OpenCloudOS-Kernel/drivers/of/unittest.c

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License cleanup: add SPDX GPL-2.0 license identifier to files with no license Many source files in the tree are missing licensing information, which makes it harder for compliance tools to determine the correct license. By default all files without license information are under the default license of the kernel, which is GPL version 2. Update the files which contain no license information with the 'GPL-2.0' SPDX license identifier. The SPDX identifier is a legally binding shorthand, which can be used instead of the full boiler plate text. This patch is based on work done by Thomas Gleixner and Kate Stewart and Philippe Ombredanne. How this work was done: Patches were generated and checked against linux-4.14-rc6 for a subset of the use cases: - file had no licensing information it it. - file was a */uapi/* one with no licensing information in it, - file was a */uapi/* one with existing licensing information, Further patches will be generated in subsequent months to fix up cases where non-standard license headers were used, and references to license had to be inferred by heuristics based on keywords. The analysis to determine which SPDX License Identifier to be applied to a file was done in a spreadsheet of side by side results from of the output of two independent scanners (ScanCode & Windriver) producing SPDX tag:value files created by Philippe Ombredanne. Philippe prepared the base worksheet, and did an initial spot review of a few 1000 files. The 4.13 kernel was the starting point of the analysis with 60,537 files assessed. Kate Stewart did a file by file comparison of the scanner results in the spreadsheet to determine which SPDX license identifier(s) to be applied to the file. She confirmed any determination that was not immediately clear with lawyers working with the Linux Foundation. Criteria used to select files for SPDX license identifier tagging was: - Files considered eligible had to be source code files. - Make and config files were included as candidates if they contained >5 lines of source - File already had some variant of a license header in it (even if <5 lines). All documentation files were explicitly excluded. The following heuristics were used to determine which SPDX license identifiers to apply. - when both scanners couldn't find any license traces, file was considered to have no license information in it, and the top level COPYING file license applied. For non */uapi/* files that summary was: SPDX license identifier # files ---------------------------------------------------|------- GPL-2.0 11139 and resulted in the first patch in this series. If that file was a */uapi/* path one, it was "GPL-2.0 WITH Linux-syscall-note" otherwise it was "GPL-2.0". Results of that was: SPDX license identifier # files ---------------------------------------------------|------- GPL-2.0 WITH Linux-syscall-note 930 and resulted in the second patch in this series. - if a file had some form of licensing information in it, and was one of the */uapi/* ones, it was denoted with the Linux-syscall-note if any GPL family license was found in the file or had no licensing in it (per prior point). Results summary: SPDX license identifier # files ---------------------------------------------------|------ GPL-2.0 WITH Linux-syscall-note 270 GPL-2.0+ WITH Linux-syscall-note 169 ((GPL-2.0 WITH Linux-syscall-note) OR BSD-2-Clause) 21 ((GPL-2.0 WITH Linux-syscall-note) OR BSD-3-Clause) 17 LGPL-2.1+ WITH Linux-syscall-note 15 GPL-1.0+ WITH Linux-syscall-note 14 ((GPL-2.0+ WITH Linux-syscall-note) OR BSD-3-Clause) 5 LGPL-2.0+ WITH Linux-syscall-note 4 LGPL-2.1 WITH Linux-syscall-note 3 ((GPL-2.0 WITH Linux-syscall-note) OR MIT) 3 ((GPL-2.0 WITH Linux-syscall-note) AND MIT) 1 and that resulted in the third patch in this series. - when the two scanners agreed on the detected license(s), that became the concluded license(s). - when there was disagreement between the two scanners (one detected a license but the other didn't, or they both detected different licenses) a manual inspection of the file occurred. - In most cases a manual inspection of the information in the file resulted in a clear resolution of the license that should apply (and which scanner probably needed to revisit its heuristics). - When it was not immediately clear, the license identifier was confirmed with lawyers working with the Linux Foundation. - If there was any question as to the appropriate license identifier, the file was flagged for further research and to be revisited later in time. In total, over 70 hours of logged manual review was done on the spreadsheet to determine the SPDX license identifiers to apply to the source files by Kate, Philippe, Thomas and, in some cases, confirmation by lawyers working with the Linux Foundation. Kate also obtained a third independent scan of the 4.13 code base from FOSSology, and compared selected files where the other two scanners disagreed against that SPDX file, to see if there was new insights. The Windriver scanner is based on an older version of FOSSology in part, so they are related. Thomas did random spot checks in about 500 files from the spreadsheets for the uapi headers and agreed with SPDX license identifier in the files he inspected. For the non-uapi files Thomas did random spot checks in about 15000 files. In initial set of patches against 4.14-rc6, 3 files were found to have copy/paste license identifier errors, and have been fixed to reflect the correct identifier. Additionally Philippe spent 10 hours this week doing a detailed manual inspection and review of the 12,461 patched files from the initial patch version early this week with: - a full scancode scan run, collecting the matched texts, detected license ids and scores - reviewing anything where there was a license detected (about 500+ files) to ensure that the applied SPDX license was correct - reviewing anything where there was no detection but the patch license was not GPL-2.0 WITH Linux-syscall-note to ensure that the applied SPDX license was correct This produced a worksheet with 20 files needing minor correction. This worksheet was then exported into 3 different .csv files for the different types of files to be modified. These .csv files were then reviewed by Greg. Thomas wrote a script to parse the csv files and add the proper SPDX tag to the file, in the format that the file expected. This script was further refined by Greg based on the output to detect more types of files automatically and to distinguish between header and source .c files (which need different comment types.) Finally Greg ran the script using the .csv files to generate the patches. Reviewed-by: Kate Stewart <kstewart@linuxfoundation.org> Reviewed-by: Philippe Ombredanne <pombredanne@nexb.com> Reviewed-by: Thomas Gleixner <tglx@linutronix.de> Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
2017-11-01 22:07:57 +08:00
// SPDX-License-Identifier: GPL-2.0
/*
* Self tests for device tree subsystem
*/
#define pr_fmt(fmt) "### dt-test ### " fmt
mm: remove include/linux/bootmem.h Move remaining definitions and declarations from include/linux/bootmem.h into include/linux/memblock.h and remove the redundant header. The includes were replaced with the semantic patch below and then semi-automated removal of duplicated '#include <linux/memblock.h> @@ @@ - #include <linux/bootmem.h> + #include <linux/memblock.h> [sfr@canb.auug.org.au: dma-direct: fix up for the removal of linux/bootmem.h] Link: http://lkml.kernel.org/r/20181002185342.133d1680@canb.auug.org.au [sfr@canb.auug.org.au: powerpc: fix up for removal of linux/bootmem.h] Link: http://lkml.kernel.org/r/20181005161406.73ef8727@canb.auug.org.au [sfr@canb.auug.org.au: x86/kaslr, ACPI/NUMA: fix for linux/bootmem.h removal] Link: http://lkml.kernel.org/r/20181008190341.5e396491@canb.auug.org.au Link: http://lkml.kernel.org/r/1536927045-23536-30-git-send-email-rppt@linux.vnet.ibm.com Signed-off-by: Mike Rapoport <rppt@linux.vnet.ibm.com> Signed-off-by: Stephen Rothwell <sfr@canb.auug.org.au> Acked-by: Michal Hocko <mhocko@suse.com> Cc: Catalin Marinas <catalin.marinas@arm.com> Cc: Chris Zankel <chris@zankel.net> Cc: "David S. Miller" <davem@davemloft.net> Cc: Geert Uytterhoeven <geert@linux-m68k.org> Cc: Greentime Hu <green.hu@gmail.com> Cc: Greg Kroah-Hartman <gregkh@linuxfoundation.org> Cc: Guan Xuetao <gxt@pku.edu.cn> Cc: Ingo Molnar <mingo@redhat.com> Cc: "James E.J. Bottomley" <jejb@parisc-linux.org> Cc: Jonas Bonn <jonas@southpole.se> Cc: Jonathan Corbet <corbet@lwn.net> Cc: Ley Foon Tan <lftan@altera.com> Cc: Mark Salter <msalter@redhat.com> Cc: Martin Schwidefsky <schwidefsky@de.ibm.com> Cc: Matt Turner <mattst88@gmail.com> Cc: Michael Ellerman <mpe@ellerman.id.au> Cc: Michal Simek <monstr@monstr.eu> Cc: Palmer Dabbelt <palmer@sifive.com> Cc: Paul Burton <paul.burton@mips.com> Cc: Richard Kuo <rkuo@codeaurora.org> Cc: Richard Weinberger <richard@nod.at> Cc: Rich Felker <dalias@libc.org> Cc: Russell King <linux@armlinux.org.uk> Cc: Serge Semin <fancer.lancer@gmail.com> Cc: Thomas Gleixner <tglx@linutronix.de> Cc: Tony Luck <tony.luck@intel.com> Cc: Vineet Gupta <vgupta@synopsys.com> Cc: Yoshinori Sato <ysato@users.sourceforge.jp> Signed-off-by: Andrew Morton <akpm@linux-foundation.org> Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
2018-10-31 06:09:49 +08:00
#include <linux/memblock.h>
#include <linux/clk.h>
#include <linux/dma-direct.h> /* to test phys_to_dma/dma_to_phys */
#include <linux/err.h>
#include <linux/errno.h>
#include <linux/hashtable.h>
#include <linux/libfdt.h>
#include <linux/of.h>
2019-09-21 02:28:53 +08:00
#include <linux/of_address.h>
#include <linux/of_fdt.h>
#include <linux/of_irq.h>
#include <linux/of_platform.h>
#include <linux/list.h>
#include <linux/mutex.h>
#include <linux/slab.h>
#include <linux/device.h>
#include <linux/platform_device.h>
#include <linux/kernel.h>
#include <linux/i2c.h>
#include <linux/i2c-mux.h>
#include <linux/gpio/driver.h>
#include <linux/bitops.h>
#include "of_private.h"
static struct unittest_results {
int passed;
int failed;
} unittest_results;
#define unittest(result, fmt, ...) ({ \
bool failed = !(result); \
if (failed) { \
unittest_results.failed++; \
pr_err("FAIL %s():%i " fmt, __func__, __LINE__, ##__VA_ARGS__); \
} else { \
unittest_results.passed++; \
pr_info("pass %s():%i\n", __func__, __LINE__); \
} \
failed; \
})
/*
* Expected message may have a message level other than KERN_INFO.
* Print the expected message only if the current loglevel will allow
* the actual message to print.
*
* Do not use EXPECT_BEGIN() or EXPECT_END() for messages generated by
* pr_debug().
*/
#define EXPECT_BEGIN(level, fmt, ...) \
printk(level pr_fmt("EXPECT \\ : ") fmt, ##__VA_ARGS__)
#define EXPECT_END(level, fmt, ...) \
printk(level pr_fmt("EXPECT / : ") fmt, ##__VA_ARGS__)
static void __init of_unittest_find_node_by_name(void)
{
struct device_node *np;
const char *options, *name;
np = of_find_node_by_path("/testcase-data");
name = kasprintf(GFP_KERNEL, "%pOF", np);
unittest(np && !strcmp("/testcase-data", name),
"find /testcase-data failed\n");
of_node_put(np);
kfree(name);
/* Test if trailing '/' works */
np = of_find_node_by_path("/testcase-data/");
unittest(!np, "trailing '/' on /testcase-data/ should fail\n");
np = of_find_node_by_path("/testcase-data/phandle-tests/consumer-a");
name = kasprintf(GFP_KERNEL, "%pOF", np);
unittest(np && !strcmp("/testcase-data/phandle-tests/consumer-a", name),
"find /testcase-data/phandle-tests/consumer-a failed\n");
of_node_put(np);
kfree(name);
np = of_find_node_by_path("testcase-alias");
name = kasprintf(GFP_KERNEL, "%pOF", np);
unittest(np && !strcmp("/testcase-data", name),
"find testcase-alias failed\n");
of_node_put(np);
kfree(name);
/* Test if trailing '/' works on aliases */
np = of_find_node_by_path("testcase-alias/");
unittest(!np, "trailing '/' on testcase-alias/ should fail\n");
np = of_find_node_by_path("testcase-alias/phandle-tests/consumer-a");
name = kasprintf(GFP_KERNEL, "%pOF", np);
unittest(np && !strcmp("/testcase-data/phandle-tests/consumer-a", name),
"find testcase-alias/phandle-tests/consumer-a failed\n");
of_node_put(np);
kfree(name);
np = of_find_node_by_path("/testcase-data/missing-path");
unittest(!np, "non-existent path returned node %pOF\n", np);
of_node_put(np);
np = of_find_node_by_path("missing-alias");
unittest(!np, "non-existent alias returned node %pOF\n", np);
of_node_put(np);
np = of_find_node_by_path("testcase-alias/missing-path");
unittest(!np, "non-existent alias with relative path returned node %pOF\n", np);
of_node_put(np);
np = of_find_node_opts_by_path("/testcase-data:testoption", &options);
unittest(np && !strcmp("testoption", options),
"option path test failed\n");
of_node_put(np);
np = of_find_node_opts_by_path("/testcase-data:test/option", &options);
unittest(np && !strcmp("test/option", options),
"option path test, subcase #1 failed\n");
of_node_put(np);
np = of_find_node_opts_by_path("/testcase-data/testcase-device1:test/option", &options);
unittest(np && !strcmp("test/option", options),
"option path test, subcase #2 failed\n");
of_node_put(np);
np = of_find_node_opts_by_path("/testcase-data:testoption", NULL);
unittest(np, "NULL option path test failed\n");
of_node_put(np);
np = of_find_node_opts_by_path("testcase-alias:testaliasoption",
&options);
unittest(np && !strcmp("testaliasoption", options),
"option alias path test failed\n");
of_node_put(np);
np = of_find_node_opts_by_path("testcase-alias:test/alias/option",
&options);
unittest(np && !strcmp("test/alias/option", options),
"option alias path test, subcase #1 failed\n");
of_node_put(np);
np = of_find_node_opts_by_path("testcase-alias:testaliasoption", NULL);
unittest(np, "NULL option alias path test failed\n");
of_node_put(np);
options = "testoption";
np = of_find_node_opts_by_path("testcase-alias", &options);
unittest(np && !options, "option clearing test failed\n");
of_node_put(np);
options = "testoption";
np = of_find_node_opts_by_path("/", &options);
unittest(np && !options, "option clearing root node test failed\n");
of_node_put(np);
}
static void __init of_unittest_dynamic(void)
{
struct device_node *np;
struct property *prop;
np = of_find_node_by_path("/testcase-data");
if (!np) {
pr_err("missing testcase data\n");
return;
}
/* Array of 4 properties for the purpose of testing */
treewide: kzalloc() -> kcalloc() The kzalloc() function has a 2-factor argument form, kcalloc(). This patch replaces cases of: kzalloc(a * b, gfp) with: kcalloc(a * b, gfp) as well as handling cases of: kzalloc(a * b * c, gfp) with: kzalloc(array3_size(a, b, c), gfp) as it's slightly less ugly than: kzalloc_array(array_size(a, b), c, gfp) This does, however, attempt to ignore constant size factors like: kzalloc(4 * 1024, gfp) though any constants defined via macros get caught up in the conversion. Any factors with a sizeof() of "unsigned char", "char", and "u8" were dropped, since they're redundant. The Coccinelle script used for this was: // Fix redundant parens around sizeof(). @@ type TYPE; expression THING, E; @@ ( kzalloc( - (sizeof(TYPE)) * E + sizeof(TYPE) * E , ...) | kzalloc( - (sizeof(THING)) * E + sizeof(THING) * E , ...) ) // Drop single-byte sizes and redundant parens. @@ expression COUNT; typedef u8; typedef __u8; @@ ( kzalloc( - sizeof(u8) * (COUNT) + COUNT , ...) | kzalloc( - sizeof(__u8) * (COUNT) + COUNT , ...) | kzalloc( - sizeof(char) * (COUNT) + COUNT , ...) | kzalloc( - sizeof(unsigned char) * (COUNT) + COUNT , ...) | kzalloc( - sizeof(u8) * COUNT + COUNT , ...) | kzalloc( - sizeof(__u8) * COUNT + COUNT , ...) | kzalloc( - sizeof(char) * COUNT + COUNT , ...) | kzalloc( - sizeof(unsigned char) * COUNT + COUNT , ...) ) // 2-factor product with sizeof(type/expression) and identifier or constant. @@ type TYPE; expression THING; identifier COUNT_ID; constant COUNT_CONST; @@ ( - kzalloc + kcalloc ( - sizeof(TYPE) * (COUNT_ID) + COUNT_ID, sizeof(TYPE) , ...) | - kzalloc + kcalloc ( - sizeof(TYPE) * COUNT_ID + COUNT_ID, sizeof(TYPE) , ...) | - kzalloc + kcalloc ( - sizeof(TYPE) * (COUNT_CONST) + COUNT_CONST, sizeof(TYPE) , ...) | - kzalloc + kcalloc ( - sizeof(TYPE) * COUNT_CONST + COUNT_CONST, sizeof(TYPE) , ...) | - kzalloc + kcalloc ( - sizeof(THING) * (COUNT_ID) + COUNT_ID, sizeof(THING) , ...) | - kzalloc + kcalloc ( - sizeof(THING) * COUNT_ID + COUNT_ID, sizeof(THING) , ...) | - kzalloc + kcalloc ( - sizeof(THING) * (COUNT_CONST) + COUNT_CONST, sizeof(THING) , ...) | - kzalloc + kcalloc ( - sizeof(THING) * COUNT_CONST + COUNT_CONST, sizeof(THING) , ...) ) // 2-factor product, only identifiers. @@ identifier SIZE, COUNT; @@ - kzalloc + kcalloc ( - SIZE * COUNT + COUNT, SIZE , ...) // 3-factor product with 1 sizeof(type) or sizeof(expression), with // redundant parens removed. @@ expression THING; identifier STRIDE, COUNT; type TYPE; @@ ( kzalloc( - sizeof(TYPE) * (COUNT) * (STRIDE) + array3_size(COUNT, STRIDE, sizeof(TYPE)) , ...) | kzalloc( - sizeof(TYPE) * (COUNT) * STRIDE + array3_size(COUNT, STRIDE, sizeof(TYPE)) , ...) | kzalloc( - sizeof(TYPE) * COUNT * (STRIDE) + array3_size(COUNT, STRIDE, sizeof(TYPE)) , ...) | kzalloc( - sizeof(TYPE) * COUNT * STRIDE + array3_size(COUNT, STRIDE, sizeof(TYPE)) , ...) | kzalloc( - sizeof(THING) * (COUNT) * (STRIDE) + array3_size(COUNT, STRIDE, sizeof(THING)) , ...) | kzalloc( - sizeof(THING) * (COUNT) * STRIDE + array3_size(COUNT, STRIDE, sizeof(THING)) , ...) | kzalloc( - sizeof(THING) * COUNT * (STRIDE) + array3_size(COUNT, STRIDE, sizeof(THING)) , ...) | kzalloc( - sizeof(THING) * COUNT * STRIDE + array3_size(COUNT, STRIDE, sizeof(THING)) , ...) ) // 3-factor product with 2 sizeof(variable), with redundant parens removed. @@ expression THING1, THING2; identifier COUNT; type TYPE1, TYPE2; @@ ( kzalloc( - sizeof(TYPE1) * sizeof(TYPE2) * COUNT + array3_size(COUNT, sizeof(TYPE1), sizeof(TYPE2)) , ...) | kzalloc( - sizeof(TYPE1) * sizeof(THING2) * (COUNT) + array3_size(COUNT, sizeof(TYPE1), sizeof(TYPE2)) , ...) | kzalloc( - sizeof(THING1) * sizeof(THING2) * COUNT + array3_size(COUNT, sizeof(THING1), sizeof(THING2)) , ...) | kzalloc( - sizeof(THING1) * sizeof(THING2) * (COUNT) + array3_size(COUNT, sizeof(THING1), sizeof(THING2)) , ...) | kzalloc( - sizeof(TYPE1) * sizeof(THING2) * COUNT + array3_size(COUNT, sizeof(TYPE1), sizeof(THING2)) , ...) | kzalloc( - sizeof(TYPE1) * sizeof(THING2) * (COUNT) + array3_size(COUNT, sizeof(TYPE1), sizeof(THING2)) , ...) ) // 3-factor product, only identifiers, with redundant parens removed. @@ identifier STRIDE, SIZE, COUNT; @@ ( kzalloc( - (COUNT) * STRIDE * SIZE + array3_size(COUNT, STRIDE, SIZE) , ...) | kzalloc( - COUNT * (STRIDE) * SIZE + array3_size(COUNT, STRIDE, SIZE) , ...) | kzalloc( - COUNT * STRIDE * (SIZE) + array3_size(COUNT, STRIDE, SIZE) , ...) | kzalloc( - (COUNT) * (STRIDE) * SIZE + array3_size(COUNT, STRIDE, SIZE) , ...) | kzalloc( - COUNT * (STRIDE) * (SIZE) + array3_size(COUNT, STRIDE, SIZE) , ...) | kzalloc( - (COUNT) * STRIDE * (SIZE) + array3_size(COUNT, STRIDE, SIZE) , ...) | kzalloc( - (COUNT) * (STRIDE) * (SIZE) + array3_size(COUNT, STRIDE, SIZE) , ...) | kzalloc( - COUNT * STRIDE * SIZE + array3_size(COUNT, STRIDE, SIZE) , ...) ) // Any remaining multi-factor products, first at least 3-factor products, // when they're not all constants... @@ expression E1, E2, E3; constant C1, C2, C3; @@ ( kzalloc(C1 * C2 * C3, ...) | kzalloc( - (E1) * E2 * E3 + array3_size(E1, E2, E3) , ...) | kzalloc( - (E1) * (E2) * E3 + array3_size(E1, E2, E3) , ...) | kzalloc( - (E1) * (E2) * (E3) + array3_size(E1, E2, E3) , ...) | kzalloc( - E1 * E2 * E3 + array3_size(E1, E2, E3) , ...) ) // And then all remaining 2 factors products when they're not all constants, // keeping sizeof() as the second factor argument. @@ expression THING, E1, E2; type TYPE; constant C1, C2, C3; @@ ( kzalloc(sizeof(THING) * C2, ...) | kzalloc(sizeof(TYPE) * C2, ...) | kzalloc(C1 * C2 * C3, ...) | kzalloc(C1 * C2, ...) | - kzalloc + kcalloc ( - sizeof(TYPE) * (E2) + E2, sizeof(TYPE) , ...) | - kzalloc + kcalloc ( - sizeof(TYPE) * E2 + E2, sizeof(TYPE) , ...) | - kzalloc + kcalloc ( - sizeof(THING) * (E2) + E2, sizeof(THING) , ...) | - kzalloc + kcalloc ( - sizeof(THING) * E2 + E2, sizeof(THING) , ...) | - kzalloc + kcalloc ( - (E1) * E2 + E1, E2 , ...) | - kzalloc + kcalloc ( - (E1) * (E2) + E1, E2 , ...) | - kzalloc + kcalloc ( - E1 * E2 + E1, E2 , ...) ) Signed-off-by: Kees Cook <keescook@chromium.org>
