lib/bitmap: add test for bitmap_{from,to}_arr64
Test newly added bitmap_{from,to}_arr64() functions similarly to already existing bitmap_{from,to}_arr32() tests. CC: Alexander Gordeev <agordeev@linux.ibm.com> CC: Andy Shevchenko <andriy.shevchenko@linux.intel.com> CC: Christian Borntraeger <borntraeger@linux.ibm.com> CC: Claudio Imbrenda <imbrenda@linux.ibm.com> CC: David Hildenbrand <david@redhat.com> CC: Heiko Carstens <hca@linux.ibm.com> CC: Janosch Frank <frankja@linux.ibm.com> CC: Rasmus Villemoes <linux@rasmusvillemoes.dk> CC: Sven Schnelle <svens@linux.ibm.com> CC: Vasily Gorbik <gor@linux.ibm.com> Signed-off-by: Yury Norov <yury.norov@gmail.com>
This commit is contained in:
parent
0a97953fd2
commit
2c523550b9
|
@ -585,6 +585,30 @@ static void __init test_bitmap_arr32(void)
|
|||
}
|
||||
}
|
||||
|
||||
static void __init test_bitmap_arr64(void)
|
||||
{
|
||||
unsigned int nbits, next_bit;
|
||||
u64 arr[EXP1_IN_BITS / 64];
|
||||
DECLARE_BITMAP(bmap2, EXP1_IN_BITS);
|
||||
|
||||
memset(arr, 0xa5, sizeof(arr));
|
||||
|
||||
for (nbits = 0; nbits < EXP1_IN_BITS; ++nbits) {
|
||||
memset(bmap2, 0xff, sizeof(arr));
|
||||
bitmap_to_arr64(arr, exp1, nbits);
|
||||
bitmap_from_arr64(bmap2, arr, nbits);
|
||||
expect_eq_bitmap(bmap2, exp1, nbits);
|
||||
|
||||
next_bit = find_next_bit(bmap2, round_up(nbits, BITS_PER_LONG), nbits);
|
||||
if (next_bit < round_up(nbits, BITS_PER_LONG))
|
||||
pr_err("bitmap_copy_arr64(nbits == %d:"
|
||||
" tail is not safely cleared: %d\n", nbits, next_bit);
|
||||
|
||||
if (nbits < EXP1_IN_BITS - 64)
|
||||
expect_eq_uint(arr[DIV_ROUND_UP(nbits, 64)], 0xa5a5a5a5);
|
||||
}
|
||||
}
|
||||
|
||||
static void noinline __init test_mem_optimisations(void)
|
||||
{
|
||||
DECLARE_BITMAP(bmap1, 1024);
|
||||
|
@ -852,6 +876,7 @@ static void __init selftest(void)
|
|||
test_copy();
|
||||
test_replace();
|
||||
test_bitmap_arr32();
|
||||
test_bitmap_arr64();
|
||||
test_bitmap_parse();
|
||||
test_bitmap_parselist();
|
||||
test_bitmap_printlist();
|
||||
|
|
Loading…
Reference in New Issue