2009-05-22 05:17:06 +08:00
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/*
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* Copyright (C) 2007-2009 ST-Ericsson AB
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* License terms: GNU General Public License (GPL) version 2
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2010-05-02 00:26:20 +08:00
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*
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* ABX500 core access functions.
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2012-08-10 16:32:35 +08:00
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* The abx500 interface is used for the Analog Baseband chips.
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2010-05-02 00:26:20 +08:00
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*
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* Author: Mattias Wallin <mattias.wallin@stericsson.com>
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* Author: Mattias Nilsson <mattias.i.nilsson@stericsson.com>
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* Author: Bengt Jonsson <bengt.g.jonsson@stericsson.com>
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* Author: Rickard Andersson <rickard.andersson@stericsson.com>
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2009-05-22 05:17:06 +08:00
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*/
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2009-09-09 17:31:00 +08:00
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#include <linux/regulator/machine.h>
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2009-05-22 05:17:06 +08:00
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2012-01-31 00:46:54 +08:00
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struct device;
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2010-05-02 00:26:20 +08:00
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#ifndef MFD_ABX500_H
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#define MFD_ABX500_H
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2009-05-22 05:17:06 +08:00
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2010-05-02 00:26:20 +08:00
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/**
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* struct abx500_init_setting
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* Initial value of the registers for driver to use during setup.
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*/
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struct abx500_init_settings {
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u8 bank;
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u8 reg;
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u8 setting;
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};
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2012-03-01 00:24:25 +08:00
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/* Battery driver related data */
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/*
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* ADC for the battery thermistor.
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* When using the ABx500_ADC_THERM_BATCTRL the battery ID resistor is combined
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* with a NTC resistor to both identify the battery and to measure its
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* temperature. Different phone manufactures uses different techniques to both
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* identify the battery and to read its temperature.
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*/
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enum abx500_adc_therm {
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ABx500_ADC_THERM_BATCTRL,
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ABx500_ADC_THERM_BATTEMP,
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};
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/**
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* struct abx500_res_to_temp - defines one point in a temp to res curve. To
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* be used in battery packs that combines the identification resistor with a
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* NTC resistor.
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* @temp: battery pack temperature in Celcius
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* @resist: NTC resistor net total resistance
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*/
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struct abx500_res_to_temp {
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int temp;
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int resist;
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};
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/**
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* struct abx500_v_to_cap - Table for translating voltage to capacity
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* @voltage: Voltage in mV
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* @capacity: Capacity in percent
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*/
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struct abx500_v_to_cap {
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int voltage;
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int capacity;
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};
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/* Forward declaration */
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struct abx500_fg;
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/**
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* struct abx500_fg_parameters - Fuel gauge algorithm parameters, in seconds
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* if not specified
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* @recovery_sleep_timer: Time between measurements while recovering
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* @recovery_total_time: Total recovery time
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* @init_timer: Measurement interval during startup
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* @init_discard_time: Time we discard voltage measurement at startup
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* @init_total_time: Total init time during startup
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* @high_curr_time: Time current has to be high to go to recovery
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* @accu_charging: FG accumulation time while charging
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* @accu_high_curr: FG accumulation time in high current mode
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* @high_curr_threshold: High current threshold, in mA
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* @lowbat_threshold: Low battery threshold, in mV
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* @overbat_threshold: Over battery threshold, in mV
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* @battok_falling_th_sel0 Threshold in mV for battOk signal sel0
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* Resolution in 50 mV step.
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* @battok_raising_th_sel1 Threshold in mV for battOk signal sel1
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* Resolution in 50 mV step.
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* @user_cap_limit Capacity reported from user must be within this
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* limit to be considered as sane, in percentage
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* points.
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* @maint_thres This is the threshold where we stop reporting
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* battery full while in maintenance, in per cent
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*/
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struct abx500_fg_parameters {
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int recovery_sleep_timer;
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int recovery_total_time;
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int init_timer;
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int init_discard_time;
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int init_total_time;
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int high_curr_time;
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int accu_charging;
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int accu_high_curr;
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int high_curr_threshold;
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int lowbat_threshold;
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int overbat_threshold;
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int battok_falling_th_sel0;
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int battok_raising_th_sel1;
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int user_cap_limit;
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int maint_thres;
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};
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/**
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* struct abx500_charger_maximization - struct used by the board config.