2018-06-13 05:03:40 +08:00
prop = kcalloc(4, sizeof(*prop), GFP_KERNEL);
if (!prop) {
unittest(0, "kzalloc() failed\n");
return;
}
/* Add a new property - should pass*/
prop->name = "new-property";
prop->value = "new-property-data";
prop->length = strlen(prop->value) + 1;
unittest(of_add_property(np, prop) == 0, "Adding a new property failed\n");
/* Try to add an existing property - should fail */
prop++;
prop->name = "new-property";
prop->value = "new-property-data-should-fail";
prop->length = strlen(prop->value) + 1;
unittest(of_add_property(np, prop) != 0,
"Adding an existing property should have failed\n");
/* Try to modify an existing property - should pass */
prop->value = "modify-property-data-should-pass";
prop->length = strlen(prop->value) + 1;
unittest(of_update_property(np, prop) == 0,
"Updating an existing property should have passed\n");
/* Try to modify non-existent property - should pass*/
prop++;
prop->name = "modify-property";
prop->value = "modify-missing-property-data-should-pass";
prop->length = strlen(prop->value) + 1;
unittest(of_update_property(np, prop) == 0,
"Updating a missing property should have passed\n");
/* Remove property - should pass */
unittest(of_remove_property(np, prop) == 0,
"Removing a property should have passed\n");
/* Adding very large property - should pass */
prop++;
prop->name = "large-property-PAGE_SIZEx8";
prop->length = PAGE_SIZE * 8;
prop->value = kzalloc(prop->length, GFP_KERNEL);
unittest(prop->value != NULL, "Unable to allocate large buffer\n");
if (prop->value)
unittest(of_add_property(np, prop) == 0,
"Adding a large property should have passed\n");
}
static int __init of_unittest_check_node_linkage(struct device_node *np)
{
struct device_node *child;
int count = 0, rc;
for_each_child_of_node(np, child) {
if (child->parent != np) {
pr_err("Child node %pOFn links to wrong parent %pOFn\n",
child, np);
rc = -EINVAL;
goto put_child;
}
rc = of_unittest_check_node_linkage(child);
if (rc < 0)
goto put_child;
count += rc;
}
return count + 1;
put_child:
of_node_put(child);
return rc;
}
static void __init of_unittest_check_tree_linkage(void)
{
struct device_node *np;
int allnode_count = 0, child_count;
if (!of_root)
return;
for_each_of_allnodes(np)
allnode_count++;
child_count = of_unittest_check_node_linkage(of_root);
unittest(child_count > 0, "Device node data structure is corrupted\n");
unittest(child_count == allnode_count,
"allnodes list size (%i) doesn't match sibling lists size (%i)\n",
allnode_count, child_count);
pr_debug("allnodes list size (%i); sibling lists size (%i)\n", allnode_count, child_count);
}
static void __init of_unittest_printf_one(struct device_node *np, const char *fmt,
const char *expected)
{
unsigned char *buf;
int buf_size;
int size, i;
buf_size = strlen(expected) + 10;
buf = kmalloc(buf_size, GFP_KERNEL);
if (!buf)
return;
/* Baseline; check conversion with a large size limit */
memset(buf, 0xff, buf_size);
size = snprintf(buf, buf_size - 2, fmt, np);
/* use strcmp() instead of strncmp() here to be absolutely sure strings match */
unittest((strcmp(buf, expected) == 0) && (buf[size+1] == 0xff),
"sprintf failed; fmt='%s' expected='%s' rslt='%s'\n",
fmt, expected, buf);
/* Make sure length limits work */
size++;
for (i = 0; i < 2; i++, size--) {
/* Clear the buffer, and make sure it works correctly still */
memset(buf, 0xff, buf_size);
snprintf(buf, size+1, fmt, np);
unittest(strncmp(buf, expected, size) == 0 && (buf[size+1] == 0xff),
"snprintf failed; size=%i fmt='%s' expected='%s' rslt='%s'\n",
size, fmt, expected, buf);
}
kfree(buf);
}
static void __init of_unittest_printf(void)
{
struct device_node *np;
const char *full_name = "/testcase-data/platform-tests/test-device@1/dev@100";
char phandle_str[16] = "";
np = of_find_node_by_path(full_name);
if (!np) {
unittest(np, "testcase data missing\n");
return;
}
num_to_str(phandle_str, sizeof(phandle_str), np->phandle, 0);
of_unittest_printf_one(np, "%pOF", full_name);
of_unittest_printf_one(np, "%pOFf", full_name);
of_unittest_printf_one(np, "%pOFn", "dev");
of_unittest_printf_one(np, "%2pOFn", "dev");
of_unittest_printf_one(np, "%5pOFn", " dev");
of_unittest_printf_one(np, "%pOFnc", "dev:test-sub-device");
of_unittest_printf_one(np, "%pOFp", phandle_str);
of_unittest_printf_one(np, "%pOFP", "dev@100");
of_unittest_printf_one(np, "ABC %pOFP ABC", "ABC dev@100 ABC");
of_unittest_printf_one(np, "%10pOFP", " dev@100");
of_unittest_printf_one(np, "%-10pOFP", "dev@100 ");
of_unittest_printf_one(of_root, "%pOFP", "/");
of_unittest_printf_one(np, "%pOFF", "----");
of_unittest_printf_one(np, "%pOFPF", "dev@100:----");
of_unittest_printf_one(np, "%pOFPFPc", "dev@100:----:dev@100:test-sub-device");
of_unittest_printf_one(np, "%pOFc", "test-sub-device");
of_unittest_printf_one(np, "%pOFC",
"\"test-sub-device\",\"test-compat2\",\"test-compat3\"");
}
struct node_hash {
struct hlist_node node;
struct device_node *np;
};
static DEFINE_HASHTABLE(phandle_ht, 8);
static void __init of_unittest_check_phandles(void)
{
struct device_node *np;
struct node_hash *nh;
struct hlist_node *tmp;
int i, dup_count = 0, phandle_count = 0;
for_each_of_allnodes(np) {
if (!np->phandle)
continue;
hash_for_each_possible(phandle_ht, nh, node, np->phandle) {
if (nh->np->phandle == np->phandle) {
pr_info("Duplicate phandle! %i used by %pOF and %pOF\n",
np->phandle, nh->np, np);
dup_count++;
break;
}
}
nh = kzalloc(sizeof(*nh), GFP_KERNEL);
if (!nh)
return;
nh->np = np;
hash_add(phandle_ht, &nh->node, np->phandle);
phandle_count++;
}
unittest(dup_count == 0, "Found %i duplicates in %i phandles\n",
dup_count, phandle_count);
/* Clean up */
hash_for_each_safe(phandle_ht, i, tmp, nh, node) {
hash_del(&nh->node);
kfree(nh);
}
}
static void __init of_unittest_parse_phandle_with_args(void)
{
struct device_node *np;
struct of_phandle_args args;
int i, rc;
np = of_find_node_by_path("/testcase-data/phandle-tests/consumer-a");
if (!np) {
pr_err("missing testcase data\n");
return;
}
rc = of_count_phandle_with_args(np, "phandle-list", "#phandle-cells");
unittest(rc == 7, "of_count_phandle_with_args() returned %i, expected 7\n", rc);
for (i = 0; i < 8; i++) {
bool passed = true;
memset(&args, 0, sizeof(args));
rc = of_parse_phandle_with_args(np, "phandle-list",
"#phandle-cells", i, &args);
/* Test the values from tests-phandle.dtsi */
switch (i) {
case 0:
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == (i + 1));
break;
case 1:
passed &= !rc;
passed &= (args.args_count == 2);
passed &= (args.args[0] == (i + 1));
passed &= (args.args[1] == 0);
break;
case 2:
passed &= (rc == -ENOENT);
break;
case 3:
passed &= !rc;
passed &= (args.args_count == 3);
passed &= (args.args[0] == (i + 1));
passed &= (args.args[1] == 4);
passed &= (args.args[2] == 3);
break;
case 4:
passed &= !rc;
passed &= (args.args_count == 2);
passed &= (args.args[0] == (i + 1));
passed &= (args.args[1] == 100);
break;
case 5:
passed &= !rc;
passed &= (args.args_count == 0);
break;
case 6:
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == (i + 1));
break;
case 7:
passed &= (rc == -ENOENT);
break;
default:
passed = false;
}
unittest(passed, "index %i - data error on node %pOF rc=%i\n",
i, args.np, rc);
}
/* Check for missing list property */
memset(&args, 0, sizeof(args));
rc = of_parse_phandle_with_args(np, "phandle-list-missing",
"#phandle-cells", 0, &args);
unittest(rc == -ENOENT, "expected:%i got:%i\n", -ENOENT, rc);
rc = of_count_phandle_with_args(np, "phandle-list-missing",
"#phandle-cells");
unittest(rc == -ENOENT, "expected:%i got:%i\n", -ENOENT, rc);
/* Check for missing cells property */
memset(&args, 0, sizeof(args));
EXPECT_BEGIN(KERN_INFO,
"OF: /testcase-data/phandle-tests/consumer-a: could not get #phandle-cells-missing for /testcase-data/phandle-tests/provider1");
rc = of_parse_phandle_with_args(np, "phandle-list",
"#phandle-cells-missing", 0, &args);
EXPECT_END(KERN_INFO,
"OF: /testcase-data/phandle-tests/consumer-a: could not get #phandle-cells-missing for /testcase-data/phandle-tests/provider1");
unittest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
EXPECT_BEGIN(KERN_INFO,
"OF: /testcase-data/phandle-tests/consumer-a: could not get #phandle-cells-missing for /testcase-data/phandle-tests/provider1");
rc = of_count_phandle_with_args(np, "phandle-list",
"#phandle-cells-missing");
EXPECT_END(KERN_INFO,
"OF: /testcase-data/phandle-tests/consumer-a: could not get #phandle-cells-missing for /testcase-data/phandle-tests/provider1");
unittest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
/* Check for bad phandle in list */
memset(&args, 0, sizeof(args));
EXPECT_BEGIN(KERN_INFO,
"OF: /testcase-data/phandle-tests/consumer-a: could not find phandle");
rc = of_parse_phandle_with_args(np, "phandle-list-bad-phandle",
"#phandle-cells", 0, &args);
EXPECT_END(KERN_INFO,
"OF: /testcase-data/phandle-tests/consumer-a: could not find phandle");
unittest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
EXPECT_BEGIN(KERN_INFO,
"OF: /testcase-data/phandle-tests/consumer-a: could not find phandle");
rc = of_count_phandle_with_args(np, "phandle-list-bad-phandle",
"#phandle-cells");
EXPECT_END(KERN_INFO,
"OF: /testcase-data/phandle-tests/consumer-a: could not find phandle");
unittest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
/* Check for incorrectly formed argument list */
memset(&args, 0, sizeof(args));
EXPECT_BEGIN(KERN_INFO,
of: unittest: update text of expected warnings The text of various warning messages triggered by unittest has changed. Update the text of expected warnings to match. The expected vs actual warnings are most easily seen by filtering the boot console messages with the of_unittest_expect program at https://github.com/frowand/dt_tools.git. The filter prefixes problem lines with '***', and prefixes lines that match expected errors with 'ok '. All other lines are prefixed with ' '. Unrelated lines have been deleted in the following examples. The mismatch appears as: -> ### dt-test ### start of unittest - you will see error messages OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found -1 OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found -1 OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found -1 platform testcase-data:testcase-device2: error -ENXIO: IRQ index 0 not found ** of_unittest_expect WARNING - not found ---> platform testcase-data:testcase-device2: IRQ index 0 not found -> ### dt-test ### end of unittest - 254 passed, 0 failed ** EXPECT statistics: ** ** EXPECT found : 42 ** EXPECT not found : 4 With this commit applied, the mismatch is resolved: -> ### dt-test ### start of unittest - you will see error messages ok OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ok OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ok OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found 1 ok platform testcase-data:testcase-device2: error -ENXIO: IRQ index 0 not found -> ### dt-test ### end of unittest - 254 passed, 0 failed ** EXPECT statistics: ** ** EXPECT found : 46 ** EXPECT not found : 0 Fixes: 2043727c2882 ("driver core: platform: Make use of the helper function dev_err_probe()") Fixes: 94a4950a4acf ("of: base: Fix phandle argument length mismatch error message") Signed-off-by: Frank Rowand <frank.rowand@sony.com> Signed-off-by: Rob Herring <robh@kernel.org> Link: https://lore.kernel.org/r/20220127192643.2534941-1-frowand.list@gmail.com
2022-01-28 03:26:43 +08:00
"OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1");
rc = of_parse_phandle_with_args(np, "phandle-list-bad-args",
"#phandle-cells", 1, &args);
EXPECT_END(KERN_INFO,
of: unittest: update text of expected warnings The text of various warning messages triggered by unittest has changed. Update the text of expected warnings to match. The expected vs actual warnings are most easily seen by filtering the boot console messages with the of_unittest_expect program at https://github.com/frowand/dt_tools.git. The filter prefixes problem lines with '***', and prefixes lines that match expected errors with 'ok '. All other lines are prefixed with ' '. Unrelated lines have been deleted in the following examples. The mismatch appears as: -> ### dt-test ### start of unittest - you will see error messages OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found -1 OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found -1 OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found -1 platform testcase-data:testcase-device2: error -ENXIO: IRQ index 0 not found ** of_unittest_expect WARNING - not found ---> platform testcase-data:testcase-device2: IRQ index 0 not found -> ### dt-test ### end of unittest - 254 passed, 0 failed ** EXPECT statistics: ** ** EXPECT found : 42 ** EXPECT not found : 4 With this commit applied, the mismatch is resolved: -> ### dt-test ### start of unittest - you will see error messages ok OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ok OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ok OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found 1 ok platform testcase-data:testcase-device2: error -ENXIO: IRQ index 0 not found -> ### dt-test ### end of unittest - 254 passed, 0 failed ** EXPECT statistics: ** ** EXPECT found : 46 ** EXPECT not found : 0 Fixes: 2043727c2882 ("driver core: platform: Make use of the helper function dev_err_probe()") Fixes: 94a4950a4acf ("of: base: Fix phandle argument length mismatch error message") Signed-off-by: Frank Rowand <frank.rowand@sony.com> Signed-off-by: Rob Herring <robh@kernel.org> Link: https://lore.kernel.org/r/20220127192643.2534941-1-frowand.list@gmail.com
2022-01-28 03:26:43 +08:00
"OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1");
unittest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
EXPECT_BEGIN(KERN_INFO,
of: unittest: update text of expected warnings The text of various warning messages triggered by unittest has changed. Update the text of expected warnings to match. The expected vs actual warnings are most easily seen by filtering the boot console messages with the of_unittest_expect program at https://github.com/frowand/dt_tools.git. The filter prefixes problem lines with '***', and prefixes lines that match expected errors with 'ok '. All other lines are prefixed with ' '. Unrelated lines have been deleted in the following examples. The mismatch appears as: -> ### dt-test ### start of unittest - you will see error messages OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found -1 OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found -1 OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found -1 platform testcase-data:testcase-device2: error -ENXIO: IRQ index 0 not found ** of_unittest_expect WARNING - not found ---> platform testcase-data:testcase-device2: IRQ index 0 not found -> ### dt-test ### end of unittest - 254 passed, 0 failed ** EXPECT statistics: ** ** EXPECT found : 42 ** EXPECT not found : 4 With this commit applied, the mismatch is resolved: -> ### dt-test ### start of unittest - you will see error messages ok OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ok OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ok OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found 1 ok platform testcase-data:testcase-device2: error -ENXIO: IRQ index 0 not found -> ### dt-test ### end of unittest - 254 passed, 0 failed ** EXPECT statistics: ** ** EXPECT found : 46 ** EXPECT not found : 0 Fixes: 2043727c2882 ("driver core: platform: Make use of the helper function dev_err_probe()") Fixes: 94a4950a4acf ("of: base: Fix phandle argument length mismatch error message") Signed-off-by: Frank Rowand <frank.rowand@sony.com> Signed-off-by: Rob Herring <robh@kernel.org> Link: https://lore.kernel.org/r/20220127192643.2534941-1-frowand.list@gmail.com
2022-01-28 03:26:43 +08:00
"OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1");
rc = of_count_phandle_with_args(np, "phandle-list-bad-args",
"#phandle-cells");
EXPECT_END(KERN_INFO,
