This helper detects that whether the mtd's type is nand type.
Now, it's clear that the MTD_NANDFLASH stands for SLC nand only.
So use the mtd_type_is_nand() to replace the old check method
to do the nand type (include the SLC and MLC) check.
Signed-off-by: Huang Shijie <b32955@freescale.com>
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
All callers of mtdtest_write() print the same error message on failure.
This incorporates the error message to mtdtest_write() and removes them
from the callers.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
All callers of mtdtest_read() print the same error message on failure.
This incorporates the error message to mtdtest_read() and removes them
from the callers.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Use mtdtest_write() and mtdtest_erase_eraseblock() in mtd_test helpers.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Cc: Iwo Mergler <Iwo.Mergler@netcommwireless.com.au>
Cc: Brian Norris <computersforpeace@gmail.com>
Cc: Vikram Narayanan <vikram186@gmail.com>
Cc: Adrian Hunter <adrian.hunter@intel.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Use mtdtest_scan_for_bad_eraseblocks() and mtdtest_erase_good_eraseblocks()
in mtd_test helpers.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Cc: Brian Norris <computersforpeace@gmail.com>
Cc: Vikram Narayanan <vikram186@gmail.com>
Cc: Adrian Hunter <adrian.hunter@intel.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Use mtdtest_scan_for_bad_eraseblocks() and mtdtest_erase_good_eraseblocks()
in mtd_test helpers.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Cc: Brian Norris <computersforpeace@gmail.com>
Cc: Vikram Narayanan <vikram186@gmail.com>
Cc: Adrian Hunter <adrian.hunter@intel.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Use mtdtest_read(), mtdtest_write(), mtdtest_erase_eraseblock(), and
mtdtest_scan_for_bad_eraseblocks() in mtd_test helpers.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Cc: Brian Norris <computersforpeace@gmail.com>
Cc: Vikram Narayanan <vikram186@gmail.com>
Cc: Adrian Hunter <adrian.hunter@intel.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Use mtdtest_read() and mtdtest_scan_for_bad_eraseblocks() in mtd_test
helpers.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Cc: Brian Norris <computersforpeace@gmail.com>
Cc: Vikram Narayanan <vikram186@gmail.com>
Cc: Adrian Hunter <adrian.hunter@intel.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Use mtdtest_scan_for_bad_eraseblocks(), mtdtest_erase_good_eraseblocks(),
and mtdtest_erase_eraseblock() in mtd_test helpers.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Cc: Brian Norris <computersforpeace@gmail.com>
Cc: Vikram Narayanan <vikram186@gmail.com>
Cc: Adrian Hunter <adrian.hunter@intel.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Each mtd test module have a single source whose name is the same as
the module name. In order to link a single object including helper
functions to every test module, this rename these sources to the
different names.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Cc: Brian Norris <computersforpeace@gmail.com>
Cc: Vikram Narayanan <vikram186@gmail.com>
Cc: Adrian Hunter <adrian.hunter@intel.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This introduces the helper functions which can be used by several
mtd/tests modules.
The following three functions are used all over the test modules.
- mtdtest_erase_eraseblock()
- mtdtest_scan_for_bad_eraseblocks()
- mtdtest_erase_good_eraseblocks()
The following are wrapper functions for mtd_read() and mtd_write()
which can simplify the return value check.
- mtdtest_read()
- mtdtest_write()
All helpers are put into a single .c file and it will be linked to
every test module later. The code will actually be copied to every
test module, but it is fine for our small test infrastructure.
[dwmw2: merge later 'return -EIO when mtdtest_read() failed' fix]
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Cc: Brian Norris <computersforpeace@gmail.com>
Cc: Vikram Narayanan <vikram186@gmail.com>
Cc: Adrian Hunter <adrian.hunter@intel.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
These strings are now unnecessary and discouraged in the kernel. The
kernel will have plenty of big scary messages if kmalloc fails. These
now only serve to bloat the module.
