Upstream commit: bb408dae9e73803eab8a648115d6c4a1bca4dba3
Conflict: none
There are two selftest scenarios for ARRAY BIST(Board Integrated System
Test) tests:
1. Perform IFS ARRAY BIST tests once on each CPU.
2. Perform IFS ARRAY BIST tests on a random CPU with 3 rounds.
These are not meant to be exhaustive, but are some minimal tests for
for checking IFS ARRAY BIST.
Intel-SIG: commit bb408dae9e73 ("selftests: ifs: verify IFS ARRAY BIST functionality)"
Backport to support Intel IFS(In Field Scan) SBAF(Structural Based Functional Test at Field)
Reviewed-by: Jithu Joseph <jithu.joseph@intel.com>
Reviewed-by: Kuppuswamy Sathyanarayanan <sathyanarayanan.kuppuswamy@linux.intel.com>
Co-developed-by: Ashok Raj <ashok.raj@intel.com>
Signed-off-by: Ashok Raj <ashok.raj@intel.com>
Signed-off-by: Pengfei Xu <pengfei.xu@intel.com>
Acked-by: Jithu Joseph <jithu.joseph@intel.com>
Signed-off-by: Shuah Khan <skhan@linuxfoundation.org>
[ Aichun Shi: amend commit log ]
Signed-off-by: Aichun Shi <aichun.shi@intel.com>
5b5737eaf4