of: unittest: update text of expected warnings The text of various warning messages triggered by unittest has changed. Update the text of expected warnings to match. The expected vs actual warnings are most easily seen by filtering the boot console messages with the of_unittest_expect program at https://github.com/frowand/dt_tools.git. The filter prefixes problem lines with '***', and prefixes lines that match expected errors with 'ok '. All other lines are prefixed with ' '. Unrelated lines have been deleted in the following examples. The mismatch appears as: -> ### dt-test ### start of unittest - you will see error messages OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found -1 OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found -1 OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found -1 platform testcase-data:testcase-device2: error -ENXIO: IRQ index 0 not found ** of_unittest_expect WARNING - not found ---> platform testcase-data:testcase-device2: IRQ index 0 not found -> ### dt-test ### end of unittest - 254 passed, 0 failed ** EXPECT statistics: ** ** EXPECT found : 42 ** EXPECT not found : 4 With this commit applied, the mismatch is resolved: -> ### dt-test ### start of unittest - you will see error messages ok OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ok OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ok OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found 1 ok platform testcase-data:testcase-device2: error -ENXIO: IRQ index 0 not found -> ### dt-test ### end of unittest - 254 passed, 0 failed ** EXPECT statistics: ** ** EXPECT found : 46 ** EXPECT not found : 0 Fixes: 2043727c2882 ("driver core: platform: Make use of the helper function dev_err_probe()") Fixes: 94a4950a4acf ("of: base: Fix phandle argument length mismatch error message") Signed-off-by: Frank Rowand <frank.rowand@sony.com> Signed-off-by: Rob Herring <robh@kernel.org> Link: https://lore.kernel.org/r/20220127192643.2534941-1-frowand.list@gmail.com
2022-01-28 03:26:43 +08:00
"OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1");
unittest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
}
static void __init of_unittest_parse_phandle_with_args_map(void)
{
struct device_node *np, *p0, *p1, *p2, *p3;
struct of_phandle_args args;
int i, rc;
np = of_find_node_by_path("/testcase-data/phandle-tests/consumer-b");
if (!np) {
pr_err("missing testcase data\n");
return;
}
p0 = of_find_node_by_path("/testcase-data/phandle-tests/provider0");
if (!p0) {
pr_err("missing testcase data\n");
return;
}
p1 = of_find_node_by_path("/testcase-data/phandle-tests/provider1");
if (!p1) {
pr_err("missing testcase data\n");
return;
}
p2 = of_find_node_by_path("/testcase-data/phandle-tests/provider2");
if (!p2) {
pr_err("missing testcase data\n");
return;
}
p3 = of_find_node_by_path("/testcase-data/phandle-tests/provider3");
if (!p3) {
pr_err("missing testcase data\n");
return;
}
rc = of_count_phandle_with_args(np, "phandle-list", "#phandle-cells");
unittest(rc == 7, "of_count_phandle_with_args() returned %i, expected 7\n", rc);
for (i = 0; i < 8; i++) {
bool passed = true;
memset(&args, 0, sizeof(args));
rc = of_parse_phandle_with_args_map(np, "phandle-list",
"phandle", i, &args);
/* Test the values from tests-phandle.dtsi */
switch (i) {
case 0:
passed &= !rc;
passed &= (args.np == p1);
passed &= (args.args_count == 1);
passed &= (args.args[0] == 1);
break;
case 1:
passed &= !rc;
passed &= (args.np == p3);
passed &= (args.args_count == 3);
passed &= (args.args[0] == 2);
passed &= (args.args[1] == 5);
passed &= (args.args[2] == 3);
break;
case 2:
passed &= (rc == -ENOENT);
break;
case 3:
passed &= !rc;
passed &= (args.np == p0);
passed &= (args.args_count == 0);
break;
case 4:
passed &= !rc;
passed &= (args.np == p1);
passed &= (args.args_count == 1);
passed &= (args.args[0] == 3);
break;
case 5:
passed &= !rc;
passed &= (args.np == p0);
passed &= (args.args_count == 0);
break;
case 6:
passed &= !rc;
passed &= (args.np == p2);
passed &= (args.args_count == 2);
passed &= (args.args[0] == 15);
passed &= (args.args[1] == 0x20);
break;
case 7:
passed &= (rc == -ENOENT);
break;
default:
passed = false;
}
unittest(passed, "index %i - data error on node %s rc=%i\n",
i, args.np->full_name, rc);
}
/* Check for missing list property */
memset(&args, 0, sizeof(args));
rc = of_parse_phandle_with_args_map(np, "phandle-list-missing",
"phandle", 0, &args);
unittest(rc == -ENOENT, "expected:%i got:%i\n", -ENOENT, rc);
/* Check for missing cells,map,mask property */
memset(&args, 0, sizeof(args));
EXPECT_BEGIN(KERN_INFO,
"OF: /testcase-data/phandle-tests/consumer-b: could not get #phandle-missing-cells for /testcase-data/phandle-tests/provider1");
rc = of_parse_phandle_with_args_map(np, "phandle-list",
"phandle-missing", 0, &args);
EXPECT_END(KERN_INFO,
"OF: /testcase-data/phandle-tests/consumer-b: could not get #phandle-missing-cells for /testcase-data/phandle-tests/provider1");
unittest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
/* Check for bad phandle in list */
memset(&args, 0, sizeof(args));
EXPECT_BEGIN(KERN_INFO,
"OF: /testcase-data/phandle-tests/consumer-b: could not find phandle");
rc = of_parse_phandle_with_args_map(np, "phandle-list-bad-phandle",
"phandle", 0, &args);
EXPECT_END(KERN_INFO,
"OF: /testcase-data/phandle-tests/consumer-b: could not find phandle");
unittest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
/* Check for incorrectly formed argument list */
memset(&args, 0, sizeof(args));
EXPECT_BEGIN(KERN_INFO,
of: unittest: update text of expected warnings The text of various warning messages triggered by unittest has changed. Update the text of expected warnings to match. The expected vs actual warnings are most easily seen by filtering the boot console messages with the of_unittest_expect program at https://github.com/frowand/dt_tools.git. The filter prefixes problem lines with '***', and prefixes lines that match expected errors with 'ok '. All other lines are prefixed with ' '. Unrelated lines have been deleted in the following examples. The mismatch appears as: -> ### dt-test ### start of unittest - you will see error messages OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found -1 OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found -1 OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found -1 platform testcase-data:testcase-device2: error -ENXIO: IRQ index 0 not found ** of_unittest_expect WARNING - not found ---> platform testcase-data:testcase-device2: IRQ index 0 not found -> ### dt-test ### end of unittest - 254 passed, 0 failed ** EXPECT statistics: ** ** EXPECT found : 42 ** EXPECT not found : 4 With this commit applied, the mismatch is resolved: -> ### dt-test ### start of unittest - you will see error messages ok OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ok OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ok OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found 1 ok platform testcase-data:testcase-device2: error -ENXIO: IRQ index 0 not found -> ### dt-test ### end of unittest - 254 passed, 0 failed ** EXPECT statistics: ** ** EXPECT found : 46 ** EXPECT not found : 0 Fixes: 2043727c2882 ("driver core: platform: Make use of the helper function dev_err_probe()") Fixes: 94a4950a4acf ("of: base: Fix phandle argument length mismatch error message") Signed-off-by: Frank Rowand <frank.rowand@sony.com> Signed-off-by: Rob Herring <robh@kernel.org> Link: https://lore.kernel.org/r/20220127192643.2534941-1-frowand.list@gmail.com
2022-01-28 03:26:43 +08:00
"OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found 1");
rc = of_parse_phandle_with_args_map(np, "phandle-list-bad-args",
"phandle", 1, &args);
EXPECT_END(KERN_INFO,
of: unittest: update text of expected warnings The text of various warning messages triggered by unittest has changed. Update the text of expected warnings to match. The expected vs actual warnings are most easily seen by filtering the boot console messages with the of_unittest_expect program at https://github.com/frowand/dt_tools.git. The filter prefixes problem lines with '***', and prefixes lines that match expected errors with 'ok '. All other lines are prefixed with ' '. Unrelated lines have been deleted in the following examples. The mismatch appears as: -> ### dt-test ### start of unittest - you will see error messages OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found -1 OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found -1 OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found -1 platform testcase-data:testcase-device2: error -ENXIO: IRQ index 0 not found ** of_unittest_expect WARNING - not found ---> platform testcase-data:testcase-device2: IRQ index 0 not found -> ### dt-test ### end of unittest - 254 passed, 0 failed ** EXPECT statistics: ** ** EXPECT found : 42 ** EXPECT not found : 4 With this commit applied, the mismatch is resolved: -> ### dt-test ### start of unittest - you will see error messages ok OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ok OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ok OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found 1 ok platform testcase-data:testcase-device2: error -ENXIO: IRQ index 0 not found -> ### dt-test ### end of unittest - 254 passed, 0 failed ** EXPECT statistics: ** ** EXPECT found : 46 ** EXPECT not found : 0 Fixes: 2043727c2882 ("driver core: platform: Make use of the helper function dev_err_probe()") Fixes: 94a4950a4acf ("of: base: Fix phandle argument length mismatch error message") Signed-off-by: Frank Rowand <frank.rowand@sony.com> Signed-off-by: Rob Herring <robh@kernel.org> Link: https://lore.kernel.org/r/20220127192643.2534941-1-frowand.list@gmail.com
2022-01-28 03:26:43 +08:00
"OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found 1");
unittest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
}
static void __init of_unittest_property_string(void)
{
const char *strings[4];
struct device_node *np;
int rc;
np = of_find_node_by_path("/testcase-data/phandle-tests/consumer-a");
if (!np) {
pr_err("No testcase data in device tree\n");
return;
}
rc = of_property_match_string(np, "phandle-list-names", "first");
unittest(rc == 0, "first expected:0 got:%i\n", rc);
rc = of_property_match_string(np, "phandle-list-names", "second");
unittest(rc == 1, "second expected:1 got:%i\n", rc);
rc = of_property_match_string(np, "phandle-list-names", "third");
unittest(rc == 2, "third expected:2 got:%i\n", rc);
rc = of_property_match_string(np, "phandle-list-names", "fourth");
unittest(rc == -ENODATA, "unmatched string; rc=%i\n", rc);
rc = of_property_match_string(np, "missing-property", "blah");
unittest(rc == -EINVAL, "missing property; rc=%i\n", rc);
rc = of_property_match_string(np, "empty-property", "blah");
unittest(rc == -ENODATA, "empty property; rc=%i\n", rc);
rc = of_property_match_string(np, "unterminated-string", "blah");
unittest(rc == -EILSEQ, "unterminated string; rc=%i\n", rc);
/* of_property_count_strings() tests */
rc = of_property_count_strings(np, "string-property");
unittest(rc == 1, "Incorrect string count; rc=%i\n", rc);
rc = of_property_count_strings(np, "phandle-list-names");
unittest(rc == 3, "Incorrect string count; rc=%i\n", rc);
rc = of_property_count_strings(np, "unterminated-string");
unittest(rc == -EILSEQ, "unterminated string; rc=%i\n", rc);
rc = of_property_count_strings(np, "unterminated-string-list");
unittest(rc == -EILSEQ, "unterminated string array; rc=%i\n", rc);
/* of_property_read_string_index() tests */
rc = of_property_read_string_index(np, "string-property", 0, strings);
unittest(rc == 0 && !strcmp(strings[0], "foobar"), "of_property_read_string_index() failure; rc=%i\n", rc);
strings[0] = NULL;
rc = of_property_read_string_index(np, "string-property", 1, strings);
unittest(rc == -ENODATA && strings[0] == NULL, "of_property_read_string_index() failure; rc=%i\n", rc);
rc = of_property_read_string_index(np, "phandle-list-names", 0, strings);
unittest(rc == 0 && !strcmp(strings[0], "first"), "of_property_read_string_index() failure; rc=%i\n", rc);
rc = of_property_read_string_index(np, "phandle-list-names", 1, strings);
unittest(rc == 0 && !strcmp(strings[0], "second"), "of_property_read_string_index() failure; rc=%i\n", rc);
rc = of_property_read_string_index(np, "phandle-list-names", 2, strings);
unittest(rc == 0 && !strcmp(strings[0], "third"), "of_property_read_string_index() failure; rc=%i\n", rc);
strings[0] = NULL;
rc = of_property_read_string_index(np, "phandle-list-names", 3, strings);
unittest(rc == -ENODATA && strings[0] == NULL, "of_property_read_string_index() failure; rc=%i\n", rc);
strings[0] = NULL;
rc = of_property_read_string_index(np, "unterminated-string", 0, strings);
unittest(rc == -EILSEQ && strings[0] == NULL, "of_property_read_string_index() failure; rc=%i\n", rc);
rc = of_property_read_string_index(np, "unterminated-string-list", 0, strings);
unittest(rc == 0 && !strcmp(strings[0], "first"), "of_property_read_string_index() failure; rc=%i\n", rc);
strings[0] = NULL;
rc = of_property_read_string_index(np, "unterminated-string-list", 2, strings); /* should fail */
unittest(rc == -EILSEQ && strings[0] == NULL, "of_property_read_string_index() failure; rc=%i\n", rc);
strings[1] = NULL;
/* of_property_read_string_array() tests */
rc = of_property_read_string_array(np, "string-property", strings, 4);
unittest(rc == 1, "Incorrect string count; rc=%i\n", rc);
rc = of_property_read_string_array(np, "phandle-list-names", strings, 4);
unittest(rc == 3, "Incorrect string count; rc=%i\n", rc);
rc = of_property_read_string_array(np, "unterminated-string", strings, 4);
unittest(rc == -EILSEQ, "unterminated string; rc=%i\n", rc);
/* -- An incorrectly formed string should cause a failure */
rc = of_property_read_string_array(np, "unterminated-string-list", strings, 4);
unittest(rc == -EILSEQ, "unterminated string array; rc=%i\n", rc);
/* -- parsing the correctly formed strings should still work: */
strings[2] = NULL;
rc = of_property_read_string_array(np, "unterminated-string-list", strings, 2);
unittest(rc == 2 && strings[2] == NULL, "of_property_read_string_array() failure; rc=%i\n", rc);
strings[1] = NULL;
rc = of_property_read_string_array(np, "phandle-list-names", strings, 1);
unittest(rc == 1 && strings[1] == NULL, "Overwrote end of string array; rc=%i, str='%s'\n", rc, strings[1]);
}
#define propcmp(p1, p2) (((p1)->length == (p2)->length) && \
(p1)->value && (p2)->value && \
!memcmp((p1)->value, (p2)->value, (p1)->length) && \
!strcmp((p1)->name, (p2)->name))
static void __init of_unittest_property_copy(void)
{
#ifdef CONFIG_OF_DYNAMIC
struct property p1 = { .name = "p1", .length = 0, .value = "" };
struct property p2 = { .name = "p2", .length = 5, .value = "abcd" };
struct property *new;
new = __of_prop_dup(&p1, GFP_KERNEL);
unittest(new && propcmp(&p1, new), "empty property didn't copy correctly\n");
kfree(new->value);
kfree(new->name);
kfree(new);
new = __of_prop_dup(&p2, GFP_KERNEL);
unittest(new && propcmp(&p2, new), "non-empty property didn't copy correctly\n");
kfree(new->value);
kfree(new->name);
kfree(new);
#endif
}
static void __init of_unittest_changeset(void)
{
#ifdef CONFIG_OF_DYNAMIC
struct property *ppadd, padd = { .name = "prop-add", .length = 1, .value = "" };
struct property *ppname_n1, pname_n1 = { .name = "name", .length = 3, .value = "n1" };
struct property *ppname_n2, pname_n2 = { .name = "name", .length = 3, .value = "n2" };
struct property *ppname_n21, pname_n21 = { .name = "name", .length = 3, .value = "n21" };
struct property *ppupdate, pupdate = { .name = "prop-update", .length = 5, .value = "abcd" };
struct property *ppremove;
struct device_node *n1, *n2, *n21, *nchangeset, *nremove, *parent, *np;
struct of_changeset chgset;
n1 = __of_node_dup(NULL, "n1");
unittest(n1, "testcase setup failure\n");
n2 = __of_node_dup(NULL, "n2");
unittest(n2, "testcase setup failure\n");
n21 = __of_node_dup(NULL, "n21");
unittest(n21, "testcase setup failure %p\n", n21);
nchangeset = of_find_node_by_path("/testcase-data/changeset");
nremove = of_get_child_by_name(nchangeset, "node-remove");
unittest(nremove, "testcase setup failure\n");
ppadd = __of_prop_dup(&padd, GFP_KERNEL);
unittest(ppadd, "testcase setup failure\n");
ppname_n1 = __of_prop_dup(&pname_n1, GFP_KERNEL);
unittest(ppname_n1, "testcase setup failure\n");
ppname_n2 = __of_prop_dup(&pname_n2, GFP_KERNEL);
unittest(ppname_n2, "testcase setup failure\n");
ppname_n21 = __of_prop_dup(&pname_n21, GFP_KERNEL);
unittest(ppname_n21, "testcase setup failure\n");
ppupdate = __of_prop_dup(&pupdate, GFP_KERNEL);
unittest(ppupdate, "testcase setup failure\n");
parent = nchangeset;
n1->parent = parent;
n2->parent = parent;
n21->parent = n2;
ppremove = of_find_property(parent, "prop-remove", NULL);
unittest(ppremove, "failed to find removal prop");
of_changeset_init(&chgset);
unittest(!of_changeset_attach_node(&chgset, n1), "fail attach n1\n");
unittest(!of_changeset_add_property(&chgset, n1, ppname_n1), "fail add prop name\n");
unittest(!of_changeset_attach_node(&chgset, n2), "fail attach n2\n");
unittest(!of_changeset_add_property(&chgset, n2, ppname_n2), "fail add prop name\n");
unittest(!of_changeset_detach_node(&chgset, nremove), "fail remove node\n");
unittest(!of_changeset_add_property(&chgset, n21, ppname_n21), "fail add prop name\n");
unittest(!of_changeset_attach_node(&chgset, n21), "fail attach n21\n");
unittest(!of_changeset_add_property(&chgset, parent, ppadd), "fail add prop prop-add\n");
unittest(!of_changeset_update_property(&chgset, parent, ppupdate), "fail update prop\n");
unittest(!of_changeset_remove_property(&chgset, parent, ppremove), "fail remove prop\n");
unittest(!of_changeset_apply(&chgset), "apply failed\n");
of_node_put(nchangeset);
/* Make sure node names are constructed correctly */
unittest((np = of_find_node_by_path("/testcase-data/changeset/n2/n21")),
"'%pOF' not added\n", n21);
of_node_put(np);
unittest(!of_changeset_revert(&chgset), "revert failed\n");
of_changeset_destroy(&chgset);
of_node_put(n1);
of_node_put(n2);
of_node_put(n21);
#endif
}
static void __init of_unittest_dma_get_max_cpu_address(void)
{
struct device_node *np;
phys_addr_t cpu_addr;
if (!IS_ENABLED(CONFIG_OF_ADDRESS))
return;
np = of_find_node_by_path("/testcase-data/address-tests");
if (!np) {
pr_err("missing testcase data\n");
return;
}
cpu_addr = of_dma_get_max_cpu_address(np);
unittest(cpu_addr == 0x4fffffff,
"of_dma_get_max_cpu_address: wrong CPU addr %pad (expecting %x)\n",
&cpu_addr, 0x4fffffff);
}
2019-09-21 02:28:53 +08:00
static void __init of_unittest_dma_ranges_one(const char *path,
u64 expect_dma_addr, u64 expect_paddr)
2019-09-21 02:28:53 +08:00
{
#ifdef CONFIG_HAS_DMA
2019-09-21 02:28:53 +08:00
struct device_node *np;
const struct bus_dma_region *map = NULL;
2019-09-21 02:28:53 +08:00
int rc;
np = of_find_node_by_path(path);
if (!np) {
pr_err("missing testcase data\n");
return;
}
rc = of_dma_get_range(np, &map);
2019-09-21 02:28:53 +08:00
unittest(!rc, "of_dma_get_range failed on node %pOF rc=%i\n", np, rc);
2019-09-21 02:28:53 +08:00
if (!rc) {
phys_addr_t paddr;
dma_addr_t dma_addr;
struct device *dev_bogus;
dev_bogus = kzalloc(sizeof(struct device), GFP_KERNEL);
if (!dev_bogus) {
unittest(0, "kzalloc() failed\n");
kfree(map);
return;
}
dev_bogus->dma_range_map = map;
paddr = dma_to_phys(dev_bogus, expect_dma_addr);
dma_addr = phys_to_dma(dev_bogus, expect_paddr);
2019-09-21 02:28:53 +08:00
unittest(paddr == expect_paddr,
"of_dma_get_range: wrong phys addr %pap (expecting %llx) on node %pOF\n",