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
* misc clean-ups in the MTD command-line partitioning parser (cmdlinepart)
* add flash locking support for STmicro chips serial flash chips, as well as
for CFI command set 2 chips.
* new driver for the ELM error correction HW module found in various TI chips,
enable the OMAP NAND driver to use the ELM HW error correction
* added number of new serial flash IDs
* various fixes and improvements in the gpmi NAND driver
* bcm47xx NAND driver improvements
* make the mtdpart module actually removable
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Merge tag 'for-linus-20130301' of git://git.infradead.org/linux-mtd
Pull MTD update from David Woodhouse:
"Fairly unexciting MTD merge for 3.9:
- misc clean-ups in the MTD command-line partitioning parser
(cmdlinepart)
- add flash locking support for STmicro chips serial flash chips, as
well as for CFI command set 2 chips.
- new driver for the ELM error correction HW module found in various
TI chips, enable the OMAP NAND driver to use the ELM HW error
correction
- added number of new serial flash IDs
- various fixes and improvements in the gpmi NAND driver
- bcm47xx NAND driver improvements
- make the mtdpart module actually removable"
* tag 'for-linus-20130301' of git://git.infradead.org/linux-mtd: (45 commits)
mtd: map: BUG() in non handled cases
mtd: bcm47xxnflash: use pr_fmt for module prefix in messages
mtd: davinci_nand: Use managed resources
mtd: mtd_torturetest can cause stack overflows
mtd: physmap_of: Convert device allocation to managed devm_kzalloc()
mtd: at91: atmel_nand: for PMECC, add code to check the ONFI parameter ECC requirement.
mtd: atmel_nand: make pmecc-cap, pmecc-sector-size in dts is optional.
mtd: atmel_nand: avoid to report an error when lookup table offset is 0.
mtd: bcm47xxsflash: adjust names of bus-specific functions
mtd: bcm47xxpart: improve probing of nvram partition
mtd: bcm47xxpart: add support for other erase sizes
mtd: bcm47xxnflash: register this as normal driver
mtd: bcm47xxnflash: fix message
mtd: bcm47xxsflash: register this as normal driver
mtd: bcm47xxsflash: write number of written bytes
mtd: gpmi: add sanity check for the ECC
mtd: gpmi: set the Golois Field bit for mx6q's BCH
mtd: devices: elm: Removes <xx> literals in elm DT node
mtd: gpmi: fix a dereferencing freed memory error
mtd: fix the wrong timeo for panic_nand_wait()
...
This removes home-brewed pseudo-random number generator and use
prandom library.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Cc: Artem Bityutskiy <dedekind1@gmail.com>
Cc: David Woodhouse <dwmw2@infradead.org>
Cc: "Theodore Ts'o" <tytso@mit.edu>
Cc: Adrian Hunter <adrian.hunter@intel.com>
Cc: David Laight <david.laight@aculab.com>
Cc: Eilon Greenstein <eilong@broadcom.com>
Cc: Michel Lespinasse <walken@google.com>
Cc: Robert Love <robert.w.love@intel.com>
Cc: Valdis Kletnieks <valdis.kletnieks@vt.edu>
Signed-off-by: Andrew Morton <akpm@linux-foundation.org>
Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
Use prandom_bytes instead of equivalent local function.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Cc: Artem Bityutskiy <dedekind1@gmail.com>
Cc: David Woodhouse <dwmw2@infradead.org>
Cc: "Theodore Ts'o" <tytso@mit.edu>
Cc: Adrian Hunter <adrian.hunter@intel.com>
Cc: David Laight <david.laight@aculab.com>
Cc: Eilon Greenstein <eilong@broadcom.com>
Cc: Michel Lespinasse <walken@google.com>
Cc: Robert Love <robert.w.love@intel.com>
Cc: Valdis Kletnieks <valdis.kletnieks@vt.edu>
Signed-off-by: Andrew Morton <akpm@linux-foundation.org>
Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
This removes home-brewed pseudo-random number generator and use
prandom library.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Cc: Artem Bityutskiy <dedekind1@gmail.com>
Cc: David Woodhouse <dwmw2@infradead.org>
Cc: "Theodore Ts'o" <tytso@mit.edu>
Cc: Adrian Hunter <adrian.hunter@intel.com>
Cc: David Laight <david.laight@aculab.com>
Cc: Eilon Greenstein <eilong@broadcom.com>
Cc: Michel Lespinasse <walken@google.com>
Cc: Robert Love <robert.w.love@intel.com>
Cc: Valdis Kletnieks <valdis.kletnieks@vt.edu>
