staging: iio: tsl2583: combine sysfs documentation

There are two separate files describing the tsl2583 sysfs attributes.
Combine the two files into one. Updated the name of the sysfs attributes
to match the current ABI.

Signed-off-by: Brian Masney <masneyb@onstation.org>
Suggested-by: Peter Meerwald-Stadler <pmeerw@pmeerw.net>
Signed-off-by: Jonathan Cameron <jic23@kernel.org>
This commit is contained in:
Brian Masney 2016-11-12 13:19:27 -05:00 committed by Jonathan Cameron
parent 184f916fa7
commit a3549966ee
2 changed files with 15 additions and 21 deletions

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@ -1,6 +1,20 @@
What: /sys/bus/iio/devices/device[n]/in_illuminance0_calibrate
What: /sys/bus/iio/devices/device[n]/in_illuminance_calibrate
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
This property causes an internal calibration of the als gain trim
value which is later used in calculating illuminance in lux.
What: /sys/bus/iio/devices/device[n]/in_illuminance_lux_table
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
This property gets/sets the table of coefficients
used in calculating illuminance in lux.
What: /sys/bus/iio/devices/device[n]/in_illuminance_input_target
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
This property is the known externally illuminance (in lux).
It is used in the process of calibrating the device accuracy.

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@ -1,20 +0,0 @@
What: /sys/bus/iio/devices/device[n]/lux_table
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
This property gets/sets the table of coefficients
used in calculating illuminance in lux.
What: /sys/bus/iio/devices/device[n]/illuminance0_calibrate
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
This property causes an internal calibration of the als gain trim
value which is later used in calculating illuminance in lux.
What: /sys/bus/iio/devices/device[n]/illuminance0_input_target
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
This property is the known externally illuminance (in lux).
It is used in the process of calibrating the device accuracy.