&paddr, expect_paddr, np);
2019-09-21 02:28:53 +08:00
unittest(dma_addr == expect_dma_addr,
"of_dma_get_range: wrong DMA addr %pad (expecting %llx) on node %pOF\n",
&dma_addr, expect_dma_addr, np);
kfree(map);
kfree(dev_bogus);
2019-09-21 02:28:53 +08:00
}
of_node_put(np);
#endif
2019-09-21 02:28:53 +08:00
}
static void __init of_unittest_parse_dma_ranges(void)
{
of_unittest_dma_ranges_one("/testcase-data/address-tests/device@70000000",
0x0, 0x20000000);
if (IS_ENABLED(CONFIG_ARCH_DMA_ADDR_T_64BIT))
of_unittest_dma_ranges_one("/testcase-data/address-tests/bus@80000000/device@1000",
0x100000000, 0x20000000);
2019-09-21 02:28:53 +08:00
of_unittest_dma_ranges_one("/testcase-data/address-tests/pci@90000000",
0x80000000, 0x20000000);
2019-09-21 02:28:53 +08:00
}
static void __init of_unittest_pci_dma_ranges(void)
{
struct device_node *np;
struct of_pci_range range;
struct of_pci_range_parser parser;
int i = 0;
if (!IS_ENABLED(CONFIG_PCI))
return;
np = of_find_node_by_path("/testcase-data/address-tests/pci@90000000");
if (!np) {
pr_err("missing testcase data\n");
return;
}
if (of_pci_dma_range_parser_init(&parser, np)) {
pr_err("missing dma-ranges property\n");
return;
}
/*
* Get the dma-ranges from the device tree
*/
for_each_of_pci_range(&parser, &range) {
if (!i) {
unittest(range.size == 0x10000000,
"for_each_of_pci_range wrong size on node %pOF size=%llx\n",
np, range.size);
unittest(range.cpu_addr == 0x20000000,
"for_each_of_pci_range wrong CPU addr (%llx) on node %pOF",
range.cpu_addr, np);
unittest(range.pci_addr == 0x80000000,
"for_each_of_pci_range wrong DMA addr (%llx) on node %pOF",
range.pci_addr, np);
} else {
unittest(range.size == 0x10000000,
"for_each_of_pci_range wrong size on node %pOF size=%llx\n",
np, range.size);
unittest(range.cpu_addr == 0x40000000,
"for_each_of_pci_range wrong CPU addr (%llx) on node %pOF",
range.cpu_addr, np);
unittest(range.pci_addr == 0xc0000000,
"for_each_of_pci_range wrong DMA addr (%llx) on node %pOF",
range.pci_addr, np);
}
i++;
}
of_node_put(np);
}
static void __init of_unittest_parse_interrupts(void)
{
struct device_node *np;
struct of_phandle_args args;
int i, rc;
of: unittest: Disable interrupt node tests for old world MAC systems On systems with OF_IMAP_OLDWORLD_MAC set in of_irq_workarounds, the devicetree interrupt parsing code is different, causing unit tests of devicetree interrupt nodes to fail. Due to a bug in unittest code, which tries to dereference an uninitialized pointer, this results in a crash. OF: /testcase-data/phandle-tests/consumer-a: arguments longer than property Unable to handle kernel paging request for data at address 0x00bc616e Faulting instruction address: 0xc08e9468 Oops: Kernel access of bad area, sig: 11 [#1] BE PREEMPT PowerMac Modules linked in: CPU: 0 PID: 1 Comm: swapper Not tainted 4.14.72-rc1-yocto-standard+ #1 task: cf8e0000 task.stack: cf8da000 NIP: c08e9468 LR: c08ea5bc CTR: c08ea5ac REGS: cf8dbb50 TRAP: 0300 Not tainted (4.14.72-rc1-yocto-standard+) MSR: 00001032 <ME,IR,DR,RI> CR: 82004044 XER: 00000000 DAR: 00bc616e DSISR: 40000000 GPR00: c08ea5bc cf8dbc00 cf8e0000 c13ca517 c13ca517 c13ca8a0 00000066 00000002 GPR08: 00000063 00bc614e c0b05865 000affff 82004048 00000000 c00047f0 00000000 GPR16: c0a80000 c0a9cc34 c13ca517 c0ad1134 05ffffff 000affff c0b05860 c0abeef8 GPR24: cecec278 cecec278 c0a8c4d0 c0a885e0 c13ca8a0 05ffffff c13ca8a0 c13ca517 NIP [c08e9468] device_node_gen_full_name+0x30/0x15c LR [c08ea5bc] device_node_string+0x190/0x3c8 Call Trace: [cf8dbc00] [c007f670] trace_hardirqs_on_caller+0x118/0x1fc (unreliable) [cf8dbc40] [c08ea5bc] device_node_string+0x190/0x3c8 [cf8dbcb0] [c08eb794] pointer+0x25c/0x4d0 [cf8dbd00] [c08ebcbc] vsnprintf+0x2b4/0x5ec [cf8dbd60] [c08ec00c] vscnprintf+0x18/0x48 [cf8dbd70] [c008e268] vprintk_store+0x4c/0x22c [cf8dbda0] [c008ecac] vprintk_emit+0x94/0x130 [cf8dbdd0] [c008ff54] printk+0x5c/0x6c [cf8dbe10] [c0b8ddd4] of_unittest+0x2220/0x26f8 [cf8dbea0] [c0004434] do_one_initcall+0x4c/0x184 [cf8dbf00] [c0b4534c] kernel_init_freeable+0x13c/0x1d8 [cf8dbf30] [c0004814] kernel_init+0x24/0x118 [cf8dbf40] [c0013398] ret_from_kernel_thread+0x5c/0x64 The problem was observed when running a qemu test for the g3beige machine with devicetree unittests enabled. Disable interrupt node tests on affected systems to avoid both false unittest failures and the crash. With this patch in place, unittest on the affected system passes with the following message. dt-test ### end of unittest - 144 passed, 0 failed Fixes: 53a42093d96ef ("of: Add device tree selftests") Signed-off-by: Guenter Roeck <linux@roeck-us.net> Reviewed-by: Frank Rowand <frank.rowand@sony.com> Signed-off-by: Rob Herring <robh@kernel.org>
2018-09-26 12:06:24 +08:00
if (of_irq_workarounds & OF_IMAP_OLDWORLD_MAC)
return;
np = of_find_node_by_path("/testcase-data/interrupts/interrupts0");
if (!np) {
pr_err("missing testcase data\n");
return;
}
for (i = 0; i < 4; i++) {
bool passed = true;
memset(&args, 0, sizeof(args));
rc = of_irq_parse_one(np, i, &args);
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == (i + 1));
unittest(passed, "index %i - data error on node %pOF rc=%i\n",
i, args.np, rc);
}
of_node_put(np);
np = of_find_node_by_path("/testcase-data/interrupts/interrupts1");
if (!np) {
pr_err("missing testcase data\n");
return;
}
for (i = 0; i < 4; i++) {
bool passed = true;
memset(&args, 0, sizeof(args));
rc = of_irq_parse_one(np, i, &args);
/* Test the values from tests-phandle.dtsi */
switch (i) {
case 0:
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == 9);
break;
case 1:
passed &= !rc;
passed &= (args.args_count == 3);
passed &= (args.args[0] == 10);
passed &= (args.args[1] == 11);
passed &= (args.args[2] == 12);
break;
case 2:
passed &= !rc;
passed &= (args.args_count == 2);
passed &= (args.args[0] == 13);
passed &= (args.args[1] == 14);
break;
case 3:
passed &= !rc;
passed &= (args.args_count == 2);
passed &= (args.args[0] == 15);
passed &= (args.args[1] == 16);
break;
default:
passed = false;
}
unittest(passed, "index %i - data error on node %pOF rc=%i\n",
i, args.np, rc);
}
of_node_put(np);
}
static void __init of_unittest_parse_interrupts_extended(void)
{
struct device_node *np;
struct of_phandle_args args;
int i, rc;
of: unittest: Disable interrupt node tests for old world MAC systems On systems with OF_IMAP_OLDWORLD_MAC set in of_irq_workarounds, the devicetree interrupt parsing code is different, causing unit tests of devicetree interrupt nodes to fail. Due to a bug in unittest code, which tries to dereference an uninitialized pointer, this results in a crash. OF: /testcase-data/phandle-tests/consumer-a: arguments longer than property Unable to handle kernel paging request for data at address 0x00bc616e Faulting instruction address: 0xc08e9468 Oops: Kernel access of bad area, sig: 11 [#1] BE PREEMPT PowerMac Modules linked in: CPU: 0 PID: 1 Comm: swapper Not tainted 4.14.72-rc1-yocto-standard+ #1 task: cf8e0000 task.stack: cf8da000 NIP: c08e9468 LR: c08ea5bc CTR: c08ea5ac REGS: cf8dbb50 TRAP: 0300 Not tainted (4.14.72-rc1-yocto-standard+) MSR: 00001032 <ME,IR,DR,RI> CR: 82004044 XER: 00000000 DAR: 00bc616e DSISR: 40000000 GPR00: c08ea5bc cf8dbc00 cf8e0000 c13ca517 c13ca517 c13ca8a0 00000066 00000002 GPR08: 00000063 00bc614e c0b05865 000affff 82004048 00000000 c00047f0 00000000 GPR16: c0a80000 c0a9cc34 c13ca517 c0ad1134 05ffffff 000affff c0b05860 c0abeef8 GPR24: cecec278 cecec278 c0a8c4d0 c0a885e0 c13ca8a0 05ffffff c13ca8a0 c13ca517 NIP [c08e9468] device_node_gen_full_name+0x30/0x15c LR [c08ea5bc] device_node_string+0x190/0x3c8 Call Trace: [cf8dbc00] [c007f670] trace_hardirqs_on_caller+0x118/0x1fc (unreliable) [cf8dbc40] [c08ea5bc] device_node_string+0x190/0x3c8 [cf8dbcb0] [c08eb794] pointer+0x25c/0x4d0 [cf8dbd00] [c08ebcbc] vsnprintf+0x2b4/0x5ec [cf8dbd60] [c08ec00c] vscnprintf+0x18/0x48 [cf8dbd70] [c008e268] vprintk_store+0x4c/0x22c [cf8dbda0] [c008ecac] vprintk_emit+0x94/0x130 [cf8dbdd0] [c008ff54] printk+0x5c/0x6c [cf8dbe10] [c0b8ddd4] of_unittest+0x2220/0x26f8 [cf8dbea0] [c0004434] do_one_initcall+0x4c/0x184 [cf8dbf00] [c0b4534c] kernel_init_freeable+0x13c/0x1d8 [cf8dbf30] [c0004814] kernel_init+0x24/0x118 [cf8dbf40] [c0013398] ret_from_kernel_thread+0x5c/0x64 The problem was observed when running a qemu test for the g3beige machine with devicetree unittests enabled. Disable interrupt node tests on affected systems to avoid both false unittest failures and the crash. With this patch in place, unittest on the affected system passes with the following message. dt-test ### end of unittest - 144 passed, 0 failed Fixes: 53a42093d96ef ("of: Add device tree selftests") Signed-off-by: Guenter Roeck <linux@roeck-us.net> Reviewed-by: Frank Rowand <frank.rowand@sony.com> Signed-off-by: Rob Herring <robh@kernel.org>
2018-09-26 12:06:24 +08:00
if (of_irq_workarounds & OF_IMAP_OLDWORLD_MAC)
return;
np = of_find_node_by_path("/testcase-data/interrupts/interrupts-extended0");
if (!np) {
pr_err("missing testcase data\n");
return;
}
for (i = 0; i < 7; i++) {
bool passed = true;
memset(&args, 0, sizeof(args));
rc = of_irq_parse_one(np, i, &args);
/* Test the values from tests-phandle.dtsi */
switch (i) {
case 0:
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == 1);
break;
case 1:
passed &= !rc;
passed &= (args.args_count == 3);
passed &= (args.args[0] == 2);
passed &= (args.args[1] == 3);
passed &= (args.args[2] == 4);
break;
case 2:
passed &= !rc;
passed &= (args.args_count == 2);
passed &= (args.args[0] == 5);
passed &= (args.args[1] == 6);
break;
case 3:
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == 9);
break;
case 4:
passed &= !rc;
passed &= (args.args_count == 3);
passed &= (args.args[0] == 10);
passed &= (args.args[1] == 11);
passed &= (args.args[2] == 12);
break;
case 5:
passed &= !rc;
passed &= (args.args_count == 2);
passed &= (args.args[0] == 13);
passed &= (args.args[1] == 14);
break;
case 6:
/*
* Tests child node that is missing property
* #address-cells. See the comments in
* drivers/of/unittest-data/tests-interrupts.dtsi
* nodes intmap1 and interrupts-extended0
*/
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == 15);
break;
default:
passed = false;
}
unittest(passed, "index %i - data error on node %pOF rc=%i\n",
i, args.np, rc);
}
of_node_put(np);
}
static const struct of_device_id match_node_table[] = {
{ .data = "A", .name = "name0", }, /* Name alone is lowest priority */
{ .data = "B", .type = "type1", }, /* followed by type alone */
{ .data = "Ca", .name = "name2", .type = "type1", }, /* followed by both together */
{ .data = "Cb", .name = "name2", }, /* Only match when type doesn't match */
{ .data = "Cc", .name = "name2", .type = "type2", },
{ .data = "E", .compatible = "compat3" },
{ .data = "G", .compatible = "compat2", },
{ .data = "H", .compatible = "compat2", .name = "name5", },
{ .data = "I", .compatible = "compat2", .type = "type1", },
{ .data = "J", .compatible = "compat2", .type = "type1", .name = "name8", },
{ .data = "K", .compatible = "compat2", .name = "name9", },
{}
};
static struct {
const char *path;
const char *data;
} match_node_tests[] = {
{ .path = "/testcase-data/match-node/name0", .data = "A", },
{ .path = "/testcase-data/match-node/name1", .data = "B", },
{ .path = "/testcase-data/match-node/a/name2", .data = "Ca", },
{ .path = "/testcase-data/match-node/b/name2", .data = "Cb", },
{ .path = "/testcase-data/match-node/c/name2", .data = "Cc", },
{ .path = "/testcase-data/match-node/name3", .data = "E", },
{ .path = "/testcase-data/match-node/name4", .data = "G", },
{ .path = "/testcase-data/match-node/name5", .data = "H", },
{ .path = "/testcase-data/match-node/name6", .data = "G", },
{ .path = "/testcase-data/match-node/name7", .data = "I", },
{ .path = "/testcase-data/match-node/name8", .data = "J", },
{ .path = "/testcase-data/match-node/name9", .data = "K", },
};
static void __init of_unittest_match_node(void)
{
struct device_node *np;
const struct of_device_id *match;
int i;
for (i = 0; i < ARRAY_SIZE(match_node_tests); i++) {
np = of_find_node_by_path(match_node_tests[i].path);
if (!np) {
unittest(0, "missing testcase node %s\n",
match_node_tests[i].path);
continue;
}
match = of_match_node(match_node_table, np);
if (!match) {
unittest(0, "%s didn't match anything\n",
match_node_tests[i].path);
continue;
}
if (strcmp(match->data, match_node_tests[i].data) != 0) {
unittest(0, "%s got wrong match. expected %s, got %s\n",
match_node_tests[i].path, match_node_tests[i].data,
(const char *)match->data);
continue;
}
unittest(1, "passed");
}
}
static struct resource test_bus_res = DEFINE_RES_MEM(0xfffffff8, 2);
static const struct platform_device_info test_bus_info = {
.name = "unittest-bus",
};
static void __init of_unittest_platform_populate(void)
{
int irq, rc;
struct device_node *np, *child, *grandchild;
struct platform_device *pdev, *test_bus;
const struct of_device_id match[] = {
{ .compatible = "test-device", },
{}
};
np = of_find_node_by_path("/testcase-data");
of_platform_default_populate(np, NULL, NULL);
/* Test that a missing irq domain returns -EPROBE_DEFER */
np = of_find_node_by_path("/testcase-data/testcase-device1");
pdev = of_find_device_by_node(np);
unittest(pdev, "device 1 creation failed\n");
of: unittest: Disable interrupt node tests for old world MAC systems On systems with OF_IMAP_OLDWORLD_MAC set in of_irq_workarounds, the devicetree interrupt parsing code is different, causing unit tests of devicetree interrupt nodes to fail. Due to a bug in unittest code, which tries to dereference an uninitialized pointer, this results in a crash. OF: /testcase-data/phandle-tests/consumer-a: arguments longer than property Unable to handle kernel paging request for data at address 0x00bc616e Faulting instruction address: 0xc08e9468 Oops: Kernel access of bad area, sig: 11 [#1] BE PREEMPT PowerMac Modules linked in: CPU: 0 PID: 1 Comm: swapper Not tainted 4.14.72-rc1-yocto-standard+ #1 task: cf8e0000 task.stack: cf8da000 NIP: c08e9468 LR: c08ea5bc CTR: c08ea5ac REGS: cf8dbb50 TRAP: 0300 Not tainted (4.14.72-rc1-yocto-standard+) MSR: 00001032 <ME,IR,DR,RI> CR: 82004044 XER: 00000000 DAR: 00bc616e DSISR: 40000000 GPR00: c08ea5bc cf8dbc00 cf8e0000 c13ca517 c13ca517 c13ca8a0 00000066 00000002 GPR08: 00000063 00bc614e c0b05865 000affff 82004048 00000000 c00047f0 00000000 GPR16: c0a80000 c0a9cc34 c13ca517 c0ad1134 05ffffff 000affff c0b05860 c0abeef8 GPR24: cecec278 cecec278 c0a8c4d0 c0a885e0 c13ca8a0 05ffffff c13ca8a0 c13ca517 NIP [c08e9468] device_node_gen_full_name+0x30/0x15c LR [c08ea5bc] device_node_string+0x190/0x3c8 Call Trace: [cf8dbc00] [c007f670] trace_hardirqs_on_caller+0x118/0x1fc (unreliable) [cf8dbc40] [c08ea5bc] device_node_string+0x190/0x3c8 [cf8dbcb0] [c08eb794] pointer+0x25c/0x4d0 [cf8dbd00] [c08ebcbc] vsnprintf+0x2b4/0x5ec [cf8dbd60] [c08ec00c] vscnprintf+0x18/0x48 [cf8dbd70] [c008e268] vprintk_store+0x4c/0x22c [cf8dbda0] [c008ecac] vprintk_emit+0x94/0x130 [cf8dbdd0] [c008ff54] printk+0x5c/0x6c [cf8dbe10] [c0b8ddd4] of_unittest+0x2220/0x26f8 [cf8dbea0] [c0004434] do_one_initcall+0x4c/0x184 [cf8dbf00] [c0b4534c] kernel_init_freeable+0x13c/0x1d8 [cf8dbf30] [c0004814] kernel_init+0x24/0x118 [cf8dbf40] [c0013398] ret_from_kernel_thread+0x5c/0x64 The problem was observed when running a qemu test for the g3beige machine with devicetree unittests enabled. Disable interrupt node tests on affected systems to avoid both false unittest failures and the crash. With this patch in place, unittest on the affected system passes with the following message. dt-test ### end of unittest - 144 passed, 0 failed Fixes: 53a42093d96ef ("of: Add device tree selftests") Signed-off-by: Guenter Roeck <linux@roeck-us.net> Reviewed-by: Frank Rowand <frank.rowand@sony.com> Signed-off-by: Rob Herring <robh@kernel.org>
2018-09-26 12:06:24 +08:00
if (!(of_irq_workarounds & OF_IMAP_OLDWORLD_MAC)) {
irq = platform_get_irq(pdev, 0);
unittest(irq == -EPROBE_DEFER,
"device deferred probe failed - %d\n", irq);
/* Test that a parsing failure does not return -EPROBE_DEFER */
np = of_find_node_by_path("/testcase-data/testcase-device2");
pdev = of_find_device_by_node(np);
unittest(pdev, "device 2 creation failed\n");
EXPECT_BEGIN(KERN_INFO,
of: unittest: update text of expected warnings The text of various warning messages triggered by unittest has changed. Update the text of expected warnings to match. The expected vs actual warnings are most easily seen by filtering the boot console messages with the of_unittest_expect program at https://github.com/frowand/dt_tools.git. The filter prefixes problem lines with '***', and prefixes lines that match expected errors with 'ok '. All other lines are prefixed with ' '. Unrelated lines have been deleted in the following examples. The mismatch appears as: -> ### dt-test ### start of unittest - you will see error messages OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found -1 OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found -1 OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found -1 platform testcase-data:testcase-device2: error -ENXIO: IRQ index 0 not found ** of_unittest_expect WARNING - not found ---> platform testcase-data:testcase-device2: IRQ index 0 not found -> ### dt-test ### end of unittest - 254 passed, 0 failed ** EXPECT statistics: ** ** EXPECT found : 42 ** EXPECT not found : 4 With this commit applied, the mismatch is resolved: -> ### dt-test ### start of unittest - you will see error messages ok OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ok OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ok OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found 1 ok platform testcase-data:testcase-device2: error -ENXIO: IRQ index 0 not found -> ### dt-test ### end of unittest - 254 passed, 0 failed ** EXPECT statistics: ** ** EXPECT found : 46 ** EXPECT not found : 0 Fixes: 2043727c2882 ("driver core: platform: Make use of the helper function dev_err_probe()") Fixes: 94a4950a4acf ("of: base: Fix phandle argument length mismatch error message") Signed-off-by: Frank Rowand <frank.rowand@sony.com> Signed-off-by: Rob Herring <robh@kernel.org> Link: https://lore.kernel.org/r/20220127192643.2534941-1-frowand.list@gmail.com
2022-01-28 03:26:43 +08:00
"platform testcase-data:testcase-device2: error -ENXIO: IRQ index 0 not found");