Signed-off-by: Andrew Morton <akpm@linux-foundation.org>
Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
This removes home-brewed pseudo-random number generator and use
prandom library.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Cc: Artem Bityutskiy <dedekind1@gmail.com>
Cc: David Woodhouse <dwmw2@infradead.org>
Cc: "Theodore Ts'o" <tytso@mit.edu>
Cc: Adrian Hunter <adrian.hunter@intel.com>
Cc: David Laight <david.laight@aculab.com>
Cc: Eilon Greenstein <eilong@broadcom.com>
Cc: Michel Lespinasse <walken@google.com>
Cc: Robert Love <robert.w.love@intel.com>
Cc: Valdis Kletnieks <valdis.kletnieks@vt.edu>
Signed-off-by: Andrew Morton <akpm@linux-foundation.org>
Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
Using prandom_bytes() is enough. Because this data is only used
for testing, not used for cryptographic use.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Cc: Artem Bityutskiy <dedekind1@gmail.com>
Cc: David Woodhouse <dwmw2@infradead.org>
Cc: "Theodore Ts'o" <tytso@mit.edu>
Cc: Adrian Hunter <adrian.hunter@intel.com>
Cc: David Laight <david.laight@aculab.com>
Cc: Eilon Greenstein <eilong@broadcom.com>
Cc: Michel Lespinasse <walken@google.com>
Cc: Robert Love <robert.w.love@intel.com>
Cc: Valdis Kletnieks <valdis.kletnieks@vt.edu>
Signed-off-by: Andrew Morton <akpm@linux-foundation.org>
Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
mtd_torturetest uses the module parm "ebcnt" to control the size of a
stack based array of int's. When "ebcnt" is large, Ex: 1000, it
causes stack overflows on systems with small kernel stacks. The fix
is to move the array from the stack to kmalloc memory.
Signed-off-by: Al Cooper <alcooperx@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Use more preferable function name which implies using a pseudo-random
number generator.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
fix: do block-buffer initialize for the whole next page to zero.
Signed-off-by: Christian Herzig <christian.herzig@keymile.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Use pr_info() and pr_err() while defining pr_fmt(). This saves a few
characters, joins a few lines, and makes the code a little more readable
(and grep-able).
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Vikram Narayanan <vikram186@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Use KBUILD_MODNAME instead of hardcoding the filename
Signed-off-by: Vikram Narayanan <vikram186@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
This adds the double bit error detection test cases listed below:
* Prepare data block with double bit error and ECC data without
corruption, and verify that the uncorrectable error is detected by
__nand_correct_data().
* Prepare data block with single bit error and ECC data with single bit
error, and verify that the uncorrectable error is detected.
* Prepare data block without corruption and ECC data with double bit
error, and verify that the uncorrectable error is detected.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This adds the single bit error correction test case listed below:
Prepare data block without corruption and ECC data with single bit error,
and verify that the data block is preserved by __nand_correct_data().
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This adds no corruptin test case listed below:
Prepare data block and ECC data with no corruption, and verify that
the data block is preserved by __nand_correct_data()
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This rewrites the entire test routine in order to make it easy to add more
tests by later changes and minimize duplication of each tests as much as
possible.
Now that each test is described by the members of struct nand_ecc_test:
- name: descriptive testname
- prepare: function to prepare data block and ecc with artifical corruption
- verify: function to verify the result of correcting data block
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Currently inject_single_bit_error() is used to inject single bit error
into randomly selected bit position of the 256 or 512 bytes data block.
Later change will add tests which inject bit errors into the ecc code.
