UbiquitousOS
/
OpenCloudOS-Kernel
mirror of https://gitee.com/OpenCloudOS/OpenCloudOS-Kernel.git
11
0
Fork 0
Code Issues Projects Releases Wiki Activity
OpenCloudOS-Kernel/drivers/of/selftest.c

324 lines
8.4 KiB
C
Raw Normal View History

of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-13 00:25:57 +08:00
/*
* Self tests for device tree subsystem
*/
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-13 05:19:37 +08:00
#define pr_fmt(fmt) "### dt-test ### " fmt
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-13 00:25:57 +08:00
#include <linux/clk.h>
#include <linux/err.h>
#include <linux/errno.h>
#include <linux/module.h>
#include <linux/of.h>
of: Add testcases for interrupt parsing This patch extends the DT selftest code with some test cases for the interrupt parsing functions. Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-10-12 05:04:23 +08:00
#include <linux/of_irq.h>
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-13 00:25:57 +08:00
#include <linux/list.h>
#include <linux/mutex.h>
#include <linux/slab.h>
#include <linux/device.h>
of: Add testcases for interrupt parsing This patch extends the DT selftest code with some test cases for the interrupt parsing functions. Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-10-12 05:04:23 +08:00
static struct selftest_results {
int passed;
int failed;
} selftest_results;
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-13 00:25:57 +08:00
#define selftest(result, fmt, ...) { \
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-13 05:19:37 +08:00
if (!(result)) { \
of: Add testcases for interrupt parsing This patch extends the DT selftest code with some test cases for the interrupt parsing functions. Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-10-12 05:04:23 +08:00
selftest_results.failed++; \
pr_err("FAIL %s():%i " fmt, __func__, __LINE__, ##__VA_ARGS__); \
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-13 05:19:37 +08:00
} else { \
of: Add testcases for interrupt parsing This patch extends the DT selftest code with some test cases for the interrupt parsing functions. Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-10-12 05:04:23 +08:00
selftest_results.passed++; \
pr_debug("pass %s():%i\n", __func__, __LINE__); \
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-13 05:19:37 +08:00
} \
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-13 00:25:57 +08:00
}
static void __init of_selftest_parse_phandle_with_args(void)
{
struct device_node *np;
struct of_phandle_args args;
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-13 05:19:37 +08:00
int i, rc;
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-13 00:25:57 +08:00
np = of_find_node_by_path("/testcase-data/phandle-tests/consumer-a");
if (!np) {
pr_err("missing testcase data\n");
return;
}
of: Create function for counting number of phandles in a property This patch creates of_count_phandle_with_args(), a new function for counting the number of phandle+argument tuples in a given property. This is better than the existing method of parsing each phandle individually until parsing fails which is a horribly slow way to do the count. Tested on ARM using the selftest code. v3: - Rebased on top of selftest code cleanup patch v2: - fix bug where of_parse_phandle_with_args() could behave like _count_. - made of_gpio_named_count() into a static inline regardless of CONFIG_OF_GPIO Tested-by: Andreas Larsson <andreas@gaisler.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca> Cc: Linus Walleij <linus.walleij@linaro.org> Cc: Rob Herring <rob.herring@calxeda.com>
2013-02-11 06:57:21 +08:00
rc = of_count_phandle_with_args(np, "phandle-list", "#phandle-cells");
selftest(rc == 7, "of_count_phandle_with_args() returned %i, expected 7\n", rc);
of/selftest: Fix GPIOs selftest to cover the 7th case The of_gpio_named_count() self test doesn't hit the out-of-range condition even though it is coded. Fix the bug by increasing the for loop range by one. Reported-by: Andreas Larsson <andreas@gaisler.com> Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-13 01:41:22 +08:00
for (i = 0; i < 8; i++) {
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-13 00:25:57 +08:00
bool passed = true;
rc = of_parse_phandle_with_args(np, "phandle-list",
"#phandle-cells", i, &args);
/* Test the values from tests-phandle.dtsi */
switch (i) {
case 0:
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == (i + 1));
break;
case 1:
passed &= !rc;
passed &= (args.args_count == 2);
passed &= (args.args[0] == (i + 1));
passed &= (args.args[1] == 0);
break;
case 2:
