hwmon: (dimmtemp) Fix bitmap handling
Building arm:allmodconfig may fail with the following error.
In function 'fortify_memcpy_chk',
inlined from 'bitmap_copy' at include/linux/bitmap.h:261:2,
inlined from 'bitmap_copy_clear_tail' at include/linux/bitmap.h:270:2,
inlined from 'bitmap_from_u64' at include/linux/bitmap.h:622:2,
inlined from 'check_populated_dimms' at
drivers/hwmon/peci/dimmtemp.c:284:2:
include/linux/fortify-string.h:344:25: error:
call to '__write_overflow_field' declared with attribute warning:
detected write beyond size of field (1st parameter)
The problematic code is
bitmap_from_u64(priv->dimm_mask, dimm_mask);
dimm_mask is declared as u64, but the bitmap in priv->dimm_mask is only
24 bit wide. On 32-bit systems, this results in writes over the end of
the bitmap.
Fix the problem by using u32 instead of u64 for dimm_mask. This is
currently sufficient, and a compile time check to ensure that the number
of dimms does not exceed the bit map size is already in place.
Fixes: 73bc1b885d
("hwmon: peci: Add dimmtemp driver")
Cc: Iwona Winiarska <iwona.winiarska@intel.com>
Reviewed-by: Iwona Winiarska <iwona.winiarska@intel.com>
Signed-off-by: Guenter Roeck <linux@roeck-us.net>
This commit is contained in:
parent
45988d9078
commit
9baabde04d
|
@ -220,7 +220,7 @@ static int check_populated_dimms(struct peci_dimmtemp *priv)
|
|||
int chan_rank_max = priv->gen_info->chan_rank_max;
|
||||
int dimm_idx_max = priv->gen_info->dimm_idx_max;
|
||||
u32 chan_rank_empty = 0;
|
||||
u64 dimm_mask = 0;
|
||||
u32 dimm_mask = 0;
|
||||
int chan_rank, dimm_idx, ret;
|
||||
u32 pcs;
|
||||
|
||||
|
@ -279,9 +279,9 @@ static int check_populated_dimms(struct peci_dimmtemp *priv)
|
|||
return -EAGAIN;
|
||||
}
|
||||
|
||||
dev_dbg(priv->dev, "Scanned populated DIMMs: %#llx\n", dimm_mask);
|
||||
dev_dbg(priv->dev, "Scanned populated DIMMs: %#x\n", dimm_mask);
|
||||
|
||||
bitmap_from_u64(priv->dimm_mask, dimm_mask);
|
||||
bitmap_from_arr32(priv->dimm_mask, &dimm_mask, DIMM_NUMS_MAX);
|
||||
|
||||
return 0;
|
||||
}
|
||||
|
|
Loading…
Reference in New Issue