usb: misc: usbtest: Fix overflow in usbtest_do_ioctl()
There used to be a test against "if (param->sglen > MAX_SGLEN)" but it
was removed during a refactor. It leads to an integer overflow and a
stack overflow in test_queue() if we try to create a too large urbs[]
array on the stack.
There is a second integer overflow in test_queue() as well if
"param->iterations" is too high. I don't immediately see that it's
harmful but I've added a check to prevent it and silence the static
checker warning.
Fixes: 18fc4ebdc7
("usb: misc: usbtest: Remove timeval usage")
Acked-by: Deepa Dinamani <deepa.kernel@gmail.com>
Signed-off-by: Dan Carpenter <dan.carpenter@oracle.com>
Signed-off-by: Felipe Balbi <felipe.balbi@linux.intel.com>
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@ -1964,6 +1964,9 @@ test_queue(struct usbtest_dev *dev, struct usbtest_param_32 *param,
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int status = 0;
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struct urb *urbs[param->sglen];
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if (!param->sglen || param->iterations > UINT_MAX / param->sglen)
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return -EINVAL;
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memset(&context, 0, sizeof(context));
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context.count = param->iterations * param->sglen;
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context.dev = dev;
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@ -2087,6 +2090,8 @@ usbtest_do_ioctl(struct usb_interface *intf, struct usbtest_param_32 *param)
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if (param->iterations <= 0)
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return -EINVAL;
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if (param->sglen > MAX_SGLEN)
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return -EINVAL;
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/*
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* Just a bunch of test cases that every HCD is expected to handle.
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*
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