passed &= (rc == -ENOENT);
break;
case 3:
passed &= !rc;
passed &= (args.args_count == 3);
passed &= (args.args[0] == (i + 1));
passed &= (args.args[1] == 4);
passed &= (args.args[2] == 3);
break;
case 4:
passed &= !rc;
passed &= (args.args_count == 2);
passed &= (args.args[0] == (i + 1));
passed &= (args.args[1] == 100);
break;
case 5:
passed &= !rc;
passed &= (args.args_count == 0);
break;
case 6:
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == (i + 1));
break;
case 7:
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-13 05:19:37 +08:00
passed &= (rc == -ENOENT);
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-13 00:25:57 +08:00
break;
default:
passed = false;
}
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-13 05:19:37 +08:00
selftest(passed, "index %i - data error on node %s rc=%i\n",
i, args.np->full_name, rc);
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-13 00:25:57 +08:00
}
/* Check for missing list property */
rc = of_parse_phandle_with_args(np, "phandle-list-missing",
"#phandle-cells", 0, &args);
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-13 05:19:37 +08:00
selftest(rc == -ENOENT, "expected:%i got:%i\n", -ENOENT, rc);
of: Create function for counting number of phandles in a property This patch creates of_count_phandle_with_args(), a new function for counting the number of phandle+argument tuples in a given property. This is better than the existing method of parsing each phandle individually until parsing fails which is a horribly slow way to do the count. Tested on ARM using the selftest code. v3: - Rebased on top of selftest code cleanup patch v2: - fix bug where of_parse_phandle_with_args() could behave like _count_. - made of_gpio_named_count() into a static inline regardless of CONFIG_OF_GPIO Tested-by: Andreas Larsson <andreas@gaisler.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca> Cc: Linus Walleij <linus.walleij@linaro.org> Cc: Rob Herring <rob.herring@calxeda.com>
2013-02-11 06:57:21 +08:00
rc = of_count_phandle_with_args(np, "phandle-list-missing",
"#phandle-cells");
selftest(rc == -ENOENT, "expected:%i got:%i\n", -ENOENT, rc);
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-13 00:25:57 +08:00
/* Check for missing cells property */
rc = of_parse_phandle_with_args(np, "phandle-list",
"#phandle-cells-missing", 0, &args);
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-13 05:19:37 +08:00
selftest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
of: Create function for counting number of phandles in a property This patch creates of_count_phandle_with_args(), a new function for counting the number of phandle+argument tuples in a given property. This is better than the existing method of parsing each phandle individually until parsing fails which is a horribly slow way to do the count. Tested on ARM using the selftest code. v3: - Rebased on top of selftest code cleanup patch v2: - fix bug where of_parse_phandle_with_args() could behave like _count_. - made of_gpio_named_count() into a static inline regardless of CONFIG_OF_GPIO Tested-by: Andreas Larsson <andreas@gaisler.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca> Cc: Linus Walleij <linus.walleij@linaro.org> Cc: Rob Herring <rob.herring@calxeda.com>
2013-02-11 06:57:21 +08:00
rc = of_count_phandle_with_args(np, "phandle-list",
"#phandle-cells-missing");
selftest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-13 00:25:57 +08:00
/* Check for bad phandle in list */
rc = of_parse_phandle_with_args(np, "phandle-list-bad-phandle",
"#phandle-cells", 0, &args);
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-13 05:19:37 +08:00
selftest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
of: Create function for counting number of phandles in a property This patch creates of_count_phandle_with_args(), a new function for counting the number of phandle+argument tuples in a given property. This is better than the existing method of parsing each phandle individually until parsing fails which is a horribly slow way to do the count. Tested on ARM using the selftest code. v3: - Rebased on top of selftest code cleanup patch v2: - fix bug where of_parse_phandle_with_args() could behave like _count_. - made of_gpio_named_count() into a static inline regardless of CONFIG_OF_GPIO Tested-by: Andreas Larsson <andreas@gaisler.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca> Cc: Linus Walleij <linus.walleij@linaro.org> Cc: Rob Herring <rob.herring@calxeda.com>
2013-02-11 06:57:21 +08:00
rc = of_count_phandle_with_args(np, "phandle-list-bad-phandle",
