iio: core: Introduce IIO_CHAN_INFO_OVERSAMPLING_RATIO
Some magnetometers can perform a number of repetitions in HW for each measurement to increase accuracy. One example is Bosch BMC150: http://ae-bst.resource.bosch.com/media/products/dokumente/bmc150/BST-BMC150-DS000-04.pdf. Introduce an interface to set the oversampling ratio for these devices. Signed-off-by: Irina Tirdea <irina.tirdea@intel.com> Signed-off-by: Jonathan Cameron <jic23@kernel.org>
This commit is contained in:
parent
42a95584f3
commit
faaa44955d
|
@ -1375,3 +1375,15 @@ Description:
|
|||
The emissivity ratio of the surface in the field of view of the
|
||||
contactless temperature sensor. Emissivity varies from 0 to 1,
|
||||
with 1 being the emissivity of a black body.
|
||||
|
||||
What: /sys/bus/iio/devices/iio:deviceX/in_magn_x_oversampling_ratio
|
||||
What: /sys/bus/iio/devices/iio:deviceX/in_magn_y_oversampling_ratio
|
||||
What: /sys/bus/iio/devices/iio:deviceX/in_magn_z_oversampling_ratio
|
||||
KernelVersion: 4.2
|
||||
Contact: linux-iio@vger.kernel.org
|
||||
Description:
|
||||
Hardware applied number of measurements for acquiring one
|
||||
data point. The HW will do <type>[_name]_oversampling_ratio
|
||||
measurements and return the average value as output data. Each
|
||||
value resulted from <type>[_name]_oversampling_ratio measurements
|
||||
is considered as one sample for <type>[_name]_sampling_frequency.
|
||||
|
|
|
@ -129,6 +129,7 @@ static const char * const iio_chan_info_postfix[] = {
|
|||
[IIO_CHAN_INFO_DEBOUNCE_COUNT] = "debounce_count",
|
||||
[IIO_CHAN_INFO_DEBOUNCE_TIME] = "debounce_time",
|
||||
[IIO_CHAN_INFO_CALIBEMISSIVITY] = "calibemissivity",
|
||||
[IIO_CHAN_INFO_OVERSAMPLING_RATIO] = "oversampling_ratio",
|
||||
};
|
||||
|
||||
/**
|
||||
|
|
|
@ -44,6 +44,7 @@ enum iio_chan_info_enum {
|
|||
IIO_CHAN_INFO_DEBOUNCE_COUNT,
|
||||
IIO_CHAN_INFO_DEBOUNCE_TIME,
|
||||
IIO_CHAN_INFO_CALIBEMISSIVITY,
|
||||
IIO_CHAN_INFO_OVERSAMPLING_RATIO,
|
||||
};
|
||||
|
||||
enum iio_shared_by {
|
||||
|
|
Loading…
Reference in New Issue