rtc: make definitions in include/uapi/linux/rtc.h actually useful for user space
BIT() macro is not defined in UAPI headers; there is, however, similarly
defined _BITUL() macro present in include/uapi/linux/const.h; use it
instead and include <linux/const.h> and <linux/ioctl.h> in order to make
the definitions provided in the header useful.
Fixes: 3431ca4837
("rtc: define RTC_VL_READ values")
Signed-off-by: Eugene Syromiatnikov <esyr@redhat.com>
Link: https://lore.kernel.org/r/20200324041209.GA30727@asgard.redhat.com
Signed-off-by: Alexandre Belloni <alexandre.belloni@bootlin.com>
This commit is contained in:
parent
5614a4a3ca
commit
b0efe02812
|
@ -12,6 +12,9 @@
|
|||
#ifndef _UAPI_LINUX_RTC_H_
|
||||
#define _UAPI_LINUX_RTC_H_
|
||||
|
||||
#include <linux/const.h>
|
||||
#include <linux/ioctl.h>
|
||||
|
||||
/*
|
||||
* The struct used to pass data via the following ioctl. Similar to the
|
||||
* struct tm in <time.h>, but it needs to be here so that the kernel
|
||||
|
@ -92,10 +95,10 @@ struct rtc_pll_info {
|
|||
#define RTC_PLL_GET _IOR('p', 0x11, struct rtc_pll_info) /* Get PLL correction */
|
||||
#define RTC_PLL_SET _IOW('p', 0x12, struct rtc_pll_info) /* Set PLL correction */
|
||||
|
||||
#define RTC_VL_DATA_INVALID BIT(0) /* Voltage too low, RTC data is invalid */
|
||||
#define RTC_VL_BACKUP_LOW BIT(1) /* Backup voltage is low */
|
||||
#define RTC_VL_BACKUP_EMPTY BIT(2) /* Backup empty or not present */
|
||||
#define RTC_VL_ACCURACY_LOW BIT(3) /* Voltage is low, RTC accuracy is reduced */
|
||||
#define RTC_VL_DATA_INVALID _BITUL(0) /* Voltage too low, RTC data is invalid */
|
||||
#define RTC_VL_BACKUP_LOW _BITUL(1) /* Backup voltage is low */
|
||||
#define RTC_VL_BACKUP_EMPTY _BITUL(2) /* Backup empty or not present */
|
||||
#define RTC_VL_ACCURACY_LOW _BITUL(3) /* Voltage is low, RTC accuracy is reduced */
|
||||
|
||||
#define RTC_VL_READ _IOR('p', 0x13, unsigned int) /* Voltage low detection */
|
||||
#define RTC_VL_CLR _IO('p', 0x14) /* Clear voltage low information */
|
||||
|
|
Loading…
Reference in New Issue