Unfortunately, inject_single_bit_error() doesn't work for the ecc code
which is not a multiple of sizeof(unsigned long).
Because bit fliping at random position is done by __change_bit().
For example, flipping bit position 0 by __change_bit(0, addr) modifies
3rd byte (32bit) or 7th byte (64bit) on big-endian systems.
Using little-endian version of bitops can fix this issue. But
little-endian version of __change_bit is not yet available.
So this defines __change_bit_le() locally in a similar fashion to
asm-generic/bitops/le.h and use it.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This tests ECC biterror recovery on a single NAND page. Mostly intended
to test ECC hardware and low-level NAND driver.
There are two test modes:
0 - artificially inserting bit errors until the ECC fails
This is the default method and fairly quick. It should
be independent of the quality of the FLASH.
1 - re-writing the same pattern repeatedly until the ECC fails.
This method relies on the physics of NAND FLASH to eventually
generate '0' bits if '1' has been written sufficient times. Depending
on the NAND, the first bit errors will appear after 1000 or
more writes and then will usually snowball, reaching the limits
of the ECC quickly.
The test stops after 10000 cycles, should your FLASH be exceptionally
good and not generate bit errors before that. Try a different page
offset in that case.
Please note that neither of these tests will significantly 'use up' any FLASH
endurance. Only a maximum of two erase operations will be performed.
Signed-off-by: Iwo Mergler <Iwo.Mergler@netcommwireless.com.au>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Currently the data blocks which is used to test single bit error
correction is allocated statically and injecting single bit error is
implemented by using __change_bit() which must operate on the memory
aligned to the size of an "unsigned long". But there is no such
guarantee for statically allocated array.
This fix the issue by allocating the data block dynamically by
kmalloc(). It also allocate the ecc code dynamically instead of
allocating statically on stack.
The reason to allocate the ecc code dynamically is that later change
will add tests which inject bit errors into the ecc code by bitops.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This includes the message related changes:
- Use pr_* instead of printk
- Print hexdump of ECC code if test fails
- Change log level for hexdump of data from KERN_DEBUG to KERN_INFO
- Factor out the hexdump code into a separate function
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Return -EINVAL instead of -1 (-EPERM) when test fails.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Including linux/jiffies.h was required for calling srandom32(jiffies)
that has already been removed.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Return an error code if test fails in order to detect a test case failure
by invoking tests repeatedly like this:
while sudo modprobe mtd_nandecctest; do
sudo modprobe -r mtd_nandecctest
done
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
It is unnecessary for this driver to call srandom32() in module_init.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This is a clean-up patch which removes the own pseudo-random numbers generator
from the speed- and stress-tests and makes them use the 'random32()' generator
instead.
[dwmw2: Merge later fix for negative offsets]
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This patch introduces new 'mtd_can_have_bb()' helper function which checks
whether the flash can have bad eraseblocks. Then it changes all the
direct 'mtd->block_isbad' use cases with 'mtd_can_have_bb()'.
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
MTD functions always assign the 'retlen' argument to 0 at the very
beginning - the callers do not have to do this.
I used the following semantic patch to find these places:
@@
identifier retlen;
expression a, b, c, d, e;
constant C;
type T;
@@
(
- retlen = C;
|
T
-retlen = C
+ retlen
;
)
... when != retlen
when exists
(
mtd_read(a, b, c, &retlen, d)
|
mtd_write(a, b, c, &retlen, d)
|
mtd_panic_write(a, b, c, &retlen, d)
|
mtd_point(a, b, c, &retlen, d, e)
|
mtd_read_fact_prot_reg(a, b, c, &retlen, d)
|
mtd_write_user_prot_reg(a, b, c, &retlen, d)
|
mtd_read_user_prot_reg(a, b, c, &retlen, d)
|
mtd_writev(a, b, c, d, &retlen)
)
I ran it twice, because there were cases of double zero assigments
in mtd tests. Then I went through the patch to verify that spatch
did not find any false positives.
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Huang Shijie