of: unittest: Disable interrupt node tests for old world MAC systems On systems with OF_IMAP_OLDWORLD_MAC set in of_irq_workarounds, the devicetree interrupt parsing code is different, causing unit tests of devicetree interrupt nodes to fail. Due to a bug in unittest code, which tries to dereference an uninitialized pointer, this results in a crash. OF: /testcase-data/phandle-tests/consumer-a: arguments longer than property Unable to handle kernel paging request for data at address 0x00bc616e Faulting instruction address: 0xc08e9468 Oops: Kernel access of bad area, sig: 11 [#1] BE PREEMPT PowerMac Modules linked in: CPU: 0 PID: 1 Comm: swapper Not tainted 4.14.72-rc1-yocto-standard+ #1 task: cf8e0000 task.stack: cf8da000 NIP: c08e9468 LR: c08ea5bc CTR: c08ea5ac REGS: cf8dbb50 TRAP: 0300 Not tainted (4.14.72-rc1-yocto-standard+) MSR: 00001032 <ME,IR,DR,RI> CR: 82004044 XER: 00000000 DAR: 00bc616e DSISR: 40000000 GPR00: c08ea5bc cf8dbc00 cf8e0000 c13ca517 c13ca517 c13ca8a0 00000066 00000002 GPR08: 00000063 00bc614e c0b05865 000affff 82004048 00000000 c00047f0 00000000 GPR16: c0a80000 c0a9cc34 c13ca517 c0ad1134 05ffffff 000affff c0b05860 c0abeef8 GPR24: cecec278 cecec278 c0a8c4d0 c0a885e0 c13ca8a0 05ffffff c13ca8a0 c13ca517 NIP [c08e9468] device_node_gen_full_name+0x30/0x15c LR [c08ea5bc] device_node_string+0x190/0x3c8 Call Trace: [cf8dbc00] [c007f670] trace_hardirqs_on_caller+0x118/0x1fc (unreliable) [cf8dbc40] [c08ea5bc] device_node_string+0x190/0x3c8 [cf8dbcb0] [c08eb794] pointer+0x25c/0x4d0 [cf8dbd00] [c08ebcbc] vsnprintf+0x2b4/0x5ec [cf8dbd60] [c08ec00c] vscnprintf+0x18/0x48 [cf8dbd70] [c008e268] vprintk_store+0x4c/0x22c [cf8dbda0] [c008ecac] vprintk_emit+0x94/0x130 [cf8dbdd0] [c008ff54] printk+0x5c/0x6c [cf8dbe10] [c0b8ddd4] of_unittest+0x2220/0x26f8 [cf8dbea0] [c0004434] do_one_initcall+0x4c/0x184 [cf8dbf00] [c0b4534c] kernel_init_freeable+0x13c/0x1d8 [cf8dbf30] [c0004814] kernel_init+0x24/0x118 [cf8dbf40] [c0013398] ret_from_kernel_thread+0x5c/0x64 The problem was observed when running a qemu test for the g3beige machine with devicetree unittests enabled. Disable interrupt node tests on affected systems to avoid both false unittest failures and the crash. With this patch in place, unittest on the affected system passes with the following message. dt-test ### end of unittest - 144 passed, 0 failed Fixes: 53a42093d96ef ("of: Add device tree selftests") Signed-off-by: Guenter Roeck <linux@roeck-us.net> Reviewed-by: Frank Rowand <frank.rowand@sony.com> Signed-off-by: Rob Herring <robh@kernel.org>
2018-09-26 12:06:24 +08:00
irq = platform_get_irq(pdev, 0);
EXPECT_END(KERN_INFO,
of: unittest: update text of expected warnings The text of various warning messages triggered by unittest has changed. Update the text of expected warnings to match. The expected vs actual warnings are most easily seen by filtering the boot console messages with the of_unittest_expect program at https://github.com/frowand/dt_tools.git. The filter prefixes problem lines with '***', and prefixes lines that match expected errors with 'ok '. All other lines are prefixed with ' '. Unrelated lines have been deleted in the following examples. The mismatch appears as: -> ### dt-test ### start of unittest - you will see error messages OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found -1 OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found -1 OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found 1 ** of_unittest_expect WARNING - not found ---> OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found -1 platform testcase-data:testcase-device2: error -ENXIO: IRQ index 0 not found ** of_unittest_expect WARNING - not found ---> platform testcase-data:testcase-device2: IRQ index 0 not found -> ### dt-test ### end of unittest - 254 passed, 0 failed ** EXPECT statistics: ** ** EXPECT found : 42 ** EXPECT not found : 4 With this commit applied, the mismatch is resolved: -> ### dt-test ### start of unittest - you will see error messages ok OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ok OF: /testcase-data/phandle-tests/consumer-a: #phandle-cells = 3 found 1 ok OF: /testcase-data/phandle-tests/consumer-b: #phandle-cells = 2 found 1 ok platform testcase-data:testcase-device2: error -ENXIO: IRQ index 0 not found -> ### dt-test ### end of unittest - 254 passed, 0 failed ** EXPECT statistics: ** ** EXPECT found : 46 ** EXPECT not found : 0 Fixes: 2043727c2882 ("driver core: platform: Make use of the helper function dev_err_probe()") Fixes: 94a4950a4acf ("of: base: Fix phandle argument length mismatch error message") Signed-off-by: Frank Rowand <frank.rowand@sony.com> Signed-off-by: Rob Herring <robh@kernel.org> Link: https://lore.kernel.org/r/20220127192643.2534941-1-frowand.list@gmail.com
2022-01-28 03:26:43 +08:00
"platform testcase-data:testcase-device2: error -ENXIO: IRQ index 0 not found");
of: unittest: Disable interrupt node tests for old world MAC systems On systems with OF_IMAP_OLDWORLD_MAC set in of_irq_workarounds, the devicetree interrupt parsing code is different, causing unit tests of devicetree interrupt nodes to fail. Due to a bug in unittest code, which tries to dereference an uninitialized pointer, this results in a crash. OF: /testcase-data/phandle-tests/consumer-a: arguments longer than property Unable to handle kernel paging request for data at address 0x00bc616e Faulting instruction address: 0xc08e9468 Oops: Kernel access of bad area, sig: 11 [#1] BE PREEMPT PowerMac Modules linked in: CPU: 0 PID: 1 Comm: swapper Not tainted 4.14.72-rc1-yocto-standard+ #1 task: cf8e0000 task.stack: cf8da000 NIP: c08e9468 LR: c08ea5bc CTR: c08ea5ac REGS: cf8dbb50 TRAP: 0300 Not tainted (4.14.72-rc1-yocto-standard+) MSR: 00001032 <ME,IR,DR,RI> CR: 82004044 XER: 00000000 DAR: 00bc616e DSISR: 40000000 GPR00: c08ea5bc cf8dbc00 cf8e0000 c13ca517 c13ca517 c13ca8a0 00000066 00000002 GPR08: 00000063 00bc614e c0b05865 000affff 82004048 00000000 c00047f0 00000000 GPR16: c0a80000 c0a9cc34 c13ca517 c0ad1134 05ffffff 000affff c0b05860 c0abeef8 GPR24: cecec278 cecec278 c0a8c4d0 c0a885e0 c13ca8a0 05ffffff c13ca8a0 c13ca517 NIP [c08e9468] device_node_gen_full_name+0x30/0x15c LR [c08ea5bc] device_node_string+0x190/0x3c8 Call Trace: [cf8dbc00] [c007f670] trace_hardirqs_on_caller+0x118/0x1fc (unreliable) [cf8dbc40] [c08ea5bc] device_node_string+0x190/0x3c8 [cf8dbcb0] [c08eb794] pointer+0x25c/0x4d0 [cf8dbd00] [c08ebcbc] vsnprintf+0x2b4/0x5ec [cf8dbd60] [c08ec00c] vscnprintf+0x18/0x48 [cf8dbd70] [c008e268] vprintk_store+0x4c/0x22c [cf8dbda0] [c008ecac] vprintk_emit+0x94/0x130 [cf8dbdd0] [c008ff54] printk+0x5c/0x6c [cf8dbe10] [c0b8ddd4] of_unittest+0x2220/0x26f8 [cf8dbea0] [c0004434] do_one_initcall+0x4c/0x184 [cf8dbf00] [c0b4534c] kernel_init_freeable+0x13c/0x1d8 [cf8dbf30] [c0004814] kernel_init+0x24/0x118 [cf8dbf40] [c0013398] ret_from_kernel_thread+0x5c/0x64 The problem was observed when running a qemu test for the g3beige machine with devicetree unittests enabled. Disable interrupt node tests on affected systems to avoid both false unittest failures and the crash. With this patch in place, unittest on the affected system passes with the following message. dt-test ### end of unittest - 144 passed, 0 failed Fixes: 53a42093d96ef ("of: Add device tree selftests") Signed-off-by: Guenter Roeck <linux@roeck-us.net> Reviewed-by: Frank Rowand <frank.rowand@sony.com> Signed-off-by: Rob Herring <robh@kernel.org>
2018-09-26 12:06:24 +08:00
unittest(irq < 0 && irq != -EPROBE_DEFER,
"device parsing error failed - %d\n", irq);
}
np = of_find_node_by_path("/testcase-data/platform-tests");
unittest(np, "No testcase data in device tree\n");
if (!np)
return;
test_bus = platform_device_register_full(&test_bus_info);
rc = PTR_ERR_OR_ZERO(test_bus);
unittest(!rc, "testbus registration failed; rc=%i\n", rc);
if (rc) {
of_node_put(np);
return;
}
test_bus->dev.of_node = np;
/*
* Add a dummy resource to the test bus node after it is
* registered to catch problems with un-inserted resources. The
* DT code doesn't insert the resources, and it has caused the
* kernel to oops in the past. This makes sure the same bug
* doesn't crop up again.
*/
platform_device_add_resources(test_bus, &test_bus_res, 1);
of_platform_populate(np, match, NULL, &test_bus->dev);
for_each_child_of_node(np, child) {
for_each_child_of_node(child, grandchild) {
pdev = of_find_device_by_node(grandchild);
unittest(pdev,
"Could not create device for node '%pOFn'\n",
grandchild);
platform_device_put(pdev);
}
}
of_platform_depopulate(&test_bus->dev);
for_each_child_of_node(np, child) {
for_each_child_of_node(child, grandchild)
unittest(!of_find_device_by_node(grandchild),
"device didn't get destroyed '%pOFn'\n",
grandchild);
}
platform_device_unregister(test_bus);
of_node_put(np);
}
/**
* update_node_properties - adds the properties
* of np into dup node (present in live tree) and
* updates parent of children of np to dup.
*
* @np: node whose properties are being added to the live tree
* @dup: node present in live tree to be updated
*/
static void update_node_properties(struct device_node *np,
struct device_node *dup)
{
struct property *prop;
struct property *save_next;
struct device_node *child;
int ret;
for_each_child_of_node(np, child)
child->parent = dup;
/*
* "unittest internal error: unable to add testdata property"
*
* If this message reports a property in node '/__symbols__' then
* the respective unittest overlay contains a label that has the
* same name as a label in the live devicetree. The label will
* be in the live devicetree only if the devicetree source was
* compiled with the '-@' option. If you encounter this error,
* please consider renaming __all__ of the labels in the unittest
* overlay dts files with an odd prefix that is unlikely to be
* used in a real devicetree.
*/
/*
* open code for_each_property_of_node() because of_add_property()
* sets prop->next to NULL
*/
for (prop = np->properties; prop != NULL; prop = save_next) {
save_next = prop->next;
ret = of_add_property(dup, prop);
if (ret) {
if (ret == -EEXIST && !strcmp(prop->name, "name"))
continue;
pr_err("unittest internal error: unable to add testdata property %pOF/%s",
np, prop->name);
}
}
}
/**
* attach_node_and_children - attaches nodes
* and its children to live tree.
* CAUTION: misleading function name - if node @np already exists in
* the live tree then children of @np are *not* attached to the live
* tree. This works for the current test devicetree nodes because such
* nodes do not have child nodes.
*
* @np: Node to attach to live tree
*/
static void attach_node_and_children(struct device_node *np)
{
struct device_node *next, *dup, *child;
unsigned long flags;
const char *full_name;
full_name = kasprintf(GFP_KERNEL, "%pOF", np);
if (!strcmp(full_name, "/__local_fixups__") ||
!strcmp(full_name, "/__fixups__")) {
kfree(full_name);
return;
}
dup = of_find_node_by_path(full_name);
kfree(full_name);
if (dup) {
update_node_properties(np, dup);
return;
}
child = np->child;
np->child = NULL;
mutex_lock(&of_mutex);
raw_spin_lock_irqsave(&devtree_lock, flags);
np->sibling = np->parent->child;
np->parent->child = np;
of_node_clear_flag(np, OF_DETACHED);
raw_spin_unlock_irqrestore(&devtree_lock, flags);
__of_attach_node_sysfs(np);
mutex_unlock(&of_mutex);
while (child) {
next = child->sibling;
attach_node_and_children(child);
child = next;
}
}
/**
* unittest_data_add - Reads, copies data from
* linked tree and attaches it to the live tree
*/
static int __init unittest_data_add(void)
{
void *unittest_data;
void *unittest_data_align;
struct device_node *unittest_data_node = NULL, *np;
/*
* __dtb_testcases_begin[] and __dtb_testcases_end[] are magically
* created by cmd_dt_S_dtb in scripts/Makefile.lib
*/
extern uint8_t __dtb_testcases_begin[];
extern uint8_t __dtb_testcases_end[];
const int size = __dtb_testcases_end - __dtb_testcases_begin;
int rc;
void *ret;
if (!size) {
pr_warn("%s: testcases is empty\n", __func__);
return -ENODATA;
}
/* creating copy */
unittest_data = kmalloc(size + FDT_ALIGN_SIZE, GFP_KERNEL);
if (!unittest_data)
return -ENOMEM;
unittest_data_align = PTR_ALIGN(unittest_data, FDT_ALIGN_SIZE);
memcpy(unittest_data_align, __dtb_testcases_begin, size);
ret = of_fdt_unflatten_tree(unittest_data_align, NULL, &unittest_data_node);
if (!ret) {
pr_warn("%s: unflatten testcases tree failed\n", __func__);
kfree(unittest_data);
return -ENODATA;
}
if (!unittest_data_node) {
pr_warn("%s: testcases tree is empty\n", __func__);
kfree(unittest_data);
return -ENODATA;
}
/*
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
* This lock normally encloses of_resolve_phandles()
*/
of_overlay_mutex_lock();
rc = of_resolve_phandles(unittest_data_node);
if (rc) {
pr_err("%s: Failed to resolve phandles (rc=%i)\n", __func__, rc);
of_overlay_mutex_unlock();
return -EINVAL;
}
if (!of_root) {
of_root = unittest_data_node;
for_each_of_allnodes(np)
__of_attach_node_sysfs(np);
of_aliases = of_find_node_by_path("/aliases");
of_chosen = of_find_node_by_path("/chosen");
of_overlay_mutex_unlock();
return 0;
}
EXPECT_BEGIN(KERN_INFO,
"Duplicate name in testcase-data, renamed to \"duplicate-name#1\"");
/* attach the sub-tree to live tree */
np = unittest_data_node->child;
while (np) {
struct device_node *next = np->sibling;
np->parent = of_root;
attach_node_and_children(np);
np = next;
}
EXPECT_END(KERN_INFO,
"Duplicate name in testcase-data, renamed to \"duplicate-name#1\"");
of_overlay_mutex_unlock();
return 0;
}
#ifdef CONFIG_OF_OVERLAY
static int __init overlay_data_apply(const char *overlay_name, int *ovcs_id);
static int unittest_probe(struct platform_device *pdev)
{
struct device *dev = &pdev->dev;
struct device_node *np = dev->of_node;
if (np == NULL) {
dev_err(dev, "No OF data for device\n");
return -EINVAL;
}
dev_dbg(dev, "%s for node @%pOF\n", __func__, np);
of_platform_populate(np, NULL, NULL, &pdev->dev);
return 0;
}
static int unittest_remove(struct platform_device *pdev)
{
struct device *dev = &pdev->dev;
struct device_node *np = dev->of_node;
dev_dbg(dev, "%s for node @%pOF\n", __func__, np);
return 0;
}
static const struct of_device_id unittest_match[] = {
{ .compatible = "unittest", },
{},
};
static struct platform_driver unittest_driver = {
.probe = unittest_probe,
.remove = unittest_remove,
.driver = {
.name = "unittest",
.of_match_table = of_match_ptr(unittest_match),
},
};
/* get the platform device instantiated at the path */
static struct platform_device *of_path_to_platform_device(const char *path)
{
struct device_node *np;
struct platform_device *pdev;
np = of_find_node_by_path(path);
if (np == NULL)
return NULL;
pdev = of_find_device_by_node(np);
of_node_put(np);
return pdev;
}
/* find out if a platform device exists at that path */
static int of_path_platform_device_exists(const char *path)
{
struct platform_device *pdev;
pdev = of_path_to_platform_device(path);
platform_device_put(pdev);
return pdev != NULL;
}
#ifdef CONFIG_OF_GPIO
struct unittest_gpio_dev {
struct gpio_chip chip;
};
static int unittest_gpio_chip_request_count;
static int unittest_gpio_probe_count;
static int unittest_gpio_probe_pass_count;
static int unittest_gpio_chip_request(struct gpio_chip *chip, unsigned int offset)
{
unittest_gpio_chip_request_count++;
pr_debug("%s(): %s %d %d\n", __func__, chip->label, offset,
unittest_gpio_chip_request_count);
return 0;
}
static int unittest_gpio_probe(struct platform_device *pdev)
{
struct unittest_gpio_dev *devptr;
int ret;
unittest_gpio_probe_count++;
devptr = kzalloc(sizeof(*devptr), GFP_KERNEL);
if (!devptr)
return -ENOMEM;
platform_set_drvdata(pdev, devptr);
devptr->chip.fwnode = dev_fwnode(&pdev->dev);
devptr->chip.label = "of-unittest-gpio";
devptr->chip.base = -1; /* dynamic allocation */
devptr->chip.ngpio = 5;
devptr->chip.request = unittest_gpio_chip_request;
ret = gpiochip_add_data(&devptr->chip, NULL);
unittest(!ret,
"gpiochip_add_data() for node @%pfw failed, ret = %d\n", devptr->chip.fwnode, ret);
if (!ret)
unittest_gpio_probe_pass_count++;
return ret;
}
static int unittest_gpio_remove(struct platform_device *pdev)
{
struct unittest_gpio_dev *devptr = platform_get_drvdata(pdev);
struct device *dev = &pdev->dev;
dev_dbg(dev, "%s for node @%pfw\n", __func__, devptr->chip.fwnode);
if (!devptr)
return -EINVAL;
if (devptr->chip.base != -1)
gpiochip_remove(&devptr->chip);
platform_set_drvdata(pdev, NULL);
kfree(devptr);
return 0;
}
static const struct of_device_id unittest_gpio_id[] = {
{ .compatible = "unittest-gpio", },
{}
};
static struct platform_driver unittest_gpio_driver = {
.probe = unittest_gpio_probe,
.remove = unittest_gpio_remove,
.driver = {
.name = "unittest-gpio",
.of_match_table = of_match_ptr(unittest_gpio_id),
},
};
static void __init of_unittest_overlay_gpio(void)
{
int chip_request_count;
int probe_pass_count;
int ret;
/*
* tests: apply overlays before registering driver
* Similar to installing a driver as a module, the
* driver is registered after applying the overlays.
*
* The overlays are applied by overlay_data_apply()
* instead of of_unittest_apply_overlay() so that they
* will not be tracked. Thus they will not be removed
* by of_unittest_remove_tracked_overlays().
*
* - apply overlay_gpio_01
* - apply overlay_gpio_02a
* - apply overlay_gpio_02b
* - register driver
*
* register driver will result in
* - probe and processing gpio hog for overlay_gpio_01
* - probe for overlay_gpio_02a
* - processing gpio for overlay_gpio_02b
*/
probe_pass_count = unittest_gpio_probe_pass_count;
chip_request_count = unittest_gpio_chip_request_count;
/*
* overlay_gpio_01 contains gpio node and child gpio hog node
* overlay_gpio_02a contains gpio node
* overlay_gpio_02b contains child gpio hog node
*/
unittest(overlay_data_apply("overlay_gpio_01", NULL),
"Adding overlay 'overlay_gpio_01' failed\n");
unittest(overlay_data_apply("overlay_gpio_02a", NULL),
"Adding overlay 'overlay_gpio_02a' failed\n");
unittest(overlay_data_apply("overlay_gpio_02b", NULL),
"Adding overlay 'overlay_gpio_02b' failed\n");
/*
* messages are the result of the probes, after the
* driver is registered
*/
EXPECT_BEGIN(KERN_INFO,
"gpio-<<int>> (line-B-input): hogged as input\n");
EXPECT_BEGIN(KERN_INFO,
"gpio-<<int>> (line-A-input): hogged as input\n");
ret = platform_driver_register(&unittest_gpio_driver);
if (unittest(ret == 0, "could not register unittest gpio driver\n"))
return;
EXPECT_END(KERN_INFO,
"gpio-<<int>> (line-A-input): hogged as input\n");
EXPECT_END(KERN_INFO,
"gpio-<<int>> (line-B-input): hogged as input\n");
unittest(probe_pass_count + 2 == unittest_gpio_probe_pass_count,
"unittest_gpio_probe() failed or not called\n");
unittest(chip_request_count + 2 == unittest_gpio_chip_request_count,
"unittest_gpio_chip_request() called %d times (expected 1 time)\n",
unittest_gpio_chip_request_count - chip_request_count);
/*
* tests: apply overlays after registering driver
*
* Similar to a driver built-in to the kernel, the
* driver is registered before applying the overlays.
*
* overlay_gpio_03 contains gpio node and child gpio hog node
*
* - apply overlay_gpio_03
*
* apply overlay will result in
* - probe and processing gpio hog.
