From 3940ffc6549206d79707887c5bf3ecd58769f1ee Mon Sep 17 00:00:00 2001 From: David Yang Date: Tue, 9 May 2023 14:04:44 +0800 Subject: [PATCH] phy: hisilicon: Add inno-usb2-phy driver for Hi3798MV100 Adopt existing phy-hisi-inno-usb2 driver to Hi3798MV100, with a slightly different TEST register convention. Signed-off-by: David Yang Link: https://lore.kernel.org/r/20230509060449.1151113-2-mmyangfl@gmail.com Signed-off-by: Vinod Koul --- drivers/phy/hisilicon/phy-hisi-inno-usb2.c | 60 ++++++++++++++++------ 1 file changed, 45 insertions(+), 15 deletions(-) diff --git a/drivers/phy/hisilicon/phy-hisi-inno-usb2.c b/drivers/phy/hisilicon/phy-hisi-inno-usb2.c index b133ae06757a..15dafe359552 100644 --- a/drivers/phy/hisilicon/phy-hisi-inno-usb2.c +++ b/drivers/phy/hisilicon/phy-hisi-inno-usb2.c @@ -9,7 +9,7 @@ #include #include #include -#include +#include #include #include @@ -20,12 +20,25 @@ #define PHY_CLK_STABLE_TIME 2 /* unit:ms */ #define UTMI_RST_COMPLETE_TIME 2 /* unit:ms */ #define POR_RST_COMPLETE_TIME 300 /* unit:us */ + +#define PHY_TYPE_0 0 +#define PHY_TYPE_1 1 + #define PHY_TEST_DATA GENMASK(7, 0) -#define PHY_TEST_ADDR GENMASK(15, 8) -#define PHY_TEST_PORT GENMASK(18, 16) -#define PHY_TEST_WREN BIT(21) -#define PHY_TEST_CLK BIT(22) /* rising edge active */ -#define PHY_TEST_RST BIT(23) /* low active */ +#define PHY_TEST_ADDR_OFFSET 8 +#define PHY0_TEST_ADDR GENMASK(15, 8) +#define PHY0_TEST_PORT_OFFSET 16 +#define PHY0_TEST_PORT GENMASK(18, 16) +#define PHY0_TEST_WREN BIT(21) +#define PHY0_TEST_CLK BIT(22) /* rising edge active */ +#define PHY0_TEST_RST BIT(23) /* low active */ +#define PHY1_TEST_ADDR GENMASK(11, 8) +#define PHY1_TEST_PORT_OFFSET 12 +#define PHY1_TEST_PORT BIT(12) +#define PHY1_TEST_WREN BIT(13) +#define PHY1_TEST_CLK BIT(14) /* rising edge active */ +#define PHY1_TEST_RST BIT(15) /* low active */ + #define PHY_CLK_ENABLE BIT(2) struct hisi_inno_phy_port { @@ -37,6 +50,7 @@ struct hisi_inno_phy_priv { void __iomem *mmio; struct clk *ref_clk; struct reset_control *por_rst; + unsigned int type; struct hisi_inno_phy_port ports[INNO_PHY_PORT_NUM]; }; @@ -45,17 +59,27 @@ static void hisi_inno_phy_write_reg(struct hisi_inno_phy_priv *priv, { void __iomem *reg = priv->mmio; u32 val; + u32 value; - val = (data & PHY_TEST_DATA) | - ((addr << 8) & PHY_TEST_ADDR) | - ((port << 16) & PHY_TEST_PORT) | - PHY_TEST_WREN | PHY_TEST_RST; + if (priv->type == PHY_TYPE_0) + val = (data & PHY_TEST_DATA) | + ((addr << PHY_TEST_ADDR_OFFSET) & PHY0_TEST_ADDR) | + ((port << PHY0_TEST_PORT_OFFSET) & PHY0_TEST_PORT) | + PHY0_TEST_WREN | PHY0_TEST_RST; + else + val = (data & PHY_TEST_DATA) | + ((addr << PHY_TEST_ADDR_OFFSET) & PHY1_TEST_ADDR) | + ((port << PHY1_TEST_PORT_OFFSET) & PHY1_TEST_PORT) | + PHY1_TEST_WREN | PHY1_TEST_RST; writel(val, reg); - val |= PHY_TEST_CLK; - writel(val, reg); + value = val; + if (priv->type == PHY_TYPE_0) + value |= PHY0_TEST_CLK; + else + value |= PHY1_TEST_CLK; + writel(value, reg); - val &= ~PHY_TEST_CLK; writel(val, reg); } @@ -135,6 +159,8 @@ static int hisi_inno_phy_probe(struct platform_device *pdev) if (IS_ERR(priv->por_rst)) return PTR_ERR(priv->por_rst); + priv->type = (uintptr_t) of_device_get_match_data(dev); + for_each_child_of_node(np, child) { struct reset_control *rst; struct phy *phy; @@ -170,8 +196,12 @@ static int hisi_inno_phy_probe(struct platform_device *pdev) } static const struct of_device_id hisi_inno_phy_of_match[] = { - { .compatible = "hisilicon,inno-usb2-phy", }, - { .compatible = "hisilicon,hi3798cv200-usb2-phy", }, + { .compatible = "hisilicon,inno-usb2-phy", + .data = (void *) PHY_TYPE_0 }, + { .compatible = "hisilicon,hi3798cv200-usb2-phy", + .data = (void *) PHY_TYPE_0 }, + { .compatible = "hisilicon,hi3798mv100-usb2-phy", + .data = (void *) PHY_TYPE_1 }, { }, }; MODULE_DEVICE_TABLE(of, hisi_inno_phy_of_match);