Commit Graph

94 Commits

Author SHA1 Message Date
Akinobu Mita c092b43906 mtd: mtd_nandecctest: support injecting bit error for ecc code
Currently inject_single_bit_error() is used to inject single bit error
into randomly selected bit position of the 256 or 512 bytes data block.

Later change will add tests which inject bit errors into the ecc code.
Unfortunately, inject_single_bit_error() doesn't work for the ecc code
which is not a multiple of sizeof(unsigned long).

Because bit fliping at random position is done by __change_bit().
For example, flipping bit position 0 by __change_bit(0, addr) modifies
3rd byte (32bit) or 7th byte (64bit) on big-endian systems.

Using little-endian version of bitops can fix this issue.  But
little-endian version of __change_bit is not yet available.
So this defines __change_bit_le() locally in a similar fashion to
asm-generic/bitops/le.h and use it.

Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29 15:47:28 +01:00
Iwo Mergler 3cf06f4f85 mtd: tests: test for multi-bit error correction
This tests ECC biterror recovery on a single NAND page. Mostly intended
to test ECC hardware and low-level NAND driver.

There are two test modes:

    0 - artificially inserting bit errors until the ECC fails
        This is the default method and fairly quick. It should
        be independent of the quality of the FLASH.

    1 - re-writing the same pattern repeatedly until the ECC fails.
        This method relies on the physics of NAND FLASH to eventually
        generate '0' bits if '1' has been written sufficient times. Depending
        on the NAND, the first bit errors will appear after 1000 or
        more writes and then will usually snowball, reaching the limits
        of the ECC quickly.

The test stops after 10000 cycles, should your FLASH be exceptionally
good and not generate bit errors before that. Try a different page
offset in that case.

Please note that neither of these tests will significantly 'use up' any FLASH
endurance. Only a maximum of two erase operations will be performed.

Signed-off-by: Iwo Mergler <Iwo.Mergler@netcommwireless.com.au>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29 15:46:58 +01:00
Akinobu Mita 1749c00ffc mtd: mtd_nandecctest: ensure alignment requirement for bitops
Currently the data blocks which is used to test single bit error
correction is allocated statically and injecting single bit error is
implemented by using __change_bit() which must operate on the memory
aligned to the size of an "unsigned long".  But there is no such
guarantee for statically allocated array.

This fix the issue by allocating the data block dynamically by
kmalloc().  It also allocate the ecc code dynamically instead of
allocating statically on stack.

The reason to allocate the ecc code dynamically is that later change
will add tests which inject bit errors into the ecc code by bitops.

Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29 15:34:30 +01:00
Akinobu Mita c5b8384abc mtd: mtd_nandecctest: improve message output
This includes the message related changes:

- Use pr_* instead of printk
- Print hexdump of ECC code if test fails
- Change log level for hexdump of data from KERN_DEBUG to KERN_INFO
- Factor out the hexdump code into a separate function

Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29 15:34:28 +01:00
Akinobu Mita bb82477ebe mtd: mtd_nandecctest: make module_init() return appropriate errno
Return -EINVAL instead of -1 (-EPERM) when test fails.

Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29 15:34:25 +01:00
Akinobu Mita 1f6edadccc mtd: mtd_nandecctest: remove unnecessary include
Including linux/jiffies.h was required for calling srandom32(jiffies)
that has already been removed.

Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29 15:34:22 +01:00
Akinobu Mita f45c2990dc mtd: mtd_nandecctest: make module_init() return an error code if test fails
Return an error code if test fails in order to detect a test case failure
by invoking tests repeatedly like this:

while sudo modprobe mtd_nandecctest; do
	sudo modprobe -r mtd_nandecctest
done

Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29 15:13:08 +01:00
Akinobu Mita 0ce0060f10 mtd: mtd_nandecctest: remove unnecessary srandom32() call
It is unnecessary for this driver to call srandom32() in module_init.

Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29 15:13:05 +01:00
Artem Bityutskiy bfea1d4ee5 mtd: tests: use random32 instead of home-brewed generator
This is a clean-up patch which removes the own pseudo-random numbers generator
from the speed- and stress-tests and makes them use the 'random32()' generator
instead.

[dwmw2: Merge later fix for negative offsets]

Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-07-06 18:17:04 +01:00
Artem Bityutskiy 8f461a7302 mtd: introduce mtd_can_have_bb helper
This patch introduces new 'mtd_can_have_bb()' helper function which checks
whether the flash can have bad eraseblocks. Then it changes all the
direct 'mtd->block_isbad' use cases with 'mtd_can_have_bb()'.

Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-01-09 18:26:24 +00:00
Artem Bityutskiy 30fa98480b mtd: remove extra retlen assignment
MTD functions always assign the 'retlen' argument to 0 at the very
beginning - the callers do not have to do this.