*/
probe_pass_count = unittest_gpio_probe_pass_count;
chip_request_count = unittest_gpio_chip_request_count;
EXPECT_BEGIN(KERN_INFO,
"gpio-<<int>> (line-D-input): hogged as input\n");
/* overlay_gpio_03 contains gpio node and child gpio hog node */
unittest(overlay_data_apply("overlay_gpio_03", NULL),
"Adding overlay 'overlay_gpio_03' failed\n");
EXPECT_END(KERN_INFO,
"gpio-<<int>> (line-D-input): hogged as input\n");
unittest(probe_pass_count + 1 == unittest_gpio_probe_pass_count,
"unittest_gpio_probe() failed or not called\n");
unittest(chip_request_count + 1 == unittest_gpio_chip_request_count,
"unittest_gpio_chip_request() called %d times (expected 1 time)\n",
unittest_gpio_chip_request_count - chip_request_count);
/*
* overlay_gpio_04a contains gpio node
*
* - apply overlay_gpio_04a
*
* apply the overlay will result in
* - probe for overlay_gpio_04a
*/
probe_pass_count = unittest_gpio_probe_pass_count;
chip_request_count = unittest_gpio_chip_request_count;
/* overlay_gpio_04a contains gpio node */
unittest(overlay_data_apply("overlay_gpio_04a", NULL),
"Adding overlay 'overlay_gpio_04a' failed\n");
unittest(probe_pass_count + 1 == unittest_gpio_probe_pass_count,
"unittest_gpio_probe() failed or not called\n");
/*
* overlay_gpio_04b contains child gpio hog node
*
* - apply overlay_gpio_04b
*
* apply the overlay will result in
* - processing gpio for overlay_gpio_04b
*/
EXPECT_BEGIN(KERN_INFO,
"gpio-<<int>> (line-C-input): hogged as input\n");
/* overlay_gpio_04b contains child gpio hog node */
unittest(overlay_data_apply("overlay_gpio_04b", NULL),
"Adding overlay 'overlay_gpio_04b' failed\n");
EXPECT_END(KERN_INFO,
"gpio-<<int>> (line-C-input): hogged as input\n");
unittest(chip_request_count + 1 == unittest_gpio_chip_request_count,
"unittest_gpio_chip_request() called %d times (expected 1 time)\n",
unittest_gpio_chip_request_count - chip_request_count);
}
#else
static void __init of_unittest_overlay_gpio(void)
{
/* skip tests */
}
#endif
#if IS_BUILTIN(CONFIG_I2C)
/* get the i2c client device instantiated at the path */
static struct i2c_client *of_path_to_i2c_client(const char *path)
{
struct device_node *np;
struct i2c_client *client;
np = of_find_node_by_path(path);
if (np == NULL)
return NULL;
client = of_find_i2c_device_by_node(np);
of_node_put(np);
return client;
}
/* find out if a i2c client device exists at that path */
static int of_path_i2c_client_exists(const char *path)
{
struct i2c_client *client;
client = of_path_to_i2c_client(path);
if (client)
put_device(&client->dev);
return client != NULL;
}
#else
static int of_path_i2c_client_exists(const char *path)
{
return 0;
}
#endif
enum overlay_type {
PDEV_OVERLAY,
I2C_OVERLAY
};
static int of_path_device_type_exists(const char *path,
enum overlay_type ovtype)
{
switch (ovtype) {
case PDEV_OVERLAY:
return of_path_platform_device_exists(path);
case I2C_OVERLAY:
return of_path_i2c_client_exists(path);
}
return 0;
}
static const char *unittest_path(int nr, enum overlay_type ovtype)
{
const char *base;
static char buf[256];
switch (ovtype) {
case PDEV_OVERLAY:
base = "/testcase-data/overlay-node/test-bus";
break;
case I2C_OVERLAY:
base = "/testcase-data/overlay-node/test-bus/i2c-test-bus";
break;
default:
buf[0] = '\0';
return buf;
}
snprintf(buf, sizeof(buf) - 1, "%s/test-unittest%d", base, nr);
buf[sizeof(buf) - 1] = '\0';
return buf;
}
static int of_unittest_device_exists(int unittest_nr, enum overlay_type ovtype)
{
const char *path;
path = unittest_path(unittest_nr, ovtype);
switch (ovtype) {
case PDEV_OVERLAY:
return of_path_platform_device_exists(path);
case I2C_OVERLAY:
return of_path_i2c_client_exists(path);
}
return 0;
}
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
static const char *overlay_name_from_nr(int nr)
{
static char buf[256];
snprintf(buf, sizeof(buf) - 1,
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
"overlay_%d", nr);
buf[sizeof(buf) - 1] = '\0';
return buf;
}
static const char *bus_path = "/testcase-data/overlay-node/test-bus";
#define MAX_TRACK_OVCS_IDS 256
static int track_ovcs_id[MAX_TRACK_OVCS_IDS];
static int track_ovcs_id_overlay_nr[MAX_TRACK_OVCS_IDS];
static int track_ovcs_id_cnt;
static void of_unittest_track_overlay(int ovcs_id, int overlay_nr)
{
if (WARN_ON(track_ovcs_id_cnt >= MAX_TRACK_OVCS_IDS))
return;
track_ovcs_id[track_ovcs_id_cnt] = ovcs_id;
track_ovcs_id_overlay_nr[track_ovcs_id_cnt] = overlay_nr;
track_ovcs_id_cnt++;
}
static void of_unittest_untrack_overlay(int ovcs_id)
{
if (WARN_ON(track_ovcs_id_cnt < 1))
return;
track_ovcs_id_cnt--;
/* If out of synch then test is broken. Do not try to recover. */
WARN_ON(track_ovcs_id[track_ovcs_id_cnt] != ovcs_id);
}
static void of_unittest_remove_tracked_overlays(void)
{
int ret, ovcs_id, overlay_nr, save_ovcs_id;
const char *overlay_name;
while (track_ovcs_id_cnt > 0) {
ovcs_id = track_ovcs_id[track_ovcs_id_cnt - 1];
overlay_nr = track_ovcs_id_overlay_nr[track_ovcs_id_cnt - 1];
save_ovcs_id = ovcs_id;
ret = of_overlay_remove(&ovcs_id);
if (ret == -ENODEV) {
overlay_name = overlay_name_from_nr(overlay_nr);
pr_warn("%s: of_overlay_remove() for overlay \"%s\" failed, ret = %d\n",
__func__, overlay_name, ret);
}
of_unittest_untrack_overlay(save_ovcs_id);
}
}
static int __init of_unittest_apply_overlay(int overlay_nr, int *ovcs_id)
{
/*
* The overlay will be tracked, thus it will be removed
* by of_unittest_remove_tracked_overlays().
*/
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
const char *overlay_name;
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
overlay_name = overlay_name_from_nr(overlay_nr);
if (!overlay_data_apply(overlay_name, ovcs_id)) {
unittest(0, "could not apply overlay \"%s\"\n", overlay_name);
return -EFAULT;
}
of_unittest_track_overlay(*ovcs_id, overlay_nr);
return 0;
}
/* apply an overlay while checking before and after states */
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
static int __init of_unittest_apply_overlay_check(int overlay_nr,
int unittest_nr, int before, int after,
enum overlay_type ovtype)
{
int ret, ovcs_id;
/* unittest device must not be in before state */
if (of_unittest_device_exists(unittest_nr, ovtype) != before) {
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
unittest(0, "%s with device @\"%s\" %s\n",
overlay_name_from_nr(overlay_nr),
unittest_path(unittest_nr, ovtype),
!before ? "enabled" : "disabled");
return -EINVAL;
}
ovcs_id = 0;
ret = of_unittest_apply_overlay(overlay_nr, &ovcs_id);
if (ret != 0) {
/* of_unittest_apply_overlay already called unittest() */
return ret;
}
/* unittest device must be to set to after state */
if (of_unittest_device_exists(unittest_nr, ovtype) != after) {
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
unittest(0, "%s failed to create @\"%s\" %s\n",
overlay_name_from_nr(overlay_nr),
unittest_path(unittest_nr, ovtype),
!after ? "enabled" : "disabled");
return -EINVAL;
}
return 0;
}
/* apply an overlay and then revert it while checking before, after states */
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
static int __init of_unittest_apply_revert_overlay_check(int overlay_nr,
int unittest_nr, int before, int after,
enum overlay_type ovtype)
{
int ret, ovcs_id, save_ovcs_id;
/* unittest device must be in before state */
if (of_unittest_device_exists(unittest_nr, ovtype) != before) {
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
unittest(0, "%s with device @\"%s\" %s\n",
overlay_name_from_nr(overlay_nr),
unittest_path(unittest_nr, ovtype),
!before ? "enabled" : "disabled");
return -EINVAL;
}
/* apply the overlay */
ovcs_id = 0;
ret = of_unittest_apply_overlay(overlay_nr, &ovcs_id);
if (ret != 0) {
/* of_unittest_apply_overlay already called unittest() */
return ret;
}
/* unittest device must be in after state */
if (of_unittest_device_exists(unittest_nr, ovtype) != after) {
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
unittest(0, "%s failed to create @\"%s\" %s\n",
overlay_name_from_nr(overlay_nr),
unittest_path(unittest_nr, ovtype),
!after ? "enabled" : "disabled");
return -EINVAL;
}
save_ovcs_id = ovcs_id;
ret = of_overlay_remove(&ovcs_id);
if (ret != 0) {
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
unittest(0, "%s failed to be destroyed @\"%s\"\n",
overlay_name_from_nr(overlay_nr),
unittest_path(unittest_nr, ovtype));
return ret;
}
of_unittest_untrack_overlay(save_ovcs_id);
/* unittest device must be again in before state */
if (of_unittest_device_exists(unittest_nr, PDEV_OVERLAY) != before) {
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
unittest(0, "%s with device @\"%s\" %s\n",
overlay_name_from_nr(overlay_nr),
unittest_path(unittest_nr, ovtype),
!before ? "enabled" : "disabled");
return -EINVAL;
}
return 0;
}
/* test activation of device */
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
static void __init of_unittest_overlay_0(void)
{
int ret;
EXPECT_BEGIN(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/test-unittest0/status");
/* device should enable */
ret = of_unittest_apply_overlay_check(0, 0, 0, 1, PDEV_OVERLAY);
EXPECT_END(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/test-unittest0/status");
if (ret)
return;
unittest(1, "overlay test %d passed\n", 0);
}
/* test deactivation of device */
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
static void __init of_unittest_overlay_1(void)
{
int ret;
EXPECT_BEGIN(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/test-unittest1/status");
/* device should disable */
ret = of_unittest_apply_overlay_check(1, 1, 1, 0, PDEV_OVERLAY);
EXPECT_END(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/test-unittest1/status");
if (ret)
return;
unittest(1, "overlay test %d passed\n", 1);
}
/* test activation of device */
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
static void __init of_unittest_overlay_2(void)
{
int ret;
EXPECT_BEGIN(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/test-unittest2/status");
/* device should enable */
ret = of_unittest_apply_overlay_check(2, 2, 0, 1, PDEV_OVERLAY);
EXPECT_END(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/test-unittest2/status");
if (ret)
return;
unittest(1, "overlay test %d passed\n", 2);
}
/* test deactivation of device */
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
static void __init of_unittest_overlay_3(void)
{
int ret;
EXPECT_BEGIN(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/test-unittest3/status");
/* device should disable */
ret = of_unittest_apply_overlay_check(3, 3, 1, 0, PDEV_OVERLAY);
EXPECT_END(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/test-unittest3/status");
if (ret)
return;
unittest(1, "overlay test %d passed\n", 3);
}
/* test activation of a full device node */
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
static void __init of_unittest_overlay_4(void)
{
/* device should disable */
if (of_unittest_apply_overlay_check(4, 4, 0, 1, PDEV_OVERLAY))
return;
unittest(1, "overlay test %d passed\n", 4);
}
/* test overlay apply/revert sequence */
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
static void __init of_unittest_overlay_5(void)
{
int ret;
EXPECT_BEGIN(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/test-unittest5/status");
/* device should disable */
ret = of_unittest_apply_revert_overlay_check(5, 5, 0, 1, PDEV_OVERLAY);
EXPECT_END(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/test-unittest5/status");
if (ret)
return;
unittest(1, "overlay test %d passed\n", 5);
}
/* test overlay application in sequence */
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
static void __init of_unittest_overlay_6(void)
{
int i, save_ovcs_id[2], ovcs_id;
int overlay_nr = 6, unittest_nr = 6;
int before = 0, after = 1;
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
const char *overlay_name;
int ret;
/* unittest device must be in before state */
for (i = 0; i < 2; i++) {
if (of_unittest_device_exists(unittest_nr + i, PDEV_OVERLAY)
!= before) {
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
unittest(0, "%s with device @\"%s\" %s\n",
overlay_name_from_nr(overlay_nr + i),
unittest_path(unittest_nr + i,
PDEV_OVERLAY),
!before ? "enabled" : "disabled");
return;
}
}
/* apply the overlays */
EXPECT_BEGIN(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/test-unittest6/status");
overlay_name = overlay_name_from_nr(overlay_nr + 0);
ret = overlay_data_apply(overlay_name, &ovcs_id);
if (!ret) {
unittest(0, "could not apply overlay \"%s\"\n", overlay_name);
return;
}
save_ovcs_id[0] = ovcs_id;
of_unittest_track_overlay(ovcs_id, overlay_nr + 0);
EXPECT_END(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/test-unittest6/status");
EXPECT_BEGIN(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/test-unittest7/status");
overlay_name = overlay_name_from_nr(overlay_nr + 1);
ret = overlay_data_apply(overlay_name, &ovcs_id);
if (!ret) {
unittest(0, "could not apply overlay \"%s\"\n", overlay_name);
return;
}
save_ovcs_id[1] = ovcs_id;
of_unittest_track_overlay(ovcs_id, overlay_nr + 1);
EXPECT_END(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/test-unittest7/status");
for (i = 0; i < 2; i++) {
/* unittest device must be in after state */
if (of_unittest_device_exists(unittest_nr + i, PDEV_OVERLAY)
!= after) {
unittest(0, "overlay @\"%s\" failed @\"%s\" %s\n",
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
overlay_name_from_nr(overlay_nr + i),
unittest_path(unittest_nr + i,
PDEV_OVERLAY),
!after ? "enabled" : "disabled");
return;
}
}
for (i = 1; i >= 0; i--) {
ovcs_id = save_ovcs_id[i];
if (of_overlay_remove(&ovcs_id)) {
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
unittest(0, "%s failed destroy @\"%s\"\n",
overlay_name_from_nr(overlay_nr + i),
unittest_path(unittest_nr + i,
PDEV_OVERLAY));
return;
}
of_unittest_untrack_overlay(save_ovcs_id[i]);
}
for (i = 0; i < 2; i++) {
/* unittest device must be again in before state */
if (of_unittest_device_exists(unittest_nr + i, PDEV_OVERLAY)
!= before) {
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
unittest(0, "%s with device @\"%s\" %s\n",
overlay_name_from_nr(overlay_nr + i),
unittest_path(unittest_nr + i,
PDEV_OVERLAY),
!before ? "enabled" : "disabled");
return;
}
}
unittest(1, "overlay test %d passed\n", 6);
}
/* test overlay application in sequence */
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
static void __init of_unittest_overlay_8(void)
{
int i, save_ovcs_id[2], ovcs_id;
int overlay_nr = 8, unittest_nr = 8;
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
const char *overlay_name;
int ret;
/* we don't care about device state in this test */
EXPECT_BEGIN(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/test-unittest8/status");
overlay_name = overlay_name_from_nr(overlay_nr + 0);
ret = overlay_data_apply(overlay_name, &ovcs_id);
if (!ret)
unittest(0, "could not apply overlay \"%s\"\n", overlay_name);
EXPECT_END(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/test-unittest8/status");
if (!ret)
return;
save_ovcs_id[0] = ovcs_id;
of_unittest_track_overlay(ovcs_id, overlay_nr + 0);
overlay_name = overlay_name_from_nr(overlay_nr + 1);
EXPECT_BEGIN(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/test-unittest8/property-foo");
/* apply the overlays */
ret = overlay_data_apply(overlay_name, &ovcs_id);
EXPECT_END(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/test-unittest8/property-foo");
if (!ret) {
unittest(0, "could not apply overlay \"%s\"\n", overlay_name);
return;
}
save_ovcs_id[1] = ovcs_id;
of_unittest_track_overlay(ovcs_id, overlay_nr + 1);
/* now try to remove first overlay (it should fail) */
ovcs_id = save_ovcs_id[0];
EXPECT_BEGIN(KERN_INFO,
"OF: overlay: node_overlaps_later_cs: #6 overlaps with #7 @/testcase-data/overlay-node/test-bus/test-unittest8");
EXPECT_BEGIN(KERN_INFO,
"OF: overlay: overlay #6 is not topmost");
ret = of_overlay_remove(&ovcs_id);
EXPECT_END(KERN_INFO,
"OF: overlay: overlay #6 is not topmost");
EXPECT_END(KERN_INFO,
"OF: overlay: node_overlaps_later_cs: #6 overlaps with #7 @/testcase-data/overlay-node/test-bus/test-unittest8");
if (!ret) {
/*
* Should never get here. If we do, expect a lot of
* subsequent tracking and overlay removal related errors.