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* @use_maxi: Enable maximization for this battery type
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* @maxi_chg_curr: Maximum charger current allowed
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* @maxi_wait_cycles: cycles to wait before setting charger current
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* @charger_curr_step delta between two charger current settings (mA)
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*/
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struct abx500_maxim_parameters {
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bool ena_maxi;
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int chg_curr;
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int wait_cycles;
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int charger_curr_step;
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};
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/**
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* struct abx500_battery_type - different batteries supported
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* @name: battery technology
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* @resis_high: battery upper resistance limit
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* @resis_low: battery lower resistance limit
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* @charge_full_design: Maximum battery capacity in mAh
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* @nominal_voltage: Nominal voltage of the battery in mV
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* @termination_vol: max voltage upto which battery can be charged
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* @termination_curr battery charging termination current in mA
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2013-01-11 21:12:54 +08:00
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* @recharge_cap battery capacity limit that will trigger a new
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2012-03-01 00:24:25 +08:00
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* full charging cycle in the case where maintenan-
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* -ce charging has been disabled
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* @normal_cur_lvl: charger current in normal state in mA
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* @normal_vol_lvl: charger voltage in normal state in mV
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* @maint_a_cur_lvl: charger current in maintenance A state in mA
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* @maint_a_vol_lvl: charger voltage in maintenance A state in mV
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* @maint_a_chg_timer_h: charge time in maintenance A state
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* @maint_b_cur_lvl: charger current in maintenance B state in mA
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* @maint_b_vol_lvl: charger voltage in maintenance B state in mV
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* @maint_b_chg_timer_h: charge time in maintenance B state
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* @low_high_cur_lvl: charger current in temp low/high state in mA
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* @low_high_vol_lvl: charger voltage in temp low/high state in mV'
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* @battery_resistance: battery inner resistance in mOhm.
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* @n_r_t_tbl_elements: number of elements in r_to_t_tbl
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* @r_to_t_tbl: table containing resistance to temp points
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* @n_v_cap_tbl_elements: number of elements in v_to_cap_tbl
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* @v_to_cap_tbl: Voltage to capacity (in %) table
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* @n_batres_tbl_elements number of elements in the batres_tbl
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* @batres_tbl battery internal resistance vs temperature table
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*/
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struct abx500_battery_type {
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int name;
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int resis_high;
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int resis_low;
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int charge_full_design;
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int nominal_voltage;
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int termination_vol;
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int termination_curr;
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2013-01-11 21:12:54 +08:00
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int recharge_cap;
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2012-03-01 00:24:25 +08:00
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int normal_cur_lvl;
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int normal_vol_lvl;
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int maint_a_cur_lvl;
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int maint_a_vol_lvl;
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int maint_a_chg_timer_h;
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int maint_b_cur_lvl;
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int maint_b_vol_lvl;
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int maint_b_chg_timer_h;
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int low_high_cur_lvl;
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int low_high_vol_lvl;
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int battery_resistance;
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int n_temp_tbl_elements;
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struct abx500_res_to_temp *r_to_t_tbl;
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int n_v_cap_tbl_elements;
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struct abx500_v_to_cap *v_to_cap_tbl;
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int n_batres_tbl_elements;
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struct batres_vs_temp *batres_tbl;
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};
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/**
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* struct abx500_bm_capacity_levels - abx500 capacity level data
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* @critical: critical capacity level in percent
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* @low: low capacity level in percent
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* @normal: normal capacity level in percent
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* @high: high capacity level in percent
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* @full: full capacity level in percent
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*/
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struct abx500_bm_capacity_levels {
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int critical;
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int low;
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int normal;
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int high;
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int full;
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};
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/**
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* struct abx500_bm_charger_parameters - Charger specific parameters
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* @usb_volt_max: maximum allowed USB charger voltage in mV
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* @usb_curr_max: maximum allowed USB charger current in mA
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* @ac_volt_max: maximum allowed AC charger voltage in mV
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* @ac_curr_max: maximum allowed AC charger current in mA
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*/
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struct abx500_bm_charger_parameters {
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int usb_volt_max;
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int usb_curr_max;
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int ac_volt_max;
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int ac_curr_max;
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};
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/**
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* struct abx500_bm_data - abx500 battery management data
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* @temp_under under this temp, charging is stopped
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* @temp_low between this temp and temp_under charging is reduced
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* @temp_high between this temp and temp_over charging is reduced
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* @temp_over over this temp, charging is stopped
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* @temp_now present battery temperature
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* @temp_interval_chg temperature measurement interval in s when charging
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* @temp_interval_nochg temperature measurement interval in s when not charging
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* @main_safety_tmr_h safety timer for main charger
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* @usb_safety_tmr_h safety timer for usb charger
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* @bkup_bat_v voltage which we charge the backup battery with
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* @bkup_bat_i current which we charge the backup battery with
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* @no_maintenance indicates that maintenance charging is disabled
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2013-01-11 21:12:54 +08:00