I used the following semantic patch to find these places:

@@
identifier retlen;
expression a, b, c, d, e;
constant C;
type T;
@@
(
- retlen = C;
|
T
-retlen = C
+ retlen
;
)

... when != retlen
    when exists

(
mtd_read(a, b, c, &retlen, d)
|
mtd_write(a, b, c, &retlen, d)
|
mtd_panic_write(a, b, c, &retlen, d)
|
mtd_point(a, b, c, &retlen, d, e)
|
mtd_read_fact_prot_reg(a, b, c, &retlen, d)
|
mtd_write_user_prot_reg(a, b, c, &retlen, d)
|
mtd_read_user_prot_reg(a, b, c, &retlen, d)
|
mtd_writev(a, b, c, d, &retlen)
)

I ran it twice, because there were cases of double zero assigments
in mtd tests. Then I went through the patch to verify that spatch
did not find any false positives.

Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-01-09 18:25:56 +00:00
Artem Bityutskiy 7086c19d07 mtd: introduce mtd_block_isbad interface
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-01-09 18:25:47 +00:00
Artem Bityutskiy a2cc5ba075 mtd: introduce mtd_write_oob interface
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-01-09 18:25:24 +00:00
Artem Bityutskiy fd2819bbc9 mtd: introduce mtd_read_oob interface
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-01-09 18:25:23 +00:00
Artem Bityutskiy eda95cbf75 mtd: introduce mtd_write interface
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-01-09 18:25:20 +00:00
Artem Bityutskiy 329ad399a9 mtd: introduce mtd_read interface
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-01-09 18:25:19 +00:00
Artem Bityutskiy 7e1f0dc055 mtd: introduce mtd_erase interface
This patch is part of a patch-set which changes the MTD interface
from 'mtd->func()' form to 'mtd_func()' form. We need this because
we want to add common code to to all drivers in the mtd core level,
which is impossible with the current interface when MTD clients
call driver functions like 'read()' or 'write()' directly.

At this point we just introduce a new inline wrapper function, but
later some of them are expected to gain more code. E.g., the input
parameters check should be moved to the wrappers rather than be
duplicated at many drivers.

This particular patch introduced the 'mtd_erase()' interface. The
following patches add all the other interfaces one by one.

Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-01-09 18:25:11 +00:00
Wolfram Sang 2f4478ccff mtd: tests: stresstest: bail out if device has not enough eraseblocks
stresstest needs at least two eraseblocks. Bail out gracefully if that
condition is not met. Fixes the following 'division by zero' OOPS:

[  619.100000] mtd_stresstest: MTD device size 131072, eraseblock size 131072, page size 2048, count of eraseblocks 1, pages per eraseblock 64, OOB size 64
[  619.120000] mtd_stresstest: scanning for bad eraseblocks
[  619.120000] mtd_stresstest: scanned 1 eraseblocks, 0 are bad
[  619.130000] mtd_stresstest: doing operations
[  619.130000] mtd_stresstest: 0 operations done
[  619.140000] Division by zero in kernel.
...

caused by

        /* Read or write up 2 eraseblocks at a time - hence 'ebcnt - 1' */
        eb %= (ebcnt - 1);

Cc: stable@kernel.org
Signed-off-by: Wolfram Sang <w.sang@pengutronix.de>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-01-09 18:12:42 +00:00
Wolfram Sang 7406060e29 mtd: tests: don't use mtd0 as a default
mtd tests may erase the mtd device, so force the user to specify which
mtd device to test by using the module parameter. Disable the default
(using mtd0) since this may destroy a vital part of the flash if the
module is inserted accidently or carelessly.

Reported-by: Roland Kletzing <devzero@web.de>
Signed-off-by: Wolfram Sang <w.sang@pengutronix.de>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@intel.com>
2011-10-30 14:31:04 +02:00
Brian Norris d57f40544a mtd: utilize `mtd_is_*()' functions
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@intel.com>
2011-09-21 09:19:06 +03:00
Brian Norris 0612b9ddc2 mtd: rename MTD_OOB_* to MTD_OPS_*
These modes are not necessarily for OOB only. Particularly, MTD_OOB_RAW
affected operations on in-band page data as well. To clarify these
options and to emphasize that their effect is applied per-operation, we
change the primary prefix to MTD_OPS_.

Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@intel.com>
2011-09-11 15:28:59 +03:00
Brian Norris 003bc47922 mtd: tests: ignore corrected bitflips in OOB on mtd_readtest
read_oob may now return ECC error codes. If the code is -EUCLEAN, then
we can safely ignore the error as a corrected bitflip.

Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Artem Bityutskiy <dedekind1@gmail.com>
2011-09-11 15:02:14 +03:00
David Lambert e70727e442 mtd: speedtest: fix integer overflow
32-bit integers used in 'calc_speed()' may overflow and lead to
incorrect results. Use 64-bit integers instead.

