponding devices in the nvmem framework in compat mode which requires
nvmem sysfs interface to be present. The latter, however, has been split
out from nvmem under a separate Kconfig in commit ae0c2d7255
("nvmem:
core: add NVMEM_SYSFS Kconfig"). As a result, probing certain I2C-attached
EEPROMs now fails with
at24: probe of 0-0050 failed with error -38
because of a stub implementation of nvmem_sysfs_setup_compat()
in drivers/nvmem/nvmem.h. Update the nvmem dependency for these drivers
so they could load again:
at24 0-0050: 32768 byte 24c256 EEPROM, writable, 64 bytes/write
Cc: Adrian Bunk <bunk@kernel.org>
Cc: Bartosz Golaszewski <brgl@bgdev.pl>
Cc: Srinivas Kandagatla <srinivas.kandagatla@linaro.org>
Cc: stable@vger.kernel.org # v5.2+
Signed-off-by: Arseny Solokha <asolokha@kb.kras.ru>
Link: https://lore.kernel.org/r/20190716111236.27803-1-asolokha@kb.kras.ru
Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
This commit is contained in:
parent
10b0f1c227
commit
1b5621832f
|
@ -5,6 +5,7 @@ config EEPROM_AT24
|
|||
tristate "I2C EEPROMs / RAMs / ROMs from most vendors"
|
||||
depends on I2C && SYSFS
|
||||
select NVMEM
|
||||
select NVMEM_SYSFS
|
||||
select REGMAP_I2C
|
||||
help
|
||||
Enable this driver to get read/write support to most I2C EEPROMs
|
||||
|
@ -34,6 +35,7 @@ config EEPROM_AT25
|
|||
tristate "SPI EEPROMs from most vendors"
|
||||
depends on SPI && SYSFS
|
||||
select NVMEM
|
||||
select NVMEM_SYSFS
|
||||
help
|
||||
Enable this driver to get read/write support to most SPI EEPROMs,
|
||||
after you configure the board init code to know about each eeprom
|
||||
|
@ -80,6 +82,7 @@ config EEPROM_93XX46
|
|||
depends on SPI && SYSFS
|
||||
select REGMAP
|
||||
select NVMEM
|
||||
select NVMEM_SYSFS
|
||||
help
|
||||
Driver for the microwire EEPROM chipsets 93xx46x. The driver
|
||||
supports both read and write commands and also the command to
|
||||
|
|
Loading…
Reference in New Issue