fwnode_irq_get[_byname]() were changed to not return 0 anymore. The
special error case where device-tree based IRQ mapping fails can't no
longer be reliably detected from this return value. This yields a
functional change in the driver where the mapping failure is treated as
an error.
The mapping failure can occur for example when the device-tree IRQ
information translation call-back(s) (xlate) fail, IRQ domain is not
found, IRQ type conflicts, etc. In most cases this indicates an error in
the device-tree and special handling is not really required.
One more thing to note is that ACPI APIs do not return zero for any
failures so this special handling did only apply on device-tree based
systems.
Drop the special handling for DT mapping failures as these can no longer
be separated from other errors at driver side. Change all failures in
IRQ getting to be handled by continuing without the events instead of
aborting the probe upon certain errors.
Signed-off-by: Matti Vaittinen <mazziesaccount@gmail.com>
Link: https://lore.kernel.org/r/3ad1c6f195ead3dfa8711235e1dead139d27f700.1690890774.git.mazziesaccount@gmail.com
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
After commit b8a1a4cd5a ("i2c: Provide a temporary .probe_new()
call-back type"), all drivers being converted to .probe_new() and then
03c835f498 ("i2c: Switch .probe() to not take an id parameter") convert
back to (the new) .probe() to be able to eventually drop .probe_new() from
struct i2c_driver.
Signed-off-by: Uwe Kleine-König <u.kleine-koenig@pengutronix.de>
Link: https://lore.kernel.org/r/20230515205048.19561-1-u.kleine-koenig@pengutronix.de
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
.probe_new() doesn't get the i2c_device_id * parameter, so determine
that explicitly in the probe function.
Signed-off-by: Uwe Kleine-König <u.kleine-koenig@pengutronix.de>
Reviewed-by: Andy Shevchenko <andriy.shevchenko@linux.intel.com>
Link: https://lore.kernel.org/r/20221118224540.619276-73-uwe@kleine-koenig.org
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
.probe_new() doesn't get the i2c_device_id * parameter, so determine
that explicitly in the probe function.
Signed-off-by: Uwe Kleine-König <u.kleine-koenig@pengutronix.de>
Reviewed-by: Andy Shevchenko <andriy.shevchenko@linux.intel.com>
Link: https://lore.kernel.org/r/20221118224540.619276-72-uwe@kleine-koenig.org
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
This driver only turns the power on at probe and off via a custom
devm_add_action_or_reset() callback. The new devm_regulator_get_enable()
replaces this boilerplate code.
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
Reviewed-by: Matti Vaittinen <mazziesaccount@gmail.com>
Reviewed-by: Nuno Sá <nuno.sa@analog.com>
Link: https://lore.kernel.org/r/20221016163409.320197-7-jic23@kernel.org
All known major issues with this driver resolved so time to move
it out of staging. This also allows us to remove the now empty
staging/iio/cdc directory and build files.
Note this cleanup work was done using the roadtest framework.
https://lore.kernel.org/all/20220311162445.346685-1-vincent.whitchurch@axis.com/
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
Reviewed-by: Andy Shevchenko <andy.shevchenko@gmail.com>
This doesn't appear to generate a warning on all versions of GCC, but
0-day reported it and the report looks valid.
Reported-by: kbuild test robot <lkp@intel.com>
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
This capacitance to digital converter (CDC) driver is compliant with
the IIO ABI. Note, not all features supported (e.g. window event modes)
but the driver should be in a useful functional state.
The cleanup was done against QEMU emulation of the device rather than
actual hardware. Whilst this was a bit of an experiment, it made it
easy to confirm that the driver remained in a consistent working state
through the various refactors. If it worked in the first place, it
should still be working after this cleanup.
Given some IIO drivers require expensive hardware setups, (not particularly
true with this one) the use of QEMU may provide a viable way forward
for providing testing during code changes where previously we'd had
to rely on sharp eyes and crossed fingers.
Note, no explicit MAINTAINERS entry as it will be covered by the
generic catch-alls for ADI and IIO drivers which are sufficient.
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
Reviewed-by: Alexandru Ardelean <alexandru.ardelean@analog.com>
Link: https://lore.kernel.org/r/20210314181511.531414-25-jic23@kernel.org
Matti Vaittinen