*/
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
unittest(0, "%s was destroyed @\"%s\"\n",
overlay_name_from_nr(overlay_nr + 0),
unittest_path(unittest_nr,
PDEV_OVERLAY));
return;
}
/* removing them in order should work */
for (i = 1; i >= 0; i--) {
ovcs_id = save_ovcs_id[i];
if (of_overlay_remove(&ovcs_id)) {
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
unittest(0, "%s not destroyed @\"%s\"\n",
overlay_name_from_nr(overlay_nr + i),
unittest_path(unittest_nr,
PDEV_OVERLAY));
return;
}
of_unittest_untrack_overlay(save_ovcs_id[i]);
}
unittest(1, "overlay test %d passed\n", 8);
}
/* test insertion of a bus with parent devices */
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
static void __init of_unittest_overlay_10(void)
{
int ret;
char *child_path;
/* device should disable */
ret = of_unittest_apply_overlay_check(10, 10, 0, 1, PDEV_OVERLAY);
if (unittest(ret == 0,
"overlay test %d failed; overlay application\n", 10))
return;
child_path = kasprintf(GFP_KERNEL, "%s/test-unittest101",
unittest_path(10, PDEV_OVERLAY));
if (unittest(child_path, "overlay test %d failed; kasprintf\n", 10))
return;
ret = of_path_device_type_exists(child_path, PDEV_OVERLAY);
kfree(child_path);
unittest(ret, "overlay test %d failed; no child device\n", 10);
}
/* test insertion of a bus with parent devices (and revert) */
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
static void __init of_unittest_overlay_11(void)
{
int ret;
/* device should disable */
ret = of_unittest_apply_revert_overlay_check(11, 11, 0, 1,
PDEV_OVERLAY);
unittest(ret == 0, "overlay test %d failed; overlay apply\n", 11);
}
#if IS_BUILTIN(CONFIG_I2C) && IS_ENABLED(CONFIG_OF_OVERLAY)
struct unittest_i2c_bus_data {
struct platform_device *pdev;
struct i2c_adapter adap;
};
static int unittest_i2c_master_xfer(struct i2c_adapter *adap,
struct i2c_msg *msgs, int num)
{
struct unittest_i2c_bus_data *std = i2c_get_adapdata(adap);
(void)std;
return num;
}
static u32 unittest_i2c_functionality(struct i2c_adapter *adap)
{
return I2C_FUNC_I2C | I2C_FUNC_SMBUS_EMUL;
}
static const struct i2c_algorithm unittest_i2c_algo = {
.master_xfer = unittest_i2c_master_xfer,
.functionality = unittest_i2c_functionality,
};
static int unittest_i2c_bus_probe(struct platform_device *pdev)
{
struct device *dev = &pdev->dev;
struct device_node *np = dev->of_node;
struct unittest_i2c_bus_data *std;
struct i2c_adapter *adap;
int ret;
if (np == NULL) {
dev_err(dev, "No OF data for device\n");
return -EINVAL;
}
dev_dbg(dev, "%s for node @%pOF\n", __func__, np);
std = devm_kzalloc(dev, sizeof(*std), GFP_KERNEL);
if (!std)
return -ENOMEM;
/* link them together */
std->pdev = pdev;
platform_set_drvdata(pdev, std);
adap = &std->adap;
i2c_set_adapdata(adap, std);
adap->nr = -1;
strscpy(adap->name, pdev->name, sizeof(adap->name));
adap->class = I2C_CLASS_DEPRECATED;
adap->algo = &unittest_i2c_algo;
adap->dev.parent = dev;
adap->dev.of_node = dev->of_node;
adap->timeout = 5 * HZ;
adap->retries = 3;
ret = i2c_add_numbered_adapter(adap);
if (ret != 0) {
dev_err(dev, "Failed to add I2C adapter\n");
return ret;
}
return 0;
}
static int unittest_i2c_bus_remove(struct platform_device *pdev)
{
struct device *dev = &pdev->dev;
struct device_node *np = dev->of_node;
struct unittest_i2c_bus_data *std = platform_get_drvdata(pdev);
dev_dbg(dev, "%s for node @%pOF\n", __func__, np);
i2c_del_adapter(&std->adap);
return 0;
}
static const struct of_device_id unittest_i2c_bus_match[] = {
{ .compatible = "unittest-i2c-bus", },
{},
};
static struct platform_driver unittest_i2c_bus_driver = {
.probe = unittest_i2c_bus_probe,
.remove = unittest_i2c_bus_remove,
.driver = {
.name = "unittest-i2c-bus",
.of_match_table = of_match_ptr(unittest_i2c_bus_match),
},
};
static int unittest_i2c_dev_probe(struct i2c_client *client,
const struct i2c_device_id *id)
{
struct device *dev = &client->dev;
struct device_node *np = client->dev.of_node;
if (!np) {
dev_err(dev, "No OF node\n");
return -EINVAL;
}
dev_dbg(dev, "%s for node @%pOF\n", __func__, np);
return 0;
};
i2c: Make remove callback return void The value returned by an i2c driver's remove function is mostly ignored. (Only an error message is printed if the value is non-zero that the error is ignored.) So change the prototype of the remove function to return no value. This way driver authors are not tempted to assume that passing an error to the upper layer is a good idea. All drivers are adapted accordingly. There is no intended change of behaviour, all callbacks were prepared to return 0 before. Reviewed-by: Peter Senna Tschudin <peter.senna@gmail.com> Reviewed-by: Jeremy Kerr <jk@codeconstruct.com.au> Reviewed-by: Benjamin Mugnier <benjamin.mugnier@foss.st.com> Reviewed-by: Javier Martinez Canillas <javierm@redhat.com> Reviewed-by: Crt Mori <cmo@melexis.com> Reviewed-by: Heikki Krogerus <heikki.krogerus@linux.intel.com> Acked-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org> Acked-by: Marek Behún <kabel@kernel.org> # for leds-turris-omnia Acked-by: Andy Shevchenko <andriy.shevchenko@linux.intel.com> Reviewed-by: Petr Machata <petrm@nvidia.com> # for mlxsw Reviewed-by: Maximilian Luz <luzmaximilian@gmail.com> # for surface3_power Acked-by: Srinivas Pandruvada <srinivas.pandruvada@linux.intel.com> # for bmc150-accel-i2c + kxcjk-1013 Reviewed-by: Hans Verkuil <hverkuil-cisco@xs4all.nl> # for media/* + staging/media/* Acked-by: Miguel Ojeda <ojeda@kernel.org> # for auxdisplay/ht16k33 + auxdisplay/lcd2s Reviewed-by: Luca Ceresoli <luca.ceresoli@bootlin.com> # for versaclock5 Reviewed-by: Ajay Gupta <ajayg@nvidia.com> # for ucsi_ccg Acked-by: Jonathan Cameron <Jonathan.Cameron@huawei.com> # for iio Acked-by: Peter Rosin <peda@axentia.se> # for i2c-mux-*, max9860 Acked-by: Adrien Grassein <adrien.grassein@gmail.com> # for lontium-lt8912b Reviewed-by: Jean Delvare <jdelvare@suse.de> # for hwmon, i2c-core and i2c/muxes Acked-by: Corey Minyard <cminyard@mvista.com> # for IPMI Reviewed-by: Vladimir Oltean <olteanv@gmail.com> Acked-by: Dmitry Torokhov <dmitry.torokhov@gmail.com> Acked-by: Sebastian Reichel <sebastian.reichel@collabora.com> # for drivers/power Acked-by: Krzysztof Hałasa <khalasa@piap.pl> Signed-off-by: Uwe Kleine-König <u.kleine-koenig@pengutronix.de> Signed-off-by: Wolfram Sang <wsa@kernel.org>
2022-08-15 16:02:30 +08:00
static void unittest_i2c_dev_remove(struct i2c_client *client)
{
struct device *dev = &client->dev;
struct device_node *np = client->dev.of_node;
dev_dbg(dev, "%s for node @%pOF\n", __func__, np);
}
static const struct i2c_device_id unittest_i2c_dev_id[] = {
{ .name = "unittest-i2c-dev" },
{ }
};
static struct i2c_driver unittest_i2c_dev_driver = {
.driver = {
.name = "unittest-i2c-dev",
},
.probe = unittest_i2c_dev_probe,
.remove = unittest_i2c_dev_remove,
.id_table = unittest_i2c_dev_id,
};
#if IS_BUILTIN(CONFIG_I2C_MUX)
static int unittest_i2c_mux_select_chan(struct i2c_mux_core *muxc, u32 chan)
{
return 0;
}
static int unittest_i2c_mux_probe(struct i2c_client *client,
const struct i2c_device_id *id)
{
int i, nchans;
struct device *dev = &client->dev;
struct i2c_adapter *adap = client->adapter;
struct device_node *np = client->dev.of_node, *child;
struct i2c_mux_core *muxc;
u32 reg, max_reg;
dev_dbg(dev, "%s for node @%pOF\n", __func__, np);
if (!np) {
dev_err(dev, "No OF node\n");
return -EINVAL;
}
max_reg = (u32)-1;
for_each_child_of_node(np, child) {
if (of_property_read_u32(child, "reg", &reg))
continue;
if (max_reg == (u32)-1 || reg > max_reg)
max_reg = reg;
}
nchans = max_reg == (u32)-1 ? 0 : max_reg + 1;
if (nchans == 0) {
dev_err(dev, "No channels\n");
return -EINVAL;
}
muxc = i2c_mux_alloc(adap, dev, nchans, 0, 0,
unittest_i2c_mux_select_chan, NULL);
if (!muxc)
return -ENOMEM;
for (i = 0; i < nchans; i++) {
if (i2c_mux_add_adapter(muxc, 0, i, 0)) {
dev_err(dev, "Failed to register mux #%d\n", i);
i2c_mux_del_adapters(muxc);
return -ENODEV;
}
}
i2c_set_clientdata(client, muxc);
return 0;
};
i2c: Make remove callback return void The value returned by an i2c driver's remove function is mostly ignored. (Only an error message is printed if the value is non-zero that the error is ignored.) So change the prototype of the remove function to return no value. This way driver authors are not tempted to assume that passing an error to the upper layer is a good idea. All drivers are adapted accordingly. There is no intended change of behaviour, all callbacks were prepared to return 0 before. Reviewed-by: Peter Senna Tschudin <peter.senna@gmail.com> Reviewed-by: Jeremy Kerr <jk@codeconstruct.com.au> Reviewed-by: Benjamin Mugnier <benjamin.mugnier@foss.st.com> Reviewed-by: Javier Martinez Canillas <javierm@redhat.com> Reviewed-by: Crt Mori <cmo@melexis.com> Reviewed-by: Heikki Krogerus <heikki.krogerus@linux.intel.com> Acked-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org> Acked-by: Marek Behún <kabel@kernel.org> # for leds-turris-omnia Acked-by: Andy Shevchenko <andriy.shevchenko@linux.intel.com> Reviewed-by: Petr Machata <petrm@nvidia.com> # for mlxsw Reviewed-by: Maximilian Luz <luzmaximilian@gmail.com> # for surface3_power Acked-by: Srinivas Pandruvada <srinivas.pandruvada@linux.intel.com> # for bmc150-accel-i2c + kxcjk-1013 Reviewed-by: Hans Verkuil <hverkuil-cisco@xs4all.nl> # for media/* + staging/media/* Acked-by: Miguel Ojeda <ojeda@kernel.org> # for auxdisplay/ht16k33 + auxdisplay/lcd2s Reviewed-by: Luca Ceresoli <luca.ceresoli@bootlin.com> # for versaclock5 Reviewed-by: Ajay Gupta <ajayg@nvidia.com> # for ucsi_ccg Acked-by: Jonathan Cameron <Jonathan.Cameron@huawei.com> # for iio Acked-by: Peter Rosin <peda@axentia.se> # for i2c-mux-*, max9860 Acked-by: Adrien Grassein <adrien.grassein@gmail.com> # for lontium-lt8912b Reviewed-by: Jean Delvare <jdelvare@suse.de> # for hwmon, i2c-core and i2c/muxes Acked-by: Corey Minyard <cminyard@mvista.com> # for IPMI Reviewed-by: Vladimir Oltean <olteanv@gmail.com> Acked-by: Dmitry Torokhov <dmitry.torokhov@gmail.com> Acked-by: Sebastian Reichel <sebastian.reichel@collabora.com> # for drivers/power Acked-by: Krzysztof Hałasa <khalasa@piap.pl> Signed-off-by: Uwe Kleine-König <u.kleine-koenig@pengutronix.de> Signed-off-by: Wolfram Sang <wsa@kernel.org>
2022-08-15 16:02:30 +08:00
static void unittest_i2c_mux_remove(struct i2c_client *client)
{
struct device *dev = &client->dev;
struct device_node *np = client->dev.of_node;
struct i2c_mux_core *muxc = i2c_get_clientdata(client);
dev_dbg(dev, "%s for node @%pOF\n", __func__, np);
i2c_mux_del_adapters(muxc);
}
static const struct i2c_device_id unittest_i2c_mux_id[] = {
{ .name = "unittest-i2c-mux" },
{ }
};
static struct i2c_driver unittest_i2c_mux_driver = {
.driver = {
.name = "unittest-i2c-mux",
},
.probe = unittest_i2c_mux_probe,
.remove = unittest_i2c_mux_remove,
.id_table = unittest_i2c_mux_id,
};
#endif
static int of_unittest_overlay_i2c_init(void)
{
int ret;
ret = i2c_add_driver(&unittest_i2c_dev_driver);
if (unittest(ret == 0,
"could not register unittest i2c device driver\n"))
return ret;
ret = platform_driver_register(&unittest_i2c_bus_driver);
if (unittest(ret == 0,
"could not register unittest i2c bus driver\n"))
return ret;
#if IS_BUILTIN(CONFIG_I2C_MUX)
EXPECT_BEGIN(KERN_INFO,
"i2c i2c-1: Added multiplexed i2c bus 2");
ret = i2c_add_driver(&unittest_i2c_mux_driver);
EXPECT_END(KERN_INFO,
"i2c i2c-1: Added multiplexed i2c bus 2");
if (unittest(ret == 0,
"could not register unittest i2c mux driver\n"))
return ret;
#endif
return 0;
}
static void of_unittest_overlay_i2c_cleanup(void)
{
#if IS_BUILTIN(CONFIG_I2C_MUX)
i2c_del_driver(&unittest_i2c_mux_driver);
#endif
platform_driver_unregister(&unittest_i2c_bus_driver);
i2c_del_driver(&unittest_i2c_dev_driver);
}
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
static void __init of_unittest_overlay_i2c_12(void)
{
int ret;
/* device should enable */
EXPECT_BEGIN(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/i2c-test-bus/test-unittest12/status");
ret = of_unittest_apply_overlay_check(12, 12, 0, 1, I2C_OVERLAY);
EXPECT_END(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/i2c-test-bus/test-unittest12/status");
if (ret)
return;
unittest(1, "overlay test %d passed\n", 12);
}
/* test deactivation of device */
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
static void __init of_unittest_overlay_i2c_13(void)
{
int ret;
EXPECT_BEGIN(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/i2c-test-bus/test-unittest13/status");
/* device should disable */
ret = of_unittest_apply_overlay_check(13, 13, 1, 0, I2C_OVERLAY);
EXPECT_END(KERN_INFO,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data/overlay-node/test-bus/i2c-test-bus/test-unittest13/status");
if (ret)
return;
unittest(1, "overlay test %d passed\n", 13);
}
/* just check for i2c mux existence */
static void of_unittest_overlay_i2c_14(void)
{
}
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
static void __init of_unittest_overlay_i2c_15(void)
{
int ret;
/* device should enable */
EXPECT_BEGIN(KERN_INFO,
"i2c i2c-1: Added multiplexed i2c bus 3");
ret = of_unittest_apply_overlay_check(15, 15, 0, 1, I2C_OVERLAY);
EXPECT_END(KERN_INFO,
"i2c i2c-1: Added multiplexed i2c bus 3");
if (ret)
return;
unittest(1, "overlay test %d passed\n", 15);
}
#else
static inline void of_unittest_overlay_i2c_14(void) { }
static inline void of_unittest_overlay_i2c_15(void) { }
#endif
static int of_notify(struct notifier_block *nb, unsigned long action,
void *arg)
{
struct of_overlay_notify_data *nd = arg;
struct device_node *found;
int ret;
/*
* For overlay_16 .. overlay_19, check that returning an error
* works for each of the actions by setting an arbitrary return
* error number that matches the test number. e.g. for unittest16,
* ret = -EBUSY which is -16.
*
* OVERLAY_INFO() for the overlays is declared to expect the same
* error number, so overlay_data_apply() will return no error.
*
* overlay_20 will return NOTIFY_DONE
*/
ret = 0;
of_node_get(nd->overlay);
switch (action) {
case OF_OVERLAY_PRE_APPLY:
found = of_find_node_by_name(nd->overlay, "test-unittest16");
if (found) {
of_node_put(found);
ret = -EBUSY;
}
break;
case OF_OVERLAY_POST_APPLY:
found = of_find_node_by_name(nd->overlay, "test-unittest17");
if (found) {
of_node_put(found);
ret = -EEXIST;
}
break;
case OF_OVERLAY_PRE_REMOVE:
found = of_find_node_by_name(nd->overlay, "test-unittest18");
if (found) {
of_node_put(found);
ret = -EXDEV;
}
break;
case OF_OVERLAY_POST_REMOVE:
found = of_find_node_by_name(nd->overlay, "test-unittest19");
if (found) {
of_node_put(found);
ret = -ENODEV;
}
break;
default: /* should not happen */
of_node_put(nd->overlay);
ret = -EINVAL;
break;
}
if (ret)
return notifier_from_errno(ret);
return NOTIFY_DONE;
}
static struct notifier_block of_nb = {
.notifier_call = of_notify,
};
static void __init of_unittest_overlay_notify(void)
{
int ovcs_id;
int ret;
ret = of_overlay_notifier_register(&of_nb);
unittest(!ret,
"of_overlay_notifier_register() failed, ret = %d\n", ret);
if (ret)
return;
/*
* The overlays are applied by overlay_data_apply()
* instead of of_unittest_apply_overlay() so that they
* will not be tracked. Thus they will not be removed
* by of_unittest_remove_tracked_overlays().
*
* Applying overlays 16 - 19 will each trigger an error for a
* different action in of_notify().
*
* Applying overlay 20 will not trigger any error in of_notify().
*/
/* --- overlay 16 --- */
EXPECT_BEGIN(KERN_INFO, "OF: overlay: overlay changeset pre-apply notifier error -16, target: /testcase-data/overlay-node/test-bus");
unittest(overlay_data_apply("overlay_16", &ovcs_id),
"test OF_OVERLAY_PRE_APPLY notify injected error\n");
EXPECT_END(KERN_INFO, "OF: overlay: overlay changeset pre-apply notifier error -16, target: /testcase-data/overlay-node/test-bus");
unittest(ovcs_id, "ovcs_id not created for overlay_16\n");
/* --- overlay 17 --- */
EXPECT_BEGIN(KERN_INFO, "OF: overlay: overlay changeset post-apply notifier error -17, target: /testcase-data/overlay-node/test-bus");
unittest(overlay_data_apply("overlay_17", &ovcs_id),
"test OF_OVERLAY_POST_APPLY notify injected error\n");
EXPECT_END(KERN_INFO, "OF: overlay: overlay changeset post-apply notifier error -17, target: /testcase-data/overlay-node/test-bus");
unittest(ovcs_id, "ovcs_id not created for overlay_17\n");
if (ovcs_id) {
ret = of_overlay_remove(&ovcs_id);
unittest(!ret,
"overlay_17 of_overlay_remove(), ret = %d\n", ret);
}
/* --- overlay 18 --- */
unittest(overlay_data_apply("overlay_18", &ovcs_id),
"OF_OVERLAY_PRE_REMOVE notify injected error\n");
unittest(ovcs_id, "ovcs_id not created for overlay_18\n");
if (ovcs_id) {
EXPECT_BEGIN(KERN_INFO, "OF: overlay: overlay changeset pre-remove notifier error -18, target: /testcase-data/overlay-node/test-bus");
ret = of_overlay_remove(&ovcs_id);
EXPECT_END(KERN_INFO, "OF: overlay: overlay changeset pre-remove notifier error -18, target: /testcase-data/overlay-node/test-bus");
if (ret == -EXDEV) {
/*
* change set ovcs_id should still exist
*/
unittest(1, "overlay_18 of_overlay_remove() injected error for OF_OVERLAY_PRE_REMOVE\n");
} else {
unittest(0, "overlay_18 of_overlay_remove() injected error for OF_OVERLAY_PRE_REMOVE not returned\n");
}
} else {
unittest(1, "ovcs_id not created for overlay_18\n");
}
unittest(ovcs_id, "ovcs_id removed for overlay_18\n");
/* --- overlay 19 --- */
unittest(overlay_data_apply("overlay_19", &ovcs_id),
"OF_OVERLAY_POST_REMOVE notify injected error\n");
unittest(ovcs_id, "ovcs_id not created for overlay_19\n");
if (ovcs_id) {
EXPECT_BEGIN(KERN_INFO, "OF: overlay: overlay changeset post-remove notifier error -19, target: /testcase-data/overlay-node/test-bus");
ret = of_overlay_remove(&ovcs_id);
EXPECT_END(KERN_INFO, "OF: overlay: overlay changeset post-remove notifier error -19, target: /testcase-data/overlay-node/test-bus");
if (ret == -ENODEV)
unittest(1, "overlay_19 of_overlay_remove() injected error for OF_OVERLAY_POST_REMOVE\n");
else
unittest(0, "overlay_19 of_overlay_remove() injected error for OF_OVERLAY_POST_REMOVE not returned\n");
} else {
unittest(1, "ovcs_id removed for overlay_19\n");
}
unittest(!ovcs_id, "changeset ovcs_id = %d not removed for overlay_19\n",
ovcs_id);
/* --- overlay 20 --- */
unittest(overlay_data_apply("overlay_20", &ovcs_id),
"overlay notify no injected error\n");
if (ovcs_id) {
ret = of_overlay_remove(&ovcs_id);
if (ret)
unittest(1, "overlay_20 failed to be destroyed, ret = %d\n",
ret);
} else {
unittest(1, "ovcs_id not created for overlay_20\n");
}
unittest(!of_overlay_notifier_unregister(&of_nb),
"of_overlay_notifier_unregister() failed, ret = %d\n", ret);
}
static void __init of_unittest_overlay(void)
{
struct device_node *bus_np = NULL;
if (platform_driver_register(&unittest_driver)) {
unittest(0, "could not register unittest driver\n");
goto out;
}
bus_np = of_find_node_by_path(bus_path);
if (bus_np == NULL) {
unittest(0, "could not find bus_path \"%s\"\n", bus_path);
goto out;
}
if (of_platform_default_populate(bus_np, NULL, NULL)) {
unittest(0, "could not populate bus @ \"%s\"\n", bus_path);
goto out;
}
if (!of_unittest_device_exists(100, PDEV_OVERLAY)) {
unittest(0, "could not find unittest0 @ \"%s\"\n",
unittest_path(100, PDEV_OVERLAY));
goto out;
}
if (of_unittest_device_exists(101, PDEV_OVERLAY)) {
unittest(0, "unittest1 @ \"%s\" should not exist\n",
unittest_path(101, PDEV_OVERLAY));
goto out;
}
unittest(1, "basic infrastructure of overlays passed");
/* tests in sequence */
of_unittest_overlay_0();
of_unittest_overlay_1();
of_unittest_overlay_2();
of_unittest_overlay_3();
of_unittest_overlay_4();
of_unittest_overlay_5();
of_unittest_overlay_6();
of_unittest_overlay_8();
of_unittest_overlay_10();
of_unittest_overlay_11();
#if IS_BUILTIN(CONFIG_I2C)
if (unittest(of_unittest_overlay_i2c_init() == 0, "i2c init failed\n"))
goto out;
of_unittest_overlay_i2c_12();
of_unittest_overlay_i2c_13();
of_unittest_overlay_i2c_14();
of_unittest_overlay_i2c_15();
of_unittest_overlay_i2c_cleanup();
#endif
of_unittest_overlay_gpio();
of_unittest_remove_tracked_overlays();
of_unittest_overlay_notify();
out:
of_node_put(bus_np);
}
#else
static inline void __init of_unittest_overlay(void) { }
#endif
#ifdef CONFIG_OF_OVERLAY
/*
* __dtb_ot_begin[] and __dtb_ot_end[] are created by cmd_dt_S_dtb
* in scripts/Makefile.lib
*/
#define OVERLAY_INFO_EXTERN(name) \
extern uint8_t __dtb_##name##_begin[]; \
extern uint8_t __dtb_##name##_end[]
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
#define OVERLAY_INFO(overlay_name, expected) \
{ .dtb_begin = __dtb_##overlay_name##_begin, \
.dtb_end = __dtb_##overlay_name##_end, \
.expected_result = expected, \
.name = #overlay_name, \
}
struct overlay_info {
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
uint8_t *dtb_begin;
uint8_t *dtb_end;