"#phandle-cells");
selftest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-13 00:25:57 +08:00
/* Check for incorrectly formed argument list */
rc = of_parse_phandle_with_args(np, "phandle-list-bad-args",
"#phandle-cells", 1, &args);
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-13 05:19:37 +08:00
selftest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
of: Create function for counting number of phandles in a property This patch creates of_count_phandle_with_args(), a new function for counting the number of phandle+argument tuples in a given property. This is better than the existing method of parsing each phandle individually until parsing fails which is a horribly slow way to do the count. Tested on ARM using the selftest code. v3: - Rebased on top of selftest code cleanup patch v2: - fix bug where of_parse_phandle_with_args() could behave like _count_. - made of_gpio_named_count() into a static inline regardless of CONFIG_OF_GPIO Tested-by: Andreas Larsson <andreas@gaisler.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca> Cc: Linus Walleij <linus.walleij@linaro.org> Cc: Rob Herring <rob.herring@calxeda.com>
2013-02-11 06:57:21 +08:00
rc = of_count_phandle_with_args(np, "phandle-list-bad-args",
"#phandle-cells");
selftest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-13 00:25:57 +08:00
}
of: Add of_property_match_string() to find index into a string list Add a helper function for finding the index of a string in a string list property. This helper is useful for bindings that use a separate *-name property for attaching names to tuples in another property such as 'reg' or 'gpios'. Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-13 00:25:58 +08:00
static void __init of_selftest_property_match_string(void)
{
struct device_node *np;
int rc;
np = of_find_node_by_path("/testcase-data/phandle-tests/consumer-a");
if (!np) {
pr_err("No testcase data in device tree\n");
return;
}
rc = of_property_match_string(np, "phandle-list-names", "first");
selftest(rc == 0, "first expected:0 got:%i\n", rc);
rc = of_property_match_string(np, "phandle-list-names", "second");
selftest(rc == 1, "second expected:0 got:%i\n", rc);
rc = of_property_match_string(np, "phandle-list-names", "third");
selftest(rc == 2, "third expected:0 got:%i\n", rc);
rc = of_property_match_string(np, "phandle-list-names", "fourth");
selftest(rc == -ENODATA, "unmatched string; rc=%i", rc);
rc = of_property_match_string(np, "missing-property", "blah");
selftest(rc == -EINVAL, "missing property; rc=%i", rc);
rc = of_property_match_string(np, "empty-property", "blah");
selftest(rc == -ENODATA, "empty property; rc=%i", rc);
rc = of_property_match_string(np, "unterminated-string", "blah");
selftest(rc == -EILSEQ, "unterminated string; rc=%i", rc);
}
of: Add testcases for interrupt parsing This patch extends the DT selftest code with some test cases for the interrupt parsing functions. Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-10-12 05:04:23 +08:00
static void __init of_selftest_parse_interrupts(void)
{
struct device_node *np;
struct of_phandle_args args;
int i, rc;
np = of_find_node_by_path("/testcase-data/interrupts/interrupts0");
if (!np) {
pr_err("missing testcase data\n");
return;
}
for (i = 0; i < 4; i++) {
bool passed = true;
args.args_count = 0;
rc = of_irq_parse_one(np, i, &args);
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == (i + 1));
selftest(passed, "index %i - data error on node %s rc=%i\n",
i, args.np->full_name, rc);
}
of_node_put(np);
np = of_find_node_by_path("/testcase-data/interrupts/interrupts1");
if (!np) {
pr_err("missing testcase data\n");
return;
}
for (i = 0; i < 4; i++) {
bool passed = true;
args.args_count = 0;
rc = of_irq_parse_one(np, i, &args);
/* Test the values from tests-phandle.dtsi */
switch (i) {
case 0:
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == 9);
break;
case 1:
passed &= !rc;
passed &= (args.args_count == 3);
passed &= (args.args[0] == 10);
passed &= (args.args[1] == 11);
passed &= (args.args[2] == 12);
break;
case 2:
passed &= !rc;
passed &= (args.args_count == 2);
passed &= (args.args[0] == 13);
passed &= (args.args[1] == 14);
break;
case 3:
passed &= !rc;
passed &= (args.args_count == 2);
passed &= (args.args[0] == 15);
passed &= (args.args[1] == 16);
break;
default:
passed = false;
}
selftest(passed, "index %i - data error on node %s rc=%i\n",
i, args.np->full_name, rc);
}
of_node_put(np);
}