Signed-off-by: David Lambert <dave@lambsys.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2011-03-11 14:22:49 +00:00
Roman Tereshonkov 4085bcc682 mtd: tests: add multiblock erase test to the mtd_speedtest
New multiblock erase speed test is added to mtd_speedtest.
It consists of 2-, 4-, 8-, 16-, 32- and 64-blocks at once
multiblock erase tests.

Signed-off-by: Roman Tereshonkov <roman.tereshonkov@nokia.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2011-03-11 14:22:45 +00:00
Adrian Hunter fc7fe7691c mtd: tests: add count parameter to mtd_speedtest
By default mtd_speedtest uses all the eraseblocks of the
MTD partition being tested.  For large partitions a
smaller number is sufficient and makes running the test
quicker.  For that reason, add a parameter 'count' to
specify the maximum number of eraseblocks to use for
testing.

Signed-off-by: Adrian Hunter <adrian.hunter@nokia.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2011-03-11 14:22:45 +00:00
Roman Tereshonkov 7b7e905ec2 mtd: tests: print correct values
The ebcnt and pgcnt variable initialization is moved before printk
which uses them.

Signed-off-by: Roman Tereshonkov <roman.tereshonkov@nokia.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2011-03-11 14:22:44 +00:00
Roel Kluin 7fc14bcee0 mtd: tests: return -1 if verify failed
Signed-off-by: Roel Kluin <roel.kluin@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2010-08-02 09:06:20 +01:00
Julia Lawall 2bfefa4c96 drivers/mtd: Use kzalloc
Use kzalloc rather than the combination of kmalloc and memset.

The semantic patch that makes this change is as follows:
(http://coccinelle.lip6.fr/)

// <smpl>
@@
expression x,size,flags;
statement S;
@@

-x = kmalloc(size,flags);
+x = kzalloc(size,flags);
 if (x == NULL) S
-memset(x, 0, size);
// </smpl>

Signed-off-by: Julia Lawall <julia@diku.dk>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2010-05-13 21:23:06 +01:00
Tejun Heo 5a0e3ad6af include cleanup: Update gfp.h and slab.h includes to prepare for breaking implicit slab.h inclusion from percpu.h
percpu.h is included by sched.h and module.h and thus ends up being
included when building most .c files.  percpu.h includes slab.h which
in turn includes gfp.h making everything defined by the two files
universally available and complicating inclusion dependencies.

percpu.h -> slab.h dependency is about to be removed.  Prepare for
this change by updating users of gfp and slab facilities include those
headers directly instead of assuming availability.  As this conversion
needs to touch large number of source files, the following script is
used as the basis of conversion.

  http://userweb.kernel.org/~tj/misc/slabh-sweep.py

The script does the followings.

* Scan files for gfp and slab usages and update includes such that
  only the necessary includes are there.  ie. if only gfp is used,
  gfp.h, if slab is used, slab.h.

* When the script inserts a new include, it looks at the include
  blocks and try to put the new include such that its order conforms
  to its surrounding.  It's put in the include block which contains
  core kernel includes, in the same order that the rest are ordered -
  alphabetical, Christmas tree, rev-Xmas-tree or at the end if there
  doesn't seem to be any matching order.

* If the script can't find a place to put a new include (mostly
  because the file doesn't have fitting include block), it prints out
  an error message indicating which .h file needs to be added to the
  file.

The conversion was done in the following steps.

1. The initial automatic conversion of all .c files updated slightly
   over 4000 files, deleting around 700 includes and adding ~480 gfp.h
   and ~3000 slab.h inclusions.  The script emitted errors for ~400
   files.

2. Each error was manually checked.  Some didn't need the inclusion,
   some needed manual addition while adding it to implementation .h or
   embedding .c file was more appropriate for others.  This step added
   inclusions to around 150 files.

3. The script was run again and the output was compared to the edits
   from #2 to make sure no file was left behind.

4. Several build tests were done and a couple of problems were fixed.
   e.g. lib/decompress_*.c used malloc/free() wrappers around slab
   APIs requiring slab.h to be added manually.

5. The script was run on all .h files but without automatically
   editing them as sprinkling gfp.h and slab.h inclusions around .h
   files could easily lead to inclusion dependency hell.  Most gfp.h
   inclusion directives were ignored as stuff from gfp.h was usually
   wildly available and often used in preprocessor macros.  Each
   slab.h inclusion directive was examined and added manually as
   necessary.

6. percpu.h was updated not to include slab.h.

7. Build test were done on the following configurations and failures
   were fixed.  CONFIG_GCOV_KERNEL was turned off for all tests (as my
   distributed build env didn't work with gcov compiles) and a few
   more options had to be turned off depending on archs to make things
   build (like ipr on powerpc/64 which failed due to missing writeq).