int expected_result;
int ovcs_id;
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
char *name;
};
OVERLAY_INFO_EXTERN(overlay_base);
OVERLAY_INFO_EXTERN(overlay);
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
OVERLAY_INFO_EXTERN(overlay_0);
OVERLAY_INFO_EXTERN(overlay_1);
OVERLAY_INFO_EXTERN(overlay_2);
OVERLAY_INFO_EXTERN(overlay_3);
OVERLAY_INFO_EXTERN(overlay_4);
OVERLAY_INFO_EXTERN(overlay_5);
OVERLAY_INFO_EXTERN(overlay_6);
OVERLAY_INFO_EXTERN(overlay_7);
OVERLAY_INFO_EXTERN(overlay_8);
OVERLAY_INFO_EXTERN(overlay_9);
OVERLAY_INFO_EXTERN(overlay_10);
OVERLAY_INFO_EXTERN(overlay_11);
OVERLAY_INFO_EXTERN(overlay_12);
OVERLAY_INFO_EXTERN(overlay_13);
OVERLAY_INFO_EXTERN(overlay_15);
OVERLAY_INFO_EXTERN(overlay_16);
OVERLAY_INFO_EXTERN(overlay_17);
OVERLAY_INFO_EXTERN(overlay_18);
OVERLAY_INFO_EXTERN(overlay_19);
OVERLAY_INFO_EXTERN(overlay_20);
OVERLAY_INFO_EXTERN(overlay_gpio_01);
OVERLAY_INFO_EXTERN(overlay_gpio_02a);
OVERLAY_INFO_EXTERN(overlay_gpio_02b);
OVERLAY_INFO_EXTERN(overlay_gpio_03);
OVERLAY_INFO_EXTERN(overlay_gpio_04a);
OVERLAY_INFO_EXTERN(overlay_gpio_04b);
OVERLAY_INFO_EXTERN(overlay_bad_add_dup_node);
OVERLAY_INFO_EXTERN(overlay_bad_add_dup_prop);
OVERLAY_INFO_EXTERN(overlay_bad_phandle);
OVERLAY_INFO_EXTERN(overlay_bad_symbol);
/* entries found by name */
static struct overlay_info overlays[] = {
OVERLAY_INFO(overlay_base, -9999),
OVERLAY_INFO(overlay, 0),
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
OVERLAY_INFO(overlay_0, 0),
OVERLAY_INFO(overlay_1, 0),
OVERLAY_INFO(overlay_2, 0),
OVERLAY_INFO(overlay_3, 0),
OVERLAY_INFO(overlay_4, 0),
OVERLAY_INFO(overlay_5, 0),
OVERLAY_INFO(overlay_6, 0),
OVERLAY_INFO(overlay_7, 0),
OVERLAY_INFO(overlay_8, 0),
OVERLAY_INFO(overlay_9, 0),
OVERLAY_INFO(overlay_10, 0),
OVERLAY_INFO(overlay_11, 0),
OVERLAY_INFO(overlay_12, 0),
OVERLAY_INFO(overlay_13, 0),
OVERLAY_INFO(overlay_15, 0),
OVERLAY_INFO(overlay_16, -EBUSY),
OVERLAY_INFO(overlay_17, -EEXIST),
OVERLAY_INFO(overlay_18, 0),
OVERLAY_INFO(overlay_19, 0),
OVERLAY_INFO(overlay_20, 0),
OVERLAY_INFO(overlay_gpio_01, 0),
OVERLAY_INFO(overlay_gpio_02a, 0),
OVERLAY_INFO(overlay_gpio_02b, 0),
OVERLAY_INFO(overlay_gpio_03, 0),
OVERLAY_INFO(overlay_gpio_04a, 0),
OVERLAY_INFO(overlay_gpio_04b, 0),
OVERLAY_INFO(overlay_bad_add_dup_node, -EINVAL),
OVERLAY_INFO(overlay_bad_add_dup_prop, -EINVAL),
OVERLAY_INFO(overlay_bad_phandle, -EINVAL),
OVERLAY_INFO(overlay_bad_symbol, -EINVAL),
/* end marker */
{.dtb_begin = NULL, .dtb_end = NULL, .expected_result = 0, .name = NULL}
};
static struct device_node *overlay_base_root;
static void * __init dt_alloc_memory(u64 size, u64 align)
{
treewide: add checks for the return value of memblock_alloc*() Add check for the return value of memblock_alloc*() functions and call panic() in case of error. The panic message repeats the one used by panicing memblock allocators with adjustment of parameters to include only relevant ones. The replacement was mostly automated with semantic patches like the one below with manual massaging of format strings. @@ expression ptr, size, align; @@ ptr = memblock_alloc(size, align); + if (!ptr) + panic("%s: Failed to allocate %lu bytes align=0x%lx\n", __func__, size, align); [anders.roxell@linaro.org: use '%pa' with 'phys_addr_t' type] Link: http://lkml.kernel.org/r/20190131161046.21886-1-anders.roxell@linaro.org [rppt@linux.ibm.com: fix format strings for panics after memblock_alloc] Link: http://lkml.kernel.org/r/1548950940-15145-1-git-send-email-rppt@linux.ibm.com [rppt@linux.ibm.com: don't panic if the allocation in sparse_buffer_init fails] Link: http://lkml.kernel.org/r/20190131074018.GD28876@rapoport-lnx [akpm@linux-foundation.org: fix xtensa printk warning] Link: http://lkml.kernel.org/r/1548057848-15136-20-git-send-email-rppt@linux.ibm.com Signed-off-by: Mike Rapoport <rppt@linux.ibm.com> Signed-off-by: Anders Roxell <anders.roxell@linaro.org> Reviewed-by: Guo Ren <ren_guo@c-sky.com> [c-sky] Acked-by: Paul Burton <paul.burton@mips.com> [MIPS] Acked-by: Heiko Carstens <heiko.carstens@de.ibm.com> [s390] Reviewed-by: Juergen Gross <jgross@suse.com> [Xen] Reviewed-by: Geert Uytterhoeven <geert@linux-m68k.org> [m68k] Acked-by: Max Filippov <jcmvbkbc@gmail.com> [xtensa] Cc: Catalin Marinas <catalin.marinas@arm.com> Cc: Christophe Leroy <christophe.leroy@c-s.fr> Cc: Christoph Hellwig <hch@lst.de> Cc: "David S. Miller" <davem@davemloft.net> Cc: Dennis Zhou <dennis@kernel.org> Cc: Greentime Hu <green.hu@gmail.com> Cc: Greg Kroah-Hartman <gregkh@linuxfoundation.org> Cc: Guan Xuetao <gxt@pku.edu.cn> Cc: Guo Ren <guoren@kernel.org> Cc: Mark Salter <msalter@redhat.com> Cc: Matt Turner <mattst88@gmail.com> Cc: Michael Ellerman <mpe@ellerman.id.au> Cc: Michal Simek <monstr@monstr.eu> Cc: Petr Mladek <pmladek@suse.com> Cc: Richard Weinberger <richard@nod.at> Cc: Rich Felker <dalias@libc.org> Cc: Rob Herring <robh+dt@kernel.org> Cc: Rob Herring <robh@kernel.org> Cc: Russell King <linux@armlinux.org.uk> Cc: Stafford Horne <shorne@gmail.com> Cc: Tony Luck <tony.luck@intel.com> Cc: Vineet Gupta <vgupta@synopsys.com> Cc: Yoshinori Sato <ysato@users.sourceforge.jp> Signed-off-by: Andrew Morton <akpm@linux-foundation.org> Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
2019-03-12 14:30:31 +08:00
void *ptr = memblock_alloc(size, align);
if (!ptr)
panic("%s: Failed to allocate %llu bytes align=0x%llx\n",
__func__, size, align);
return ptr;
}
/*
* Create base device tree for the overlay unittest.
*
* This is called from very early boot code.
*
* Do as much as possible the same way as done in __unflatten_device_tree
* and other early boot steps for the normal FDT so that the overlay base
* unflattened tree will have the same characteristics as the real tree
* (such as having memory allocated by the early allocator). The goal
* is to test "the real thing" as much as possible, and test "test setup
* code" as little as possible.
*
* Have to stop before resolving phandles, because that uses kmalloc.
*/
void __init unittest_unflatten_overlay_base(void)
{
struct overlay_info *info;
u32 data_size;
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
void *new_fdt;
u32 size;
int found = 0;
const char *overlay_name = "overlay_base";
for (info = overlays; info && info->name; info++) {
if (!strcmp(overlay_name, info->name)) {
found = 1;
break;
}
}
if (!found) {
pr_err("no overlay data for %s\n", overlay_name);
return;
}
info = &overlays[0];
if (info->expected_result != -9999) {
pr_err("No dtb 'overlay_base' to attach\n");
return;
}
data_size = info->dtb_end - info->dtb_begin;
if (!data_size) {
pr_err("No dtb 'overlay_base' to attach\n");
return;
}
size = fdt_totalsize(info->dtb_begin);
if (size != data_size) {
pr_err("dtb 'overlay_base' header totalsize != actual size");
return;
}
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
new_fdt = dt_alloc_memory(size, roundup_pow_of_two(FDT_V17_SIZE));
if (!new_fdt) {
pr_err("alloc for dtb 'overlay_base' failed");
return;
}
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
memcpy(new_fdt, info->dtb_begin, size);
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
__unflatten_device_tree(new_fdt, NULL, &overlay_base_root,
dt_alloc_memory, true);
}
/*
* The purpose of of_unittest_overlay_data_add is to add an
* overlay in the normal fashion. This is a test of the whole
* picture, instead of testing individual elements.
*
* A secondary purpose is to be able to verify that the contents of
* /proc/device-tree/ contains the updated structure and values from
* the overlay. That must be verified separately in user space.
*
* Return 0 on unexpected error.
*/
static int __init overlay_data_apply(const char *overlay_name, int *ovcs_id)
{
struct overlay_info *info;
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
int found = 0;
int ret;
u32 size;
for (info = overlays; info && info->name; info++) {
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
if (!strcmp(overlay_name, info->name)) {
found = 1;
break;
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
}
}
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
if (!found) {
pr_err("no overlay data for %s\n", overlay_name);
return 0;
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
}
size = info->dtb_end - info->dtb_begin;
if (!size)
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
pr_err("no overlay data for %s\n", overlay_name);
ret = of_overlay_fdt_apply(info->dtb_begin, size, &info->ovcs_id);
if (ovcs_id)
*ovcs_id = info->ovcs_id;
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
if (ret < 0)
goto out;
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
pr_debug("%s applied\n", overlay_name);
out:
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
if (ret != info->expected_result)
pr_err("of_overlay_fdt_apply() expected %d, ret=%d, %s\n",
info->expected_result, ret, overlay_name);
return (ret == info->expected_result);
}
/*
* The purpose of of_unittest_overlay_high_level is to add an overlay
* in the normal fashion. This is a test of the whole picture,
* instead of individual elements.
*
* The first part of the function is _not_ normal overlay usage; it is
* finishing splicing the base overlay device tree into the live tree.
*/
static __init void of_unittest_overlay_high_level(void)
{
struct device_node *last_sibling;
struct device_node *np;
struct device_node *of_symbols;
struct device_node *overlay_base_symbols;
struct device_node **pprev;
struct property *prop;
int ret;
if (!overlay_base_root) {
unittest(0, "overlay_base_root not initialized\n");
return;
}
/*
* Could not fixup phandles in unittest_unflatten_overlay_base()
* because kmalloc() was not yet available.
*/
of_overlay_mutex_lock();
of_resolve_phandles(overlay_base_root);
of_overlay_mutex_unlock();
/*
* do not allow overlay_base to duplicate any node already in
* tree, this greatly simplifies the code
*/
/*
* remove overlay_base_root node "__local_fixups", after
* being used by of_resolve_phandles()
*/
pprev = &overlay_base_root->child;
for (np = overlay_base_root->child; np; np = np->sibling) {
if (of_node_name_eq(np, "__local_fixups__")) {
*pprev = np->sibling;
break;
}
pprev = &np->sibling;
}
/* remove overlay_base_root node "__symbols__" if in live tree */
of_symbols = of_get_child_by_name(of_root, "__symbols__");
if (of_symbols) {
/* will have to graft properties from node into live tree */
pprev = &overlay_base_root->child;
for (np = overlay_base_root->child; np; np = np->sibling) {
if (of_node_name_eq(np, "__symbols__")) {
overlay_base_symbols = np;
*pprev = np->sibling;
break;
}
pprev = &np->sibling;
}
}
for_each_child_of_node(overlay_base_root, np) {
struct device_node *base_child;
for_each_child_of_node(of_root, base_child) {
if (!strcmp(np->full_name, base_child->full_name)) {
unittest(0, "illegal node name in overlay_base %pOFn",
np);
of_node_put(np);
of_node_put(base_child);
return;
}
}
}
/*
* overlay 'overlay_base' is not allowed to have root
* properties, so only need to splice nodes into main device tree.
*
* root node of *overlay_base_root will not be freed, it is lost
* memory.
*/
for (np = overlay_base_root->child; np; np = np->sibling)
np->parent = of_root;
mutex_lock(&of_mutex);
for (last_sibling = np = of_root->child; np; np = np->sibling)
last_sibling = np;
if (last_sibling)
last_sibling->sibling = overlay_base_root->child;
else
of_root->child = overlay_base_root->child;
for_each_of_allnodes_from(overlay_base_root, np)
__of_attach_node_sysfs(np);
if (of_symbols) {
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
struct property *new_prop;
for_each_property_of_node(overlay_base_symbols, prop) {
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
new_prop = __of_prop_dup(prop, GFP_KERNEL);
if (!new_prop) {
unittest(0, "__of_prop_dup() of '%s' from overlay_base node __symbols__",
prop->name);
goto err_unlock;
}
if (__of_add_property(of_symbols, new_prop)) {
kfree(new_prop->name);
kfree(new_prop->value);
kfree(new_prop);
/* "name" auto-generated by unflatten */
if (!strcmp(prop->name, "name"))
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
continue;
unittest(0, "duplicate property '%s' in overlay_base node __symbols__",
prop->name);
goto err_unlock;
}
if (__of_add_property_sysfs(of_symbols, new_prop)) {
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
unittest(0, "unable to add property '%s' in overlay_base node __symbols__ to sysfs",
prop->name);
goto err_unlock;
}
}
}
mutex_unlock(&of_mutex);
/* now do the normal overlay usage test */
EXPECT_BEGIN(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data-2/substation@100/status");
EXPECT_BEGIN(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data-2/fairway-1/status");
EXPECT_BEGIN(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data-2/fairway-1/ride@100/track@30/incline-up");
EXPECT_BEGIN(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data-2/fairway-1/ride@100/track@40/incline-up");
EXPECT_BEGIN(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data-2/lights@40000/status");
EXPECT_BEGIN(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data-2/lights@40000/color");
EXPECT_BEGIN(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data-2/lights@40000/rate");
EXPECT_BEGIN(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /__symbols__/hvac_2");
EXPECT_BEGIN(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /__symbols__/ride_200");
EXPECT_BEGIN(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /__symbols__/ride_200_left");
EXPECT_BEGIN(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /__symbols__/ride_200_right");
ret = overlay_data_apply("overlay", NULL);
EXPECT_END(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /__symbols__/ride_200_right");
EXPECT_END(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /__symbols__/ride_200_left");
EXPECT_END(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /__symbols__/ride_200");
EXPECT_END(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /__symbols__/hvac_2");
EXPECT_END(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data-2/lights@40000/rate");
EXPECT_END(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data-2/lights@40000/color");
EXPECT_END(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data-2/lights@40000/status");
EXPECT_END(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data-2/fairway-1/ride@100/track@40/incline-up");
EXPECT_END(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data-2/fairway-1/ride@100/track@30/incline-up");
EXPECT_END(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data-2/fairway-1/status");
EXPECT_END(KERN_ERR,
"OF: overlay: WARNING: memory leak will occur if overlay removed, property: /testcase-data-2/substation@100/status");
unittest(ret, "Adding overlay 'overlay' failed\n");
EXPECT_BEGIN(KERN_ERR,
"OF: overlay: ERROR: multiple fragments add and/or delete node /testcase-data-2/substation@100/motor-1/controller");
EXPECT_BEGIN(KERN_ERR,
"OF: overlay: ERROR: multiple fragments add, update, and/or delete property /testcase-data-2/substation@100/motor-1/controller/name");
unittest(overlay_data_apply("overlay_bad_add_dup_node", NULL),
"Adding overlay 'overlay_bad_add_dup_node' failed\n");
EXPECT_END(KERN_ERR,
"OF: overlay: ERROR: multiple fragments add, update, and/or delete property /testcase-data-2/substation@100/motor-1/controller/name");
EXPECT_END(KERN_ERR,
"OF: overlay: ERROR: multiple fragments add and/or delete node /testcase-data-2/substation@100/motor-1/controller");
EXPECT_BEGIN(KERN_ERR,
"OF: overlay: ERROR: multiple fragments add and/or delete node /testcase-data-2/substation@100/motor-1/electric");
EXPECT_BEGIN(KERN_ERR,
"OF: overlay: ERROR: multiple fragments add, update, and/or delete property /testcase-data-2/substation@100/motor-1/electric/rpm_avail");
EXPECT_BEGIN(KERN_ERR,
"OF: overlay: ERROR: multiple fragments add, update, and/or delete property /testcase-data-2/substation@100/motor-1/electric/name");
unittest(overlay_data_apply("overlay_bad_add_dup_prop", NULL),
"Adding overlay 'overlay_bad_add_dup_prop' failed\n");
EXPECT_END(KERN_ERR,
"OF: overlay: ERROR: multiple fragments add, update, and/or delete property /testcase-data-2/substation@100/motor-1/electric/name");
EXPECT_END(KERN_ERR,
"OF: overlay: ERROR: multiple fragments add, update, and/or delete property /testcase-data-2/substation@100/motor-1/electric/rpm_avail");
EXPECT_END(KERN_ERR,
"OF: overlay: ERROR: multiple fragments add and/or delete node /testcase-data-2/substation@100/motor-1/electric");
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
unittest(overlay_data_apply("overlay_bad_phandle", NULL),
"Adding overlay 'overlay_bad_phandle' failed\n");
of: change overlay apply input data from unflattened to FDT Move duplicating and unflattening of an overlay flattened devicetree (FDT) into the overlay application code. To accomplish this, of_overlay_apply() is replaced by of_overlay_fdt_apply(). The copy of the FDT (aka "duplicate FDT") now belongs to devicetree code, which is thus responsible for freeing the duplicate FDT. The caller of of_overlay_fdt_apply() remains responsible for freeing the original FDT. The unflattened devicetree now belongs to devicetree code, which is thus responsible for freeing the unflattened devicetree. These ownership changes prevent early freeing of the duplicated FDT or the unflattened devicetree, which could result in use after free errors. of_overlay_fdt_apply() is a private function for the anticipated overlay loader. Update unittest.c to use of_overlay_fdt_apply() instead of of_overlay_apply(). Move overlay fragments from artificial locations in drivers/of/unittest-data/tests-overlay.dtsi into one devicetree source file per overlay. This led to changes in drivers/of/unitest-data/Makefile and drivers/of/unitest.c. - Add overlay directives to the overlay devicetree source files so that dtc will compile them as true overlays into one FDT data chunk per overlay. - Set CFLAGS for drivers/of/unittest-data/testcases.dts so that symbols will be generated for overlay resolution of overlays that are no longer artificially contained in testcases.dts - Unflatten and apply each unittest overlay FDT using of_overlay_fdt_apply(). - Enable the of_resolve_phandles() check for whether the unflattened overlay is detached. This check was previously disabled because the overlays from tests-overlay.dtsi were not unflattened into detached trees. - Other changes to unittest.c infrastructure to manage multiple test FDTs built into the kernel image (access by name instead of arbitrary number). - of_unittest_overlay_high_level(): previously unused code to add properties from the overlay_base devicetree to the live tree was triggered by the restructuring of tests-overlay.dtsi and thus testcases.dts. This exposed two bugs: (1) the need to dup a property before adding it, and (2) property 'name' is auto-generated in the unflatten code and thus will be a duplicate in the __symbols__ node - do not treat this duplicate as an error. Signed-off-by: Frank Rowand <frank.rowand@sony.com>
2018-02-12 16:19:42 +08:00
unittest(overlay_data_apply("overlay_bad_symbol", NULL),
"Adding overlay 'overlay_bad_symbol' failed\n");
return;
err_unlock:
mutex_unlock(&of_mutex);
}
#else
static inline __init void of_unittest_overlay_high_level(void) {}
#endif
static int __init of_unittest(void)
{
struct device_node *np;
int res;
pr_info("start of unittest - you will see error messages\n");
/* Taint the kernel so we know we've run tests. */
add_taint(TAINT_TEST, LOCKDEP_STILL_OK);
/* adding data for unittest */
if (IS_ENABLED(CONFIG_UML))
unittest_unflatten_overlay_base();
res = unittest_data_add();
if (res)
return res;
if (!of_aliases)
of_aliases = of_find_node_by_path("/aliases");
np = of_find_node_by_path("/testcase-data/phandle-tests/consumer-a");
if (!np) {
pr_info("No testcase data in device tree; not running tests\n");
return 0;
}
of_node_put(np);
of_unittest_check_tree_linkage();
of_unittest_check_phandles();
of_unittest_find_node_by_name();
of_unittest_dynamic();
of_unittest_parse_phandle_with_args();
of_unittest_parse_phandle_with_args_map();
of_unittest_printf();
of_unittest_property_string();
of_unittest_property_copy();
of_unittest_changeset();
of_unittest_parse_interrupts();
of_unittest_parse_interrupts_extended();
of_unittest_dma_get_max_cpu_address();
2019-09-21 02:28:53 +08:00
of_unittest_parse_dma_ranges();
of_unittest_pci_dma_ranges();
of_unittest_match_node();
of_unittest_platform_populate();
of_unittest_overlay();
/* Double check linkage after removing testcase data */
of_unittest_check_tree_linkage();
of_unittest_overlay_high_level();
pr_info("end of unittest - %i passed, %i failed\n",
unittest_results.passed, unittest_results.failed);
return 0;
}
late_initcall(of_unittest);