of/irq: create interrupts-extended property The standard interrupts property in device tree can only handle interrupts coming from a single interrupt parent. If a device is wired to multiple interrupt controllers, then it needs to be attached to a node with an interrupt-map property to demux the interrupt specifiers which is confusing. It would be a lot easier if there was a form of the interrupts property that allows for a separate interrupt phandle for each interrupt specifier. This patch does exactly that by creating a new interrupts-extended property which reuses the phandle+arguments pattern used by GPIOs and other core bindings. Signed-off-by: Grant Likely <grant.likely@linaro.org> Acked-by: Tony Lindgren <tony@atomide.com> Acked-by: Kumar Gala <galak@codeaurora.org> [grant.likely: removed versatile platform hunks into separate patch] Cc: Rob Herring <rob.herring@calxeda.com>
2013-09-20 05:47:37 +08:00
static void __init of_selftest_parse_interrupts_extended(void)
{
struct device_node *np;
struct of_phandle_args args;
int i, rc;
np = of_find_node_by_path("/testcase-data/interrupts/interrupts-extended0");
if (!np) {
pr_err("missing testcase data\n");
return;
}
for (i = 0; i < 7; i++) {
bool passed = true;
rc = of_irq_parse_one(np, i, &args);
/* Test the values from tests-phandle.dtsi */
switch (i) {
case 0:
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == 1);
break;
case 1:
passed &= !rc;
passed &= (args.args_count == 3);
passed &= (args.args[0] == 2);
passed &= (args.args[1] == 3);
passed &= (args.args[2] == 4);
break;
case 2:
passed &= !rc;
passed &= (args.args_count == 2);
passed &= (args.args[0] == 5);
passed &= (args.args[1] == 6);
break;
case 3:
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == 9);
break;
case 4:
passed &= !rc;
passed &= (args.args_count == 3);
passed &= (args.args[0] == 10);
passed &= (args.args[1] == 11);
passed &= (args.args[2] == 12);
break;
case 5:
passed &= !rc;
passed &= (args.args_count == 2);
passed &= (args.args[0] == 13);
passed &= (args.args[1] == 14);
break;
case 6:
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == 15);
break;
default:
passed = false;
}
selftest(passed, "index %i - data error on node %s rc=%i\n",
i, args.np->full_name, rc);
}
of_node_put(np);
}
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-13 00:25:57 +08:00
static int __init of_selftest(void)
{
struct device_node *np;
np = of_find_node_by_path("/testcase-data/phandle-tests/consumer-a");
if (!np) {
pr_info("No testcase data in device tree; not running tests\n");
return 0;
}
of_node_put(np);
pr_info("start of selftest - you will see error messages\n");
of_selftest_parse_phandle_with_args();
of: Add of_property_match_string() to find index into a string list Add a helper function for finding the index of a string in a string list property. This helper is useful for bindings that use a separate *-name property for attaching names to tuples in another property such as 'reg' or 'gpios'. Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-13 00:25:58 +08:00
of_selftest_property_match_string();
of: Add testcases for interrupt parsing This patch extends the DT selftest code with some test cases for the interrupt parsing functions. Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-10-12 05:04:23 +08:00
of_selftest_parse_interrupts();
of/irq: create interrupts-extended property The standard interrupts property in device tree can only handle interrupts coming from a single interrupt parent. If a device is wired to multiple interrupt controllers, then it needs to be attached to a node with an interrupt-map property to demux the interrupt specifiers which is confusing. It would be a lot easier if there was a form of the interrupts property that allows for a separate interrupt phandle for each interrupt specifier. This patch does exactly that by creating a new interrupts-extended property which reuses the phandle+arguments pattern used by GPIOs and other core bindings. Signed-off-by: Grant Likely <grant.likely@linaro.org> Acked-by: Tony Lindgren <tony@atomide.com> Acked-by: Kumar Gala <galak@codeaurora.org> [grant.likely: removed versatile platform hunks into separate patch] Cc: Rob Herring <rob.herring@calxeda.com>
2013-09-20 05:47:37 +08:00
of_selftest_parse_interrupts_extended();
of: Add testcases for interrupt parsing This patch extends the DT selftest code with some test cases for the interrupt parsing functions. Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-10-12 05:04:23 +08:00
pr_info("end of selftest - %i passed, %i failed\n",
selftest_results.passed, selftest_results.failed);
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-13 00:25:57 +08:00
return 0;
}
late_initcall(of_selftest);