   * x86 and x86_64 UP and SMP allmodconfig and a custom test config.
   * powerpc and powerpc64 SMP allmodconfig
   * sparc and sparc64 SMP allmodconfig
   * ia64 SMP allmodconfig
   * s390 SMP allmodconfig
   * alpha SMP allmodconfig
   * um on x86_64 SMP allmodconfig

8. percpu.h modifications were reverted so that it could be applied as
   a separate patch and serve as bisection point.

Given the fact that I had only a couple of failures from tests on step
6, I'm fairly confident about the coverage of this conversion patch.
If there is a breakage, it's likely to be something in one of the arch
headers which should be easily discoverable easily on most builds of
the specific arch.

Signed-off-by: Tejun Heo <tj@kernel.org>
Guess-its-ok-by: Christoph Lameter <cl@linux-foundation.org>
Cc: Ingo Molnar <mingo@redhat.com>
Cc: Lee Schermerhorn <Lee.Schermerhorn@hp.com>
2010-03-30 22:02:32 +09:00
Morten Thunberg Svendsen f5e2bae0aa mtd: tests: fix read, speed and stress tests on NOR flash
Before using block_isbad() check if mtd->block_isbad() is defined.
Calculating pgcnt must be done using pgsize defined to 512 on
NOR and mtd->writesize for NAND, not using  mtd->writesize directly.

Signed-off-by: Morten Thunberg Svendsen <mts.doredevelopment@gmail.com>
Acked-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2010-01-13 09:06:17 +00:00
Artem Bityutskiy 4c2b8a62bb mtd: make pagetest work
The mtd_pagetest test did not initialize the pgsize variable, which
basically means it did not work. This problem was reported by
Török Edwin <edwintorok@gmail.com>

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2009-11-30 10:02:41 +00:00
Akinobu Mita 7126bd8be4 mtd: add nand_ecc test module
This module tests NAND ECC functions.

The test is simple.

1. Create a 256 or 512 bytes block of data filled with random bytes (data)
2. Duplicate the data block and inject single bit error (error_data)
3. Try to correct error_data
4. Compare data and error_data

Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Acked-by: Vimal Singh <vimalsingh@ti.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2009-11-30 09:41:49 +00:00
Akinobu Mita f54d633637 mtd: cleanup mtd_oobtest
- Remove unnecessary memset for bbt
  All entries will be initialized at a few lines below
- Remove unnecessary initialization for mtd->erasesize
- Use write_whole_device()

Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2009-10-17 15:39:48 +01:00
Roel Kluin c6f7e7beb9 mtd: tests: fix read buffer overflows
Check whether index is within bounds before testing the element.

Signed-off-by: Roel Kluin <roel.kluin@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2009-09-04 09:40:17 +01:00
Hannes Eder 23d4249491 trivial: NULL noise: drivers/mtd/tests/mtd_*test.c
Fix this sparse warnings:
  drivers/mtd/tests/mtd_oobtest.c:139:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:192:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:219:41: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:284:25: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:525:25: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:545:25: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:569:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:589:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:613:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:633:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:673:41: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:701:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_readtest.c:74:41: warning: Using plain integer as NULL pointer

Signed-off-by: Hannes Eder <hannes@hanneseder.net>
Acked-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: Jiri Kosina <jkosina@suse.cz>
2009-03-30 15:22:04 +02:00
David Woodhouse 647b0d3854 [MTD] [TESTS] Fix some size_t printk format warnings
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2009-01-05 16:31:03 +00:00
Artem Bityutskiy 9faa8153be MTD: add MTD tests to compilation
Add MTD tests to Kconfig and Makefiles.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-10 17:00:44 +02:00
Artem Bityutskiy 4db451a764 MTD: tests: add mtd_torturetest
This test is designed to work for very long time and it tries to
wear few eraseblocks.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-10 17:00:40 +02:00
Artem Bityutskiy bf60862a58 MTD: tests: add mtd_subpagetest
This tests makes sure sub-pages on NAND MTD device work fine.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:14 +02:00
Artem Bityutskiy 7163cea15f MTD: tests: add mtd_stresstest
This test just performs random operations on random eraseblocks.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:14 +02:00
Artem Bityutskiy 72069be936 MTD: tests: add mtd_speedtest
This test examines I/O speed of the flash device.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:14 +02:00
Artem Bityutskiy 72091b6889 MTD: tests: add mtd_readtest
A simple tests which reads whole MTD device one page at a time.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:14 +02:00
Artem Bityutskiy e73f217439 MTD: tests: add mtd_pagetest
This test checks that NAND pages read/write work fine.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:14 +02:00
Artem Bityutskiy e3644da756 MTD: tests: add mtd_oobtest
This test checks that OOB of a NAND MTD device works fine.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:13 +02:00