staging: iio: ring_generic: provide IIO_CONST_ATTR_SCAN_EL_TYPE_WITH_SHIFT
Signed-off-by: Michael Hennerich <michael.hennerich@analog.com> Acked-by: Jonathan Cameron <jic23@cam.ac.uk> Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>
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@ -292,6 +292,23 @@ ssize_t iio_scan_el_ts_show(struct device *dev, struct device_attribute *attr,
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**/
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#define IIO_CONST_ATTR_SCAN_EL_TYPE(_name, _sign, _bits, _storagebits) \
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IIO_CONST_ATTR(_name##_type, #_sign#_bits"/"#_storagebits);
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/**
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* IIO_CONST_ATTR_SCAN_EL_TYPE_WITH_SHIFT - attr to specify the data format of a scan el
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* @name: the scan el name (may be more general and cover a set of scan elements
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* @_sign: either s or u for signed or unsigned
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* @_bits: number of actual bits occuplied by the value
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* @_storagebits: number of bits _bits is padded to when read out of buffer
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* @_shiftbits: number of bits _shiftbits the result must be shifted
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**/
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#define IIO_CONST_ATTR_SCAN_EL_TYPE_WITH_SHIFT(_name, _sign, _bits, \
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_storagebits, _shiftbits) \
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IIO_CONST_ATTR(_name##_type, #_sign#_bits"/"#_storagebits \
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">>"#_shiftbits);
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#define IIO_SCAN_EL_TYPE_SIGNED 's'
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#define IIO_SCAN_EL_TYPE_UNSIGNED 'u'
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/*
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* These are mainly provided to allow for a change of implementation if a device
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* has a large number of scan elements
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