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* @capacity_scaling indicates whether capacity scaling is to be used
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2012-03-01 00:24:25 +08:00
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* @abx500_adc_therm placement of thermistor, batctrl or battemp adc
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* @chg_unknown_bat flag to enable charging of unknown batteries
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* @enable_overshoot flag to enable VBAT overshoot control
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* @auto_trig flag to enable auto adc trigger
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* @fg_res resistance of FG resistor in 0.1mOhm
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* @n_btypes number of elements in array bat_type
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* @batt_id index of the identified battery in array bat_type
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* @interval_charging charge alg cycle period time when charging (sec)
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* @interval_not_charging charge alg cycle period time when not charging (sec)
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* @temp_hysteresis temperature hysteresis
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* @gnd_lift_resistance Battery ground to phone ground resistance (mOhm)
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* @maxi: maximization parameters
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* @cap_levels capacity in percent for the different capacity levels
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* @bat_type table of supported battery types
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* @chg_params charger parameters
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* @fg_params fuel gauge parameters
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*/
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struct abx500_bm_data {
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int temp_under;
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int temp_low;
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int temp_high;
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int temp_over;
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int temp_now;
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int temp_interval_chg;
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int temp_interval_nochg;
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int main_safety_tmr_h;
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int usb_safety_tmr_h;
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int bkup_bat_v;
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int bkup_bat_i;
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2013-01-18 00:08:42 +08:00
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bool autopower_cfg;
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bool ac_enabled;
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bool usb_enabled;
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2012-03-01 00:24:25 +08:00
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bool no_maintenance;
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2013-01-11 21:12:54 +08:00
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bool capacity_scaling;
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2012-03-01 00:24:25 +08:00
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bool chg_unknown_bat;
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bool enable_overshoot;
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bool auto_trig;
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enum abx500_adc_therm adc_therm;
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int fg_res;
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int n_btypes;
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int batt_id;
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int interval_charging;
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int interval_not_charging;
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int temp_hysteresis;
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int gnd_lift_resistance;
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const struct abx500_maxim_parameters *maxi;
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const struct abx500_bm_capacity_levels *cap_levels;
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2012-11-19 10:45:41 +08:00
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struct abx500_battery_type *bat_type;
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2012-03-01 00:24:25 +08:00
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const struct abx500_bm_charger_parameters *chg_params;
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const struct abx500_fg_parameters *fg_params;
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};
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2012-11-19 10:45:41 +08:00
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enum {
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NTC_EXTERNAL = 0,
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NTC_INTERNAL,
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2012-03-01 00:24:25 +08:00
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};
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2012-11-30 18:09:42 +08:00
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int ab8500_bm_of_probe(struct device *dev,
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struct device_node *np,
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2012-11-29 23:08:41 +08:00
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struct abx500_bm_data *bm);
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2012-03-01 00:24:25 +08:00
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2010-05-02 00:26:20 +08:00
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int abx500_set_register_interruptible(struct device *dev, u8 bank, u8 reg,
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u8 value);
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int abx500_get_register_interruptible(struct device *dev, u8 bank, u8 reg,
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u8 *value);
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int abx500_get_register_page_interruptible(struct device *dev, u8 bank,
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u8 first_reg, u8 *regvals, u8 numregs);
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int abx500_set_register_page_interruptible(struct device *dev, u8 bank,
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u8 first_reg, u8 *regvals, u8 numregs);
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/**
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* abx500_mask_and_set_register_inerruptible() - Modifies selected bits of a
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* target register
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*
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* @dev: The AB sub device.
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* @bank: The i2c bank number.
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* @bitmask: The bit mask to use.
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* @bitvalues: The new bit values.
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*
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* Updates the value of an AB register:
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* value -> ((value & ~bitmask) | (bitvalues & bitmask))
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*/
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int abx500_mask_and_set_register_interruptible(struct device *dev, u8 bank,
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u8 reg, u8 bitmask, u8 bitvalues);
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int abx500_get_chip_id(struct device *dev);
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int abx500_event_registers_startup_state_get(struct device *dev, u8 *event);
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int abx500_startup_irq_enabled(struct device *dev, unsigned int irq);
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2012-01-27 18:22:16 +08:00
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void abx500_dump_all_banks(void);
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2010-05-02 00:26:20 +08:00
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struct abx500_ops {
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int (*get_chip_id) (struct device *);
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int (*get_register) (struct device *, u8, u8, u8 *);
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int (*set_register) (struct device *, u8, u8, u8);
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int (*get_register_page) (struct device *, u8, u8, u8 *, u8);
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int (*set_register_page) (struct device *, u8, u8, u8 *, u8);
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int (*mask_and_set_register) (struct device *, u8, u8, u8, u8);
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int (*event_registers_startup_state_get) (struct device *, u8 *);
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int (*startup_irq_enabled) (struct device *, unsigned int);
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2012-01-27 18:22:16 +08:00
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void (*dump_all_banks) (struct device *);
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2010-05-02 00:26:20 +08:00
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};
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int abx500_register_ops(struct device *core_dev, struct abx500_ops *ops);
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2010-09-22 21:58:30 +08:00
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void abx500_remove_ops(struct device *dev);
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2009-05-22 05:17:06 +08